IP Library Granted Patent US 7,247,419
Granted Patent B2
US 7,247,419 · App. 11/103,134 · Granted Jul 24, 2007

Nanocomposite photosensitive composition and use thereof

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Quick Facts
Patent No.
US 7,247,419
App. No.
11/103,134
Granted
Jul 24, 2007
Kind
B2
Abstract

The present invention relates to a photoresist composition suitable for image-wise exposure and development as a negative photoresist comprising a negative photoresist composition and an inorganic particle material having an average particle size equal or greater than 10 nanometers, wherein the thickness of the photoresist coating film is greater than 5 microns. The negative photoresist composition is selected from (1) a composition comprising (i) a resin binder, (ii) a photoacid generator, and (iii) a cross-linking agent; or (2) a composition comprising (i) a resin binder, (ii) optionally, addition-polymerizeable, ethylenically unsaturated compound(s) and (iii) a photoinitiator; or (3) a composition comprising (i) a photopolymerizable compound containing at least two pendant unsaturated groups; (ii) ethylenically unsaturated photopolymerizable polyalkylene oxide hydrophilic compound(s); and (iii) a photoinitiator.

Claims (10)

1. A photoresist composition suitable for image-wise exposure and development comprising a negative photoresist composition, wherein the negative photoresist composition comprises (i) a photopolymerizable compound containing at least two pendant unsaturated groups; (ii) ethylenically unsaturated photopolymerizable polyalkylene oxide hydrophilic compound(s); (iii) a photoinitiator and an amine modified acrylic oligomer, and an inorganic particle material having an average particle size equal or greater than 10 nanometers, wherein the photoresist composition is capable of forming a photoresist coating film with a thickness greater than 5 microns after exposure and development.

2. The photoresist composition according to claim 1 wherein the photoresist coating film thickness is greater than 10 microns.

3. The photoresist composition according to claim 1 , where the photoresist coating film thickness is greater than 20 microns.

4. The photoresist composition according to claim 1 , where the photoresist coating film thickness is less than 150 microns.

5. The photoresist composition according to claim 1 , where the inorganic particle material is colloidal silica.

6. The photoresist composition according to claim 1 , where the inorganic particle material has an average particle size from greater than about 10 to about 50 nanometers.

7. The photoresist composition according to claim 1 , where the inorganic particle material has an average particle size from about 20 to about 50 nanometers.

8. The photoresist composition according to claim 1 , where the inorganic particle material is present in an amount of from about 0.1% and about 90% by weight of the photoresist.

9. The photoresist composition according to claim 1 , where the inorganic particle material is present in an amount of from about 5% and about 75% by weight of the photoresist.

10. The photoresist composition according to claim 1 , where the inorganic particle material is present in an amount of from about 10% and about 50% by weight of the photoresist.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 8, 2015
From: AZ ELECTRONIC MATERIALS USA CORP.
To: MERCK PATENT GMBH
Reel/Frame 034742/0206 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 24, 2005
From: CHEN, CHUNWEI; LU, PING-HUNG; ZHUANG, HONG; NEISSER, MARK
To: AZ ELECTRONIC MATERIALS USA CORP.
Reel/Frame 016273/0550 →