IP Library Granted Patent US 7,078,244
Granted Patent B2
US 7,078,244 · App. 11/112,815 · Granted Jul 18, 2006

Multi-bit MRAM device with switching nucleation sites

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Quick Facts
Patent No.
US 7,078,244
App. No.
11/112,815
Granted
Jul 18, 2006
Kind
B2
Abstract

A magnetic memory cell includes a first magneto-resistive device and a second magneto-resistive device. The first magneto-resistive device has a first sense layer. The second magneto-resistive device is connected in series with the first magneto-resistive device. The second magneto-resistive device has a second sense layer. At least one controlled nucleation site is placed on at least one of the first sense layer and the second sense layer.

Claims (8)

1. A method for producing a magnetic memory cell comprising the following:

forming a first magneto-resistive device having a first sense layer, including:

placing at least one controlled nucleation site on the first sense layer; and,

forming a second magneto-resistive device connected in series with the first magneto-resistive device, the second magneto-resistive device having a second sense layer, including:

placing at least one controlled nucleation site on the second sense layer.

2. A method as in claim 1 wherein nucleation sites on the first sense layer are different in shape relative to nucleation sites on the second sense layer.

3. A method as in claim 1 wherein nucleation sites on the first sense layer are different in size relative to nucleation sites on the second sense layer.

4. A method as in claim 1 wherein nucleation sites on the first sense layer are different in placement relative to nucleation sites on the second sense layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 22, 2007
From: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 019733/0030 →