Miniature modified Faraday cup for micro electron beams
View Patent ↗A micro beam Faraday cup assembly includes a refractory metal layer with an odd number of thin, radially positioned traces in this refractory metal layer. Some of the radially positioned traces are located at the edge of the micro modified Faraday cup body and some of the radially positioned traces are located in the central portion of the micro modified Faraday cup body. Each set of traces is connected to a separate data acquisition channel to form multiple independent diagnostic networks. The data obtained from the two diagnostic networks are combined and inputted into a computed tomography algorithm to reconstruct the beam shape, size, and power density distribution.
1. An apparatus for characterization of a micro beam, comprising:
a micro modified Faraday cup body positioned in the path of the micro beam, said micro modified Faraday cup body having a center hole and said micro modified Faraday cup body including an outer portion located radially outward from said center hole and an inner portion located radially outward from said center hole and having
a first radially positioned set of traces located in said outer portion of said micro modified Faraday cup body,
a second radially positioned set of traces located in said inner portion of said micro modified Faraday cup body,
a first measuring diagnostic network in said modified Faraday cup body operatively connected to said first radially positioned set of traces and positioned to detect the micro beam that passes through said first radially positioned set of traces, and
a second measuring diagnostic network in said modified Faraday cup body operatively connected to said second radially positioned set of traces and positioned to detect the micro beam that passes through said second radially positioned set of traces.
2. The apparatus for characterization of a micro beam of claim 1 wherein said first radially positioned set of traces comprises an odd number of radially positioned traces located in said outer portion of said micro modified Faraday cup body.
3. The apparatus for characterization of a micro beam of claim 1 wherein said second radially positioned set of traces comprises an odd number of radially positioned traces located in said inner portion of said micro modified Faraday cup body.
4. The apparatus for characterization of a micro beam of claim 1 including an additional radially positioned trace in said micro modified Faraday cup body that serves as a data acquisition trigger trace.
5. The apparatus for characterization of a micro beam of claim 4 wherein said additional radially positioned trace in said micro modified Faraday cup body that serves as a trigger trace comprises a radially positioned trace located in said outer portion of said micro modified Faraday cup body.
6. The apparatus for characterization of a micro beam of claim 1 wherein the beam has a diameter and the width of said first radial traces is approximately 10% or less of said diameter of the beam.
7. The apparatus for characterization of a micro beam of claim 1 wherein the beam has a diameter and the width of said second traces is approximately 10% or less of said diameter of the beam.
8. The apparatus for characterization of a micro beam of claim 1 wherein the beam has a diameter and the width of said first radial traces and the width of said second traces are approximately 10% or less of said diameter of the beam.
9. The apparatus for characterization of a micro beam of claim 1 including at least one additional set of radially positioned traces in said micro modified Faraday cup body.
10. An apparatus for characterization of a micro beam, comprising:
a micro modified Faraday cup body positioned in the path of the micro beam, said micro modified Faraday cup body having a center hole and said micro modified Faraday cup body including an outer portion located radially outward from said center hole and an inner portion located radially outward from said center hole and having
a first radially positioned set of traces located in said outer portion of said micro modified Faraday cup body,
a second radially positioned set of traces located in said inner portion of said micro modified Faraday cup body,
first measuring diagnostic network means in said modified Faraday cup body operatively connected to said first radially positioned set of traces for detecting the micro beam that passes through said first radially positioned set of traces, and
second measuring diagnostic network means in said modified Faraday cup body operatively connected to said second radially positioned set of traces detecting the micro beam that passes through said second radially positioned set of traces.
11. The apparatus for characterization of a micro beam of claim 10 wherein said first radially positioned set of traces comprises an odd number of radially positioned traces located in said outer portion of said micro modified Faraday cup body.
12. The apparatus for characterization of a micro beam of claim 10 wherein said second radially positioned set of traces comprises an odd number of radially positioned traces located in said inner portion of said micro modified Faraday cup body.
13. The apparatus for characterization of a micro beam of claim 10 including an additional radially positioned trace in said micro modified Faraday cup body that serves as a data acquisition trigger trace.
14. The apparatus for characterization of a micro beam of claim 13 wherein said additional radially positioned trace in said micro modified Faraday cup body that serves as a trigger trace comprises a radially positioned trace located in said outer portion of said micro modified Faraday cup body.
15. The apparatus for characterization of a micro beam of claim 10 wherein the beam has a diameter and the width of said first radial traces is approximately 10% or less of said diameter of the beam.
16. The apparatus for characterization of a micro beam of claim 10 wherein the beam has a diameter and the width of said second traces is approximately 10% or less of said diameter of the beam.
17. The apparatus for characterization of a micro beam of claim 10 wherein the beam has a diameter and the width of said first radial traces and the width of said second traces are approximately 10% or less of said diameter of the beam.
18. The apparatus for characterization of a micro beam of claim 10 including at least one additional set of radially positioned traces in said micro modified Faraday cup body.
19. A method for the characterization of a micro beam, comprising the steps of:
providing a micro modified Faraday cup body having a micro modified Faraday cup body positioned in the path of the micro beam, said micro modified Faraday cup body having a center hole,
providing a radial outer portion in said micro modified Faraday cup body located radially outward from said center hole,
providing an inner portion in said micro modified Faraday cup body located radially outward from said center hole,
providing a first radially positioned set of traces located in said outer portion of said micro modified Faraday cup body,
providing a second radially positioned set of traces located in said inner portion of said micro modified Faraday cup body,
providing a first measuring diagnostic network in said modified Faraday cup body operatively connected to said first radially positioned set of traces and positioned to detect the micro beam that passes through said first radially positioned set of traces,
providing a second measuring diagnostic network in said modified Faraday cup body operatively connected to said second radially positioned set of traces and positioned to detect the micro beam that passes through said second radially positioned set of traces;
directing the micro beam through said first radially positioned set of traces where it is detected by said first measuring diagnostic network; and
directing the micro beam through said second radially positioned set of traces where it is detected by said second measuring diagnostic network.
20. The method for the characterization of a micro beam of claim 19 including combining said first measuring diagnostic network and said second measuring diagnostic network.
21. The method for the characterization of a micro beam of claim 20 including using a computed tomography algorithm to reconstruct the beam shape.
22. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to reconstruct the beam size.
23. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to reconstruct the beam power density distribution.
24. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to reconstruct the beam shape, size, and power density distribution.
25. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to correct micro beam astigmatism.
26. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to correct micro beam effects leading to non-symmetric beams.
27. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to correct micro beam effects leading to non-optimum beams.
28. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to correct micro beam problems including focusing irregularities, beam astigmatism, and other effects leading to non-symmetric or non-optimum beams.
29. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to provide a permanent record of the micro beam.
30. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to provide a permanent record of the micro beam for quality control.
31. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to provide a system for repeating the same micro beam quality on the same machine over a period of time.
32. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to provide a permanent record of the micro beam to provide a system for transferring the micro beam quality characteristics to multiple machines.
33. The method for the characterization of a micro beam of claim 19 including using a computed tomography algorithm to provide a permanent record of the micro beam for documentation of uses made of the micro beam.