IP Library Granted Patent US 7,071,020
Granted Patent B2
US 7,071,020 · App. 11/126,343 · Granted Jul 4, 2006

Method of forming an elevated photodiode in an image sensor

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Quick Facts
Patent No.
US 7,071,020
App. No.
11/126,343
Granted
Jul 4, 2006
Kind
B2
Abstract

The invention provides an elevated photodiode for image sensors and methods of formation of the photodiode. Elevated photodiodes permit a decrease in size requirements for pixel sensor cells while reducing leakage, image lag and barrier problems typically associated with conventional photodiodes.

Claims (10)

1. A method of forming a pixel sensor cell comprising:

forming a blocking layer on a first substrate layer and over at least one transistor gate;

forming a plurality of openings in the blocking layer;

growing an epitaxial layer of silicon in said plurality of openings;

etching said blocking layer after growing the epitaxial layer to form a sidewall on said at least one transistor gate.

2. The method according to claim 1 wherein said blocking layer is silicon dioxide.

3. The method according to claim 1 wherein said epitaxial layer in said plurality of openings is grown to a thickness of about 1000 §.

4. The method according to claim 1 wherein at least one of said plurality of openings is formed over a region where a photoconversion device is to be formed.

5. The method according to claim 1 wherein at least one of said plurality of openings is formed over a region where a source/drain region for a transistor having said at least one transistor gate is to be formed.

6. The method according to claim 1 further comprising etching said blocking layer to form sidewalls on a plurality of transistor gates.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 6, 2016
From: MICRON TECHNOLOGY, INC.
To: APTINA IMAGING CORPORATION
Reel/Frame 040823/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 16, 2016
From: HONG, SUNGKWON
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040341/0990 →