IP Library Patent Application 11143552
Patent Application
App. No. 11/143,552

Method and apparatus for cleaning and surface conditioning objects using plasma

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Quick Facts
Patent No.
US None
App. No.
11/143,552
Abstract

An apparatus for cleaning objects using plasma is disclosed. The apparatus includes a first plurality of elongated dielectric barrier members arranged adjacent each other; a second plurality of elongated dielectric barrier members arranged adjacent each other and stacked juxtaposed the first plurality of elongated dielectric barrier members; and a plurality of electrodes, each contained within, and extending substantially along the length of, respective ones of the first and second plurality of stacked elongated dielectric barrier members.

Claims (30)

1 . An apparatus for cleaning objects using plasma, comprising:

a first plurality of elongated dielectric barrier members arranged adjacent each other;

a second plurality of elongated dielectric barrier members arranged adjacent each other and stacked juxtaposed the first plurality of elongated dielectric barrier members; and

a plurality of electrodes, each contained within, and extending substantially along the length of, respective ones of the first and second plurality of elongated dielectric barrier members.

2 . The apparatus of claim 1 , wherein the objects comprise a plurality of conductive probes, the probes arranged and configured to be introduced proximate the first and second plurality of elongated dielectric barrier members.

3 . The apparatus of claim 2 , further comprising a voltage source electrically coupled to the electrodes for producing a dielectric barrier discharge between the conductive probes and the first and second plurality of elongated dielectric barrier members, whereby plasma is formed to clean at least a portion of the probes.

4 . The apparatus of claim 1 , wherein the first plurality of elongated dielectric barrier members are arranged to define a first plane and the second plurality of elongated dielectric barrier members are arranged to define a second plane.

5 . The apparatus of claim 4 , wherein each of the first plurality of elongated dielectric barrier members are spaced apart and each of the second plurality of elongated dielectric barrier members are spaced apart, and wherein the first and second plurality of elongated dielectric barrier members are arranged at substantially regular intervals to define predetermined gaps therebetween.

6 . The apparatus of claim 5 , wherein the predetermined gaps are sized to allow at least a portion of each of the objects to be introduced between and among the first and second plurality of elongated dielectric barrier members.

7 . The apparatus of claim 6 , wherein the predetermined gaps range from about 0 mm to about 10 mm.

8 . The apparatus of claim 2 , wherein each elongated dielectric barrier member is substantially tubular, each having substantially the same sized diameter, and the conductive probes are substantially tubular, each having substantially the same sized diameter that is relatively smaller than the diameter of the elongated dielectric barrier members.

9 . The apparatus of claim 8 , wherein the predetermined gaps are less than the diameter of each of the probes.

10 . The apparatus of claim 1 , wherein each of the electrodes is arranged to form an aperture within and extending substantially along the length of each respective elongated dielectric barrier member.

11 . The apparatus of claim 1 , wherein each of the electrodes is arranged to form a solid core within, and extending substantially the length of, each respective elongated dielectric barrier member.

12 . The apparatus of claim 1 , wherein each of the electrodes are deposited within each respective one of the elongated dielectric barrier members.

13 . The apparatus of claim 1 , wherein each of the electrodes are discrete components secured within each of the elongated dielectric barrier members.

14 . The apparatus of claim 2 , wherein the conductive probes are introduced proximate the top portions of the first and second plurality of elongated dielectric barrier members.

15 . The apparatus of claim 1 , wherein the first and second plurality of elongated dielectric barrier members are arranged in a microtiter plate matrix format.

16 . The apparatus of claim 1 , wherein the shape of each of the elongated dielectric barrier members is selected from a group consisting of tubular, circular, square, rectangular, oval, polygonal, triangular, trapezoidal, rhombus and irregular.

17 . The apparatus of claim 1 , wherein the first plurality of elongated dielectric barrier members are arranged in a non-planar configuration and the second plurality of elongated dielectric barrier members are arranged in a non-planar configuration.

18 . The apparatus of claim 4 , wherein the first plurality of elongated dielectric barrier members are arranged substantially perpendicular to the second plurality of elongated dielectric barrier members.

19 . An apparatus for cleaning objects using plasma, comprising:

a first plurality of elongated dielectric barrier members arranged adjacent each other in a microtiter plate matrix format;

a second plurality of elongated dielectric barrier members arranged adjacent each other and stacked on top of the first plurality of elongated dielectric barrier members in a microtiter plate format; and

a plurality of electrodes, each contained within, and extending substantially along the length of, respective ones of the first and second plurality of elongated dielectric barrier members.

20 . A method for cleaning at least a portion of a plurality of conductive probes, comprising:

providing a first and second plurality of stacked elongated dielectric barrier members having electrodes arranged therein;

introducing the conductive probes proximate the first and second plurality of stacked elongated dielectric barrier members; and

generating a dielectric barrier discharge to form plasma between and among the first and second plurality of stacked elongated dielectric barrier members and respective proximate probes for cleaning at least a portion of each of the probes.

21 . The method of claim 19 , wherein the plasma comprises energetic and reactive particles selected from a group consisting of electrons, ions, excited and metastable species, and free radicals.

Assignments (7)
CHANGE OF NAME Recorded Jan 28, 2010
From: IONFIELD SYSTEMS, INC.
To: IONFIELD SYSTEMS, LLC
Reel/Frame 023866/0267 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 27, 2010
From: CERIONX, INC.
To: IONFIELD SYSTEMS, INC.
Reel/Frame 023859/0484 →
RELEASE OF SECURITY INTEREST Recorded Jul 19, 2007
From: COMERICA BANK
To: CERIONX, INC.
Reel/Frame 019573/0893 →
RELEASE OF SECURITY INTEREST Recorded Jul 19, 2007
From: COMERICA BANK
To: CERIONX, INC.
Reel/Frame 019573/0888 →
SECURITY AGREEMENT Recorded Oct 6, 2006
From: CERIONX, INC.
To: COMERICA BANK
Reel/Frame 018362/0326 →
SECURITY AGREEMENT Recorded Oct 6, 2006
From: CERIONX, INC.
To: COMERICA BANK
Reel/Frame 018363/0579 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 2, 2005
From: KURUNCZI, PETER FRANK
To: CERIONX, INC.
Reel/Frame 016656/0986 →