Field induced THz wave emission microscope
A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.
1. A device for use with a source of radiation to provide a THz emission image representing a sample, the device comprising:
a substrate;
a metallic based probe disposed adjacent a first surface of the substrate, the probe having a tip portion at one end thereof; and
a source of AC bias coupled between the metallic based probe tip and a further surface of the substrate,
wherein radiation generated by the source of radiation is incident upon the first surface of the substrate in a vicinity of the metallic based probe tip, and a THz radiation is emitted from the first surface of the substrate based at least on the AC bias.
2. The device according to claim 1 , the device further comprising:
a THz detector;
means for impinging and focusing a) a portion of the radiation from the source of radiation and b) at least a portion of the THz radiation emitted from the substrate onto a surface of the THz detector, the THz detector modulating the portion of the radiation from the source of radiation with the THz radiation to create a modulated THz radiation; and
means of optical detection for detecting the modulated THz radiation.
3. The device according to claim 2 , further comprising a lock-in amplifier coupled to the means of optical detection and the source of AC bias, a frequency of the AC bias provided to the lock-in amplifier.
4. The device according to claim 3 , wherein the lock-in amplifier reduces a noise level due to at least one of power fluctuations of the source of radiation, mechanical vibrations and background THz radiation noise based on the frequency of the AC bias.
5. The device according to claim 3 , wherein the lock-in amplifier comprises a bandpass filter to filter the modulated THz radiation based on the frequency of the AC bias.
6. The device according to claim 1 , wherein the source of radiation is a femtosecond laser.
7. The device according to claim 6 , wherein the femtosecond laser is one of a p-polarized, an s-polarized, a randomly polarized or a non-polarized laser.
8. The device according to claim 1 , further comprising an actuator coupled to the metallic based probe for changing at least one of a) a distance between the tip of the metallic based probe and the first surface of the substrate and b) a placement of the tip of the metallic based probe within a plane parallel to the first surface of the substrate.
9. The device according to claim 1 , further comprising a source of DC bias coupled in series with the source of AC bias.
10. The device according to claim 9 , wherein the source of DC bias generates a voltage between about −3 V to 3 V DC.
11. The device according to claim 1 , wherein the source of AC bias generates a voltage between about 0 V to 5 V rms.
12. The device according to claim 1 , wherein the substrate comprises a semiconductor wafer of at least one of a p-type and/or an n-type semiconductor material.
13. The device according to claim 12 , wherein the semiconductor wafer comprises at least one of GaAs and/or InAs.
14. The device according to claim 1 , wherein the metallic based probe comprises at least one of Tungsten and/or Pt—Ir.
15. The device according to claim 1 , wherein the tip portion of the metallic based probe comprises a diameter of between about 1 nm to 1 μm.
16. The device according to claim 1 , wherein the first surface of the substrate is adapted to receive the sample for imaging.
17. A method for providing a THz emission image representing a sample, for use with a source of radiation, the method comprising the steps:
providing a substrate;
disposing a metallic based probe adjacent a first surface of the substrate, the metallic based probe having a tip portion at one end thereof;
providing a source of AC bias coupled between the metallic based probe and a further surface of the substrate;
emitting the radiation from the source of radiation toward the first surface of the substrate in a vicinity of the tip portion of the metallic based probe; and
emitting a THz radiation from the first surface of the substrate responsive to at least the AC bias based on the radiation emitted from the source of radiation.
18. The method according to claim 17 , the method further comprising:
providing a THz detector;
impinging and focusing a) a portion of the radiation from the source of radiation and b) at least a portion of the emitted THz radiation emitted from the substrate onto a surface of the THz detector, the THz detector modulating the source of radiation with the THz radiation to provide a modulated THz radiation; and
optically detecting the modulated THz radiation.
19. The method according to claim 18 , further comprising the step of bandpass filtering the optically detected modulated source of radiation based on an AC bias frequency provided by the source of AC bias.
20. A microscope for use with a source of radiation for producing a THz emission representing an image of a sample, the microscope comprising:
a substrate;
a metallic based probe disposed adjacent a first surface of the substrate, the probe having a tip portion at one end thereof;
a source of AC bias coupled between the metallic based probe tip and a further surface of the substrate;
an actuator coupled to the metallic based probe, the actuator changing an X and/or Y axis position of the metallic based probe relative to a plane parallel to the first surface of the substrate;
a THz detector for modulating the source of radiation with a sample-modified THz radiation to create a modulated THz radiation characteristic of the sample;
an optical detection system for modifying and detecting the modulated THz radiation and converting the modulated THz radiation into electronic information; and
a processor for receiving the electronic information and producing an image of the sample based on the electronic information and the position provided from the actuator,
wherein the sample is placed on the substrate, and radiation generated by the source of radiation is incident upon the first surface of the substrate in a vicinity of the metallic based probe tip and sample, and the sample-modified THz radiation is emitted from the first surface of the substrate based at least on the AC bias.
21. The microscope according to claim 20 , further comprising a lock-in amplifier coupled to the optical detection system and a frequency of the AC bias provided to the lock-in amplifier, the lock-in amplifier bandpass filtering the modulated THz radiation at the frequency of the AC bias.
22. The microscope according to claim 20 , wherein the actuator further changes a Z axis distance between the metallic based probe tip and the first surface of the substrate.
23. The microscope according to claim 22 , wherein the distance is greater than 1 nm for providing an image charge that emits the THz radiation.
24. The microscope according to claim 22 , wherein the distance is less than 1 nm for providing a tunneling current that emits the THz radiation.
25. The microscope according to claim 22 , wherein the metallic based probe tip is at or significantly close to the first surface of the substrate for providing a contact current that emits the THz radiation.