Scanning probe microscopy apparatus and techniques
View Patent ↗Scanning probe techniques based on the measurement of impedance spectroscopy using a conductive an SPM tip is provided and applied to the study of local transport properties, especially at a grain boundary. The contributions of the grain boundaries and tip-surface interaction can be distinguished based on the analysis of the equivalent circuit. The technique is applicable for both the spatially resolved study of transport mechanisms of polycrystalline semiconductors and the tip-surface contact quality. A piezoresponse force microscopy technique yields quantitative information about local non-linear dielectric properties and higher order electromechanical coupled of ferroelectrics.
1. A method of assessing properties of a sample's grain boundaries, comprising the steps of:
(a) providing a scanning force microscope probe having a conductive probe tip on a cantilever,
(b) disposing the tip on a point on a surface of the sample,
(c) applying a modulated voltage to the probe tip; and
(d) providing an electrode in contact with the sample to enable acquiring of impedance modulus and phase, whereby information relating to grain boundaries may be obtained.
2. The method of claim 1 wherein the information includes electrical information about the transport properties across the grain boundaries.
3. The method of claim 2 wherein the probe tip is electrically isolated from the scanning force microscope's feedback mechanism, thereby enabling the measurement of mechanical surface properties at the point on the surface.
4. The method of claim 3 wherein the scanning force microscope is an atomic force microscope and the mechanical surface properties include topography.
5. The method of claim 3 further comprising the step of moving the probe tip to another point on the surface for measuring impedance spectra.
6. The method of claim 5 further comprising the step of measuring mechanical surface properties.
7. The method of claim 6 wherein the probe tip contacts the surface and the mechanical surface property measured corresponds to cantilever deflection.
8. The method of claim 3 wherein the electrode contacts the surface proximate the probe tip.
9. The method of claim 3 wherein the electrode contacts the sample opposite the probe tip.