Patent Assignment
Reel/Frame 040823/0001
Assignment of Assignor's Interest
Recorded: 2016-12-06
Pages: 215
Assignor
MICRON TECHNOLOGY, INC.
Executed: 2008-09-26
Assignee
APTINA IMAGING CORPORATION
C/O CITICO TRUSTEES (CAYMAN) LIMITED, REGATTA OFFICE PARK, WEST BAY ROAD, GRAND CAYMAN, Y1-1205, CAYMAN ISLANDS
Covered Properties
(91)
Multi-Layered Gate for a Cmos Imager
Patent:
6,548,352 →
Application:
09/686,944 →
Cmos Imager with Storage Capacitor
Patent:
6,429,470 →
Application:
09/725,468 →
Method of Making Trench Photosensor for a Cmos Imager
Multi-Layered Gate for a Cmos Imager
Multi-Trench Region for Accumulation of Photo-Generated Charge in a Cmos Imager
Method of Forming a Cmos Imager
A Photogate for Use in an Imaging Device
Method of Forming Cmos Imager with Storage Capacitor
Method of Forming an Imaging Device
Cmos Imager and Method of Formation
Pixel Sensor Cell for Use in an Imaging Device
Cmos Imager and Method of Formation
Cmos Imager and Method of Formation
Cmos Imager and Method of Formation
Cmos Imager and Method of Formation
Multi-Trench Region for Accumulation of Photo-Generated Charge in a Cmos Imager
Method of Forming Two-Transistor Pixel with Buried Reset Channel
Multi-Layered Gate for a Cmos Imager
Total Internal Reflection (Tir) Cmos Imager
Forming an Imager Array Having Improved Color Response
Fully Differential Reference Driver for Pipeline Analog to Digital Converter
Multi-Trench Region for Accumulation of Photo-Generated Charge in a Cmos Imager
Method of Forming a Photosensor
Two-Transistor Pixel with Buried Reset Channel and Method of Formation
Color Filter Imaging Array and Method of Formation
A Method of Forming a Photosensor Comprising a Pluraltiy of Trenches
Imaging with Gate Controlled Charge Storage
Image Sensor with Improved Dynamic Range and Method of Formation
Photodiode Sensor and Photosensor for Use in an Imaging Device
Deep Photodiode Isolation Process
Micro-Lenses and Method for Increasing Area Coverage and Controlling Shape of Micro Lenses
Elevated Photo Diode in an Image Sensor
Internal Bias Measure with Onboard Adc for Electronic Devices
Self Masking Contact Using an Angled Implant
Pixel Design to Improve Photodiode Capacitance and Method of Forming Same
High Dynamic Range Cascaded Integration Pixel Cell
Optimized Transistor for Imager Device
Cmos Imager with Enhanced Transfer of Charge and Low Voltage Operation and Method of Formation
Method of Forming an Elevated Photodiode in an Image Sensor
Optical Channels for Multi-Level Metal Optical Imagers and Method for Manufacturing Same
Cmos Imager with Enhanced Transfer of Charge and Low Voltage Operation and Method of Formation
Apparatus and Method for Determining Temperature of an Active Pixel Imager and Correcting Temperature Induced Variations in an Imager
Pixel with Differential Readout
Minimized Sar-Type Column-Wide Adc for Image Sensors
Minimized Sar-Type Column-Wide Adc for Image Sensors
Cmos Image Sensor Having Pinned Diode Floating Diffusion Region
Dark Current Reduction Circuitry for Cmos Active Pixel Sensors
Photon Amplification for Image Sensors
Methods for Packaging Microelectronic Imagers
Micro-Lenses for Cmos Imagers and Method for Manufacturing Micro-Lenses
Methods of Packaging and Testing Microelectronic Imaging Devices
Closed-Loop High Voltage Booster
Image Sensor Having Pinned Floating Diffusion Diode
Imaging with Gate Controlled Charge Storage
Ramp Generators for Imager Analog-to-Digital Converters
Trench Isolation Structure and Method of Formation
Methods for Pixel Binning in an Image Sensor
Pixel Circuit with Non-Destructive Readout Circuit and Methods of Operation Thereof
Micro-Lenses for Imagers
Photon Amplification for Image Sensors
Microelectronic Imagers and Methods of Packaging Microelectronic Imagers
In-Pixel Ktc Noise Suppression Using Circuit Techniques
Pixel with Differential Readout
Method and Apparatus for Testing Image Sensors
Image Sensor for Reduced Dark Current
Image Sensor for Reduced Dark Current
Image Sensor with Improved Dynamic Range and Method of Formation
Trench Photosensor for a Cmos Imager
Image Sensor Having Pinned Floating Diffusion Diode
Pixel with Differential Readout
Method and Apparatus Providing Configurable Current Source Device for Image Sensors with a Selective Current at an Output Node
High Dynamic Range Image Sensor
Microelectronic Imaging Units and Methods of Manufacturing Microelectronic Imaging Units
Internal Bias Measure with Onboard Adc for Electronic Devices
Gapless Microlens Array and Method of Fabrication
Microfeature Workpieces Having Microlenses and Methods of Forming Microlenses on Microfeature Workpieces
High Density Row Ram for Column Parallel Cmos Image Sensors
Low Dark Current Pixel with a Guard Drive Active Photodiode
Process for Color Filter Array Residual Pigment Removal
Methods for Making a Pixel Cell with a Transparent Conductive Interconnect Line for Focusing Light
Column-Wise Clamp Voltage Driver for Suppression of Noise in an Imager
Imager Pixel with Capacitance Circuit for Boosting Reset Voltage
Buffering Technique Using Structured Delay Skewing
Optimized Transistor for Imager Device
Method and Apparatus for Providing a Rolling Double Reset Timing for Global Storage in Image Sensors
Wide Dynamic Range Linear-and-Log Active Pixel
High Dynamic Range Cascaded Integration Pixel Cell and Method of Operation
Pixel with Transfer Gate with No Isolation Edge
Trench Photosensor for a Cmos Imager
High Density Row Ram for Column Parallel Cmos Image Sensors
Micro-Lenses for Cmos Imagers and Method for Manufacturing Micro-Lenses
Related Assignments
(9)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Nov 8, 2016
From: RHODES, HOWARD
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040256/0695 →
Assignment of Assignor's Interest
Nov 8, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040256/0830 →
Assignment of Assignor's Interest
Nov 8, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040257/0111 →
Assignment of Assignor's Interest
Nov 8, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC..
Reel/Frame 040257/0321 →
Assignment of Assignor's Interest
Nov 8, 2016
From: RHODES, HOWARD
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040257/0444 →
Assignment of Assignor's Interest
Nov 9, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040263/0889 →
Assignment of Assignor's Interest
Nov 9, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040263/0945 →
Assignment of Assignor's Interest
Nov 9, 2016
From: RHODES, HOWARD E.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040264/0056 →
Assignment of Assignor's Interest
Nov 14, 2016
From: FOSSUM, ERIC R.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 040304/0103 →