IP Library Granted Patent US 7,358,651
Granted Patent B2
US 7,358,651 · App. 11/109,108 · Granted Apr 15, 2008

Apparatus and method for detecting a target environmental variable that employs film-bulk acoustic wave resonator oscillators

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Quick Facts
Patent No.
US 7,358,651
App. No.
11/109,108
Granted
Apr 15, 2008
Kind
B2
Abstract

An apparatus and method for detecting a target environmental variable (TEV). A first film-bulk acoustic resonator (FBAR) oscillator that includes a first FBAR with a first response to the target environmental variable generates a first frequency. A second film-bulk acoustic resonator (FBAR) oscillator that includes a second FBAR with a second response to the target environmental variable generates a second frequency. A circuit that is coupled to the first FBAR oscillator and the second FBAR oscillator determines the target environmental variable (e.g., changes in the TEV) based on the first frequency and the second frequency.

Claims (27)

1. An apparatus that detects a target environmental variable comprising:

a first film-bulk acoustic resonator (FBAR) oscillator that includes a first FBAR with a first response to the target environmental variable; wherein the first FBAR oscillator generates a first frequency;

a second film-bulk acoustic resonator (FBAR) oscillator that includes a second FBAR with a second response to the target environmental variable; wherein the second FBAR oscillator generates a second frequency; and

a circuit that detects changes in the target environmental variable based on the first frequency and the second frequency.

2. The apparatus of claim 1 wherein the first FBAR oscillator and the second FBAR oscillator detect a difference in the response of the first FBAR to the target environmental variable and the response of the second FBAR to the target environmental variable and extinguish effects on the response of the first FBAR and the response of the second FBAR caused by non-target environmental variables to which the first FBAR and the second FBAR are exposed.

3. The apparatus of claim 1 wherein the circuit measures the difference between the first frequency and the second frequency.

4. The apparatus of claim 1 wherein the first FBAR includes

a FBAR wafer;

an acoustic reflector formed in the FBAR wafer that includes a surface; a first electrode formed on the surface of the acoustic reflector;

wherein the first electrode includes a surface;

a piezoelectric layer formed on the surface of the first electrode;

wherein the piezoelectric layer includes a surface; and

a second electrode formed on the surface of the piezoelectric layer.

5. The apparatus of claim 4 wherein the second FBAR includes

a second acoustic reflector formed in the FBAR wafer that includes a surface;

a third electrode formed on the surface of the second acoustic reflector; wherein the first electrode includes a surface;

a second piezoelectric layer formed on the surface of the third electrode;

wherein the piezoelectric layer includes a surface; and

a fourth electrode formed on the surface of the second piezoelectric layer.

6. The apparatus of claim 1 wherein the first FBAR and the second FBAR are manufactured with different mass loading;

wherein the different manufacturing causes the first FBAR and the second FBAR to respond differently to a target environmental variable and to generate an offset frequency that is controlled by the mass loading.

7. A method for detecting a target environmental variable comprising:

utilizing a first film-bulk acoustic resonator (FBAR) oscillator that includes a first FBAR with a first response to the target environmental variable to generate a first frequency;

utilizing a second film-bulk acoustic resonator (FBAR) oscillator that includes a second FBAR with a second response to the target environmental variable to generate a second frequency; and

detecting a change in the target environmental variable based on the first frequency and the second frequency.

8. The method of claim 7 further comprising:

employing the first FBAR oscillator and the second FBAR oscillator to detect a difference in the response of the first FBAR to the target environmental variable and the response of the second FBAR to the target environmental variable and to extinguish common effects on the response of the first FBAR and the response of the second FBAR caused by non-target environmental variables to which the first FBAR and the second FBAR are exposed.

Assignments (15)
CORRECTIVE ASSIGNMENT TO CORRECT THE ERROR IN RECORDING THE MERGER PREVIOUSLY RECORDED AT REEL: 047357 FRAME: 0302. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 22, 2019
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 048674/0834 →
CORRECTIVE ASSIGNMENT TO CORRECT THE EFFECTIVE DATE OF MERGER PREVIOUSLY RECORDED ON REEL 047195 FRAME 0658. ASSIGNOR(S) HEREBY CONFIRMS THE THE EFFECTIVE DATE IS 09/05/2018. Recorded Oct 29, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047357/0302 →
MERGER Recorded Oct 4, 2018
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE. LIMITED
Reel/Frame 047195/0658 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
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CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME PREVIOUSLY RECORDED AT REEL: 017206 FRAME: 0666. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded May 6, 2016
From: AGILENT TECHNOLOGIES, INC.
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
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PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
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TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032851-0001) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 037689/0001 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
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RELEASE OF SECURITY INTEREST Recorded May 15, 2013
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From: AVAGO TECHNOLOGIES WIRELESS IP (SINGAPORE) PTE. LTD.
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From: RUBY, RICHARD C.; FLOWER, GRAHAM M.; LARSON III, JOHN D.; UNKRICH, MARK A.
To: AGILENT TECHNOLOGIES, INC.
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From: RUBY, RICHARD C; FLOWER, GRAHAM M; LARSON III, JOHN D; UNKRICH, MARK A
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