X-ray transmissive optical mirror apparatus
A mirror is reflective to light and transmissive to x-rays. The mirror has a continuous mirror surface and an x-ray aperture within a body portion of the mirror proximate the continuous mirror surface that is transmissive to x-rays.
1. A mirror for reflecting light and transmitting x-rays, comprising:
an optical substrate having a first diameter and an associated minimum thickness, said optical substrate including a top surface polished to form a continuous mirror surface and said minimum thickness selected such that said optical substrate is at least partially transmissive to x-rays;
an optically reflective coating deposited on said mirror surface, said optically reflective coating being transmissive to x-rays;
at least one mechanical support substrate providing mechanical support to said optical substrate;
an x-ray aperture within said at least one mechanical support substrate including a region of said at least one mechanical support substrate of reduced thickness that is transmissive to x-rays having a second diameter less than said first diameter.
2. The apparatus of claim 1 , wherein said optically reflective coating comprises a dielectric stack mirror for reflecting light at a pre-selected wavelength, said dielectric stack mirror including a sequence of dielectric materials of different refractive indices having a total x-ray loss below a first pre-selected value and a total optical reflectivity of at least a second pre-selected value.
3. The apparatus of claim 2 , wherein said mirror surface is super-polished with a surface roughness of less than one Angstrom rms.
4. The apparatus of claim 2 , wherein said dielectric stack mirror comprises a sequence of quarter-wave thick layers having a total reflectivity of at least about 0.9999.
5. The Apparatus of claim 2 , wherein said x-ray aperture comprises a cavity within said mechanical support substrate said cavity having a second diameter less than said first diameter to form a region of reduced thickness in said mirror.
6. The apparatus of claim 2 , wherein said mirror surface is configured to reflect light in an optical resonator of a Compton backscattering system and said x-ray aperture is configured to transmit x-rays generated by Compton backscattering.
7. A system to generate x-rays by Compton backscattering, comprising:
an electron storage ring guiding electrons through an interaction point disposed along a portion of said electron storage ring;
an optical system generating photon pulses coupled to said interaction point, the optical system including an optical resonator having a mirror reflective to said photon pulses and transmissive to x-rays, the mirror including:
an optical substrate having a first diameter and an associated minimum thickness, said optical substrate including a top surface polished to form a continuous mirror surface and said minimum thickness selected such that said optical substrate is at least partially transmissive to x-rays;
an optically reflective coating deposited on said mirror surface, said optically reflective coating being transmissive to x-rays;
at least one mechanical support substrate providing mechanical support to said optical substrate;
an x-ray aperture within said at least one mechanical support substrate including a region of said at least one mechanical support substrate of reduced thickness that is transmissive to x-rays having a second diameter less than said first diameter.
8. The system of claim 7 , wherein said optically reflective coating comprises a dielectric stack mirror for reflecting light at a pre-selected wavelength, said dielectric stack mirror including a sequence of dielectric materials of different refractive indices having a total x-ray loss below a first pre-selected value and a total optical reflectivity of at least a second pre-selected value.
9. The system of claim 8 , wherein said mirror surface is super-polished with a surface roughness of less than one Angstrom rms.
10. The system of claim 8 , wherein said dielectric stack mirror comprises a sequence of quarter-wave thick layers having a total reflectivity of at least about 0.9999.
11. The system of claim 8 , wherein said x-ray aperture comprises a cavity within said mechanical support substrate having a second diameter less than said first diameter to form a region of reduced thickness in said mirror.
12. A system to generate x-rays by Compton backscattering, comprising:
an electron storage ring guiding electrons through an interaction point disposed along a portion of said electron storage ring;
an optical system generating photon pulses coupled to said interaction point, the optical system including a high finesse optical resonator having a mirror reflective to said photon pulses and transmissive to x-rays, the mirror including:
an optical substrate having a first diameter and an associated minimum thickness, said optical substrate including a top surface polished to form a continuous mirror surface and said minimum thickness selected such that said optical substrate is at least partially transmissive to x-rays;
an optically reflective coating deposited on said mirror surface, said optically reflective coating being transmissive to x-rays;
at least one mechanical support substrate providing mechanical support to said optical substrate;
an x-ray aperture within said at least one mechanical support substrate including a region of said at least one mechanical support substrate of reduced thickness that is transmissive to x-rays having a second diameter less than said diameter;
the mirror surface being continuous and covering a diameter greater than a mode waist of said optical resonator at said mirror surface with a reflectivity of said mirror being at least 0.9999.
13. The system of claim 12 , wherein said optically reflective coating comprises a dielectric stack mirror for reflecting light at a pre-selected wavelength, said dielectric stack mirror including a sequence of dielectric materials of different refractive indices having a total x-ray loss below a first pre-selected value and a total optical reflectivity of at least a second pre-selected value.
14. The system of claim 13 , wherein said mirror surface is super-polished with a surface roughness of less than one Angstrom rms.
15. The system of claim 13 , wherein said dielectric stack mirror comprises a sequence of quarter-wave thick layers having a total reflectivity of at least about 0.9999.
16. The system of claim 12 , wherein said x-ray aperture comprises a cavity within said mechanical support substrate having a second diameter less than said first diameter to form a region of reduced thickness in said mirror.