Polarimetric scatterometry methods for critical dimension measurements of periodic structures
View Patent ↗An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample, can measure optical properties of the periodic structure. An E-O modulator in the illumination path can modulate the polarization. The head optics collect light reflected from the periodic structure and feed that light to a spectrometer for measurement. A beamsplitter in the collection path can ensure both S and P polarization from the sample are separately measured. The measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.
1. A method of evaluating features having critical dimensions formed on a semiconductor wafer comprising the steps of:
a) directing a broadband probe beam to a spot on the surface of the sample at a non-normal angle of incidence and along a first azimuthal angle;
b) measuring the reflected probe beam with a spectrometer and generating measurement data as a function of wavelength;
c) changing the azimuthal angle of the probe beam and repeating step (b);
d) evaluating the parameters of the critical dimension features of the wafer based on the measurements obtained in steps (b) and (c); and
e) storing the results of the evaluation.
2. A method as recited in claim 1 , wherein the azimuthal angle measured in step (c) is 180 degrees different from the first azimuthal angle.
3. A method as recited in claim 1 , wherein step (c) is repeated at least once so that measurements are obtained at three or more azimuthal angles.
4. A method as recited in claim 1 , wherein step (c) is repeated for a range of azimuthal angles.
5. A method as recited in claim 1 , wherein the change in azimuthal angle of step (c) is performed by rotating the direction of the probe beam while keeping the wafer stationary.
6. A method as recited in claim 1 , wherein the change in azimuthal angle of step (c) is performed by rotating the wafer while keeping the direction of the probe beam stationary.
7. A method as recited in claim 1 , further including the step of changing the angle of incidence of the probe beam and repeating step (b).
8. A method as recited in claim 1 , wherein said measurement step includes rotating one of a compensator or an analyzer located in the path of the probe beam.
9. A method as recited in claim 8 , wherein the evaluation of the wafer is based on spectroscopic ellipsometry.
10. A method of evaluating features having critical dimensions formed on a semiconductor wafer comprising the steps of:
a) directing a broadband probe beam to a spot on the surface of the sample at a non-normal angle of incidence and along a first azimuthal angle;
b) measuring the reflected probe beam with a spectrometer and generating measurement data as a function of wavelength;
c) rotating the direction of the probe beam with respect to the wafer to a second azimuthal angle and repeating step (b);
d) rotating the direction of the probe beam with respect to the wafer to a third azimuthal angle and repeated step (b);
e) evaluating the parameters of the critical dimension features of the wafer based on the measurements obtained in steps (b), (c) and (d); and
f) storing the results of the evaluation.
11. A method as recited in claim 10 , wherein one of the second or third azimuthal angles is 180 degrees different from the first azimuthal angle.
12. A method as recited in claim 10 , wherein step (c) is repeated for a range of azimuthal angles.
13. A method as recited in claim 10 , wherein the step of rotating the direction of the probe beam with respect to the wafer is performed by rotating the direction of the probe beam while keeping the wafer stationary.
14. A method as recited in claim 10 , wherein the step of rotating the direction of the probe beam with respect to the wafer is performed by rotating the wafer while keeping the direction of the probe beam stationary.
15. A method as recited in claim 10 , further including the step of changing the angle of incidence of the probe beam and repeating step (b).
16. A method as recited in claim 10 , wherein said measurement step includes rotating one of a compensator or an analyzer located in the path of the probe beam.
17. A method as recited in claim 16 , wherein the evaluation of the wafer is based on spectroscopic ellipsometry.
18. A method of evaluating features having critical dimensions formed on a semiconductor wafer comprising the steps of:
a) directing a polarized broadband probe beam to a spot on the surface of the sample at a non-normal angle of incidence and along a first azimuthal angle;
b) measuring the polarization states of the reflected probe beam and generating measurement data as a function of wavelength;
c) changing the azimuthal angle of the probe beam and repeating step (b);
d) evaluating the parameters of the critical dimension features of the wafer based on the measurements obtained in steps (b) and (c); and
e) storing the results of the evaluation.
19. A method as recited in claim 18 , wherein step (c) is repeated at least once so that measurements are obtained at three unique azimuthal angles.
20. A method as recited in claim 18 , wherein said measurement step includes rotating one of a compensator or an analyzer located in the path of the probe beam.