Spatially resolved electromagnetic property measurement
View Patent ↗A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of: traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path; determining the sample surface topography along the path; substantially canceling the sample surface potential along the path using the determined sample surface topography; and determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.
1. A method for determining a magnetic force profile of a sample by using a cantilevered probe having a magnetic tip, the method comprising the steps of:
traversing the tip along a predetermined path on the surface of the sample, the tip being proximate the surface of the sample while traversing along the predetermined path;
determining the sample surface topography along the path;
substantially canceling the sample surface potential along the path using the determined sample surface topography; and
determining magnetic force data along the path based on the determined surface topography, wherein the determined magnetic force data is not magnetic force gradient data and the determined magnetic force data includes substantially no components from the sample surface potential.
2. The method as recited in claim 1 , wherein the steps of substantially canceling the sample surface potential and determining magnetic force data are performed substantially simultaneously.
3. The method as recited in claim 1 , wherein the steps of determining the sample surface topography, substantially canceling the sample surface potential, and determining magnetic force data are performed substantially simultaneously.
4. The method as recited in claim 1 , wherein the step of substantially canceling the sample surface potential comprises:
determining the sample surface potential along the path based on the determined sample topography;
applying a dc signal to the tip, the dc signal substantially canceling the sample surface potential.
5. The method as recited in claim 4 , wherein the step of determining sample surface potential is performed with scanning surface potential microscopy.
6. The method as recited in claim 4 , wherein the step of determining sample surface potential comprises applying an ac signal to the tip, wherein the ac signal is set to a resonant frequency of the cantilevered tip.
7. The method as recited in claim 6 , wherein the step of determining magnetic force data comprises applying an ac signal to the sample, the frequency of the ac signal applied to the sample being different from the frequency of the ac signal applied to the tip.