High resolution direct-projection type x-ray microtomography system using synchrotron or laboratory-based x-ray source
A projection-based x-ray imaging system combines projection magnification and optical magnification in order to ease constraints on source spot size, while improving imaging system footprint and efficiency. The system enables tomographic imaging of the sample especially in a proximity mode where the same is held in close proximity to the scintillator. In this case, a sample holder is provided that can rotate the sample. Further, a z-axis motion stage is also provided that is used to control distance between the sample and the scintillator.
1. An x ray imaging system, comprising:
a projection x ray stage including:
an x ray source generating a diverging x ray beam; and
a scintillator for converting the x ray beam, after interacting with a sample, into an optical signal;
an optical stage including:
a detector; and
a magnification lens for imaging the optical signal of the scintillator onto the detector;
wherein a magnification of the projection x ray stage is between 1 and 10 times and a magnification of the optical stage is 5 or greater.
2. An x ray imaging system as claimed in claim 1 , wherein a spot size of the x ray source is between 1 and 10 micrometers in diameter.
3. An x ray imaging system as claimed in claim 1 , wherein a magnification of the optical stage is between 5 and 50 times.
4. An x ray imaging system as claimed in claim 1 , wherein a magnification of the projection x ray stage is less than 2 times.
5. An x ray imaging system as claimed in claim 1 , wherein a distance between the sample and the scintillator is between 1 and 50 millimeters.
6. An x ray imaging system as claimed in claim 1 , wherein a distance between the sample and the scintillator is between 1 and 10 millimeters.
7. An x ray imaging system, comprising:
a projection x ray stage including
an x ray source generating a diverging x ray beam; and
a scintillator for converting the diverging x ray beam, after interacting with a sample, into an optical signal, wherein a magnification of the projection x ray stage is between 1 and 10 times; and
a sample holder for holding and positioning the sample in proximity to the scintillator, the sample holder comprising:
a rotation motion stage for rotating the sample in the x ray beam;
x-y-z axis motion stages to center the sample's region of interest at the rotation axis of the rotation stage; and
at least one z-axis motion stage for adjusting a source-to-sample distance and a sample-to-detector distance with respect to the rotation motion stage and the x-y-z axis motion stages.
8. An x ray imaging system as claimed in claim 7 , wherein the z-axis motion stage moves the rotation motion stage relative to a bench holding the imaging system.
9. An x ray imaging system as claimed in claim 7 , further comprising a source motion stage for moving the source in a direction perpendicular to an axis of the x ray beam.
10. An x ray imaging system as claimed in claim 7 , further comprising a y-axis sample motion stage for adjusting a vertical height of the sample in the x ray beam.
11. An x ray imaging system as claimed in claim 7 , further comprising an optical stage including:
a detector; and
an optical magnification lens for imaging light from the scintillator onto the detector.
12. An x ray imaging system as claimed in claim 7 , wherein a distance between the sample and the scintillator is between 1 and 50 millimeters.
13. An x ray imaging system as claimed in claim 7 , wherein a distance between the sample and the scintillator is between 1 and 10 millimeters.
14. An x ray imaging system as claimed in claim 7 , wherein a magnification of the projection x ray stage is less than 2 times.
15. An x ray imaging system as claimed in claim 7 , further comprising an optical stage for magnifying the optical signal with a magnification of 5 or greater.