IP Library Granted Patent US 7,289,926
Granted Patent B2
US 7,289,926 · App. 11/168,722 · Granted Oct 30, 2007

System and method for examining high-frequency clock-masking signal patterns at full speed

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Quick Facts
Patent No.
US 7,289,926
App. No.
11/168,722
Granted
Oct 30, 2007
Kind
B2
Abstract

The present invention provides for a method for examining high-frequency clock-masking signal patterns at a reduced frequency. A first mode of a first shift register is selected. A plurality of bits is loaded on the first shift register at a first frequency. A second mode of the first shift register is selected. A first mode of a second shift register is selected. The plurality of bits is loaded on the second shift register. A second mode of the second shift register is selected. A first mode of a third shift register is selected. The plurality of bits is loaded on the third shift register. A second mode of the third shift register is selected and the plurality of bits is loaded from the third shift register at a second frequency, where the second frequency is lower than the first frequency, thereby providing for examining high-frequency clock-masking signal patterns at a reduced frequency.

Claims (55)

1. A method for examining high-frequency clock-masking signal patterns at a reduced frequency, comprising:

selecting a first mode of a first shift register;

loading a plurality of bits on the first shift register at a first frequency;

selecting a second mode of the first shift register;

selecting a first mode of a second shift register;

loading the plurality of bits on the second shift register;

selecting a second mode of the second shift register;

selecting a first mode of a third shift register;

loading the plurality of bits on the third shift register;

selecting a second mode of the third shift register; and

loading the plurality of bits from the third shift register at a second frequency, where the second frequency is lower than the first frequency, thereby providing for examining high-frequency clock-masking signal patterns at a reduced frequency.

2. The method as recited in claim 1 , further comprising testing the plurality of bits loaded from the third shift register.

3. The method as recited in claim 1 , wherein selecting a first mode of the second shift register comprises setting a serial disable bit to a logic low.

4. The method as recited in claim 1 , wherein selecting a second mode of the second shift register comprises setting a serial disable bit to a logic high.

5. The method as recited in claim 1 , wherein the first shift register comprises a serial/parallel shift register and the third shift register comprises a serial/parallel shift register.

6. The method as recited in claim 1 , wherein the first mode of the first shift register comprises a parallel mode and the second mode of the first shift register comprises a serial mode.

7. The method as recited in claim 1 , wherein the first mode of the third shift register comprises a parallel mode and the second mode of the third shift register comprises a serial mode.

8. The method as recited in claim 1 , wherein loading a plurality of bits on the first shift register further comprises receiving a clock signal and loading the plurality of bits in response to the received clock signal.

9. The method as recited in claim 8 , wherein the clock signal is a high frequency clock signal.

10. The method as recited in claim 1 , wherein loading a plurality of bits on the third shift register further comprises receiving a clock signal and loading the plurality of bits in response to the received clock signal.

11. The method as recited in claim 1 , wherein:

selecting a first mode of a first shift register is performed by a first serial/parallel shift register;

loading a plurality of bits on the first shift register at a first frequency is performed by the first serial/parallel shift register;

selecting a second mode of the first shift register is performed by the first serial/parallel shift register;

selecting a first mode of a second shift register is performed by a first shift register;

loading the plurality of bits on the second shift register is performed by the first shift register;

selecting a second mode of the second shift register is performed by the first shift register;

selecting a first mode of a third shift register is performed by a second serial/parallel shift register;

loading the plurality of bits on the third shift register is performed by the second serial/parallel shift register;

selecting a second mode of the third shift register is performed by the second serial/parallel shift register; and

loading the plurality of bits from the third shift register at a second frequency, where the second frequency is lower than the first frequency, is performed by the second serial/parallel shift register.

12. A system, comprising:

a first shift register configured to receive a high frequency clock signal, a first mode select signal, and a plurality of bits;

the first shift register further configured to load the plurality of bits in a parallel mode or to operate in a serial mode, in response to the first mode select signal;

a second shift register coupled to the first shift register and configured to receive the high frequency clock signal and a serial disable signal, and to receive the plurality of bits from the first shift register, in response to the serial disable signal;

a third shift register coupled to the second shift register and configured to receive a low frequency clock signal and a second mode select signal, and to receive the plurality of bits from the second shift register; and

the third shift register further configured to load the plurality of bits in a parallel mode, in response to the second mode select signal, and to operate in a serial mode, in response to the second mode select signal.

13. The system as recited in claim 12 , wherein the first shift register is a serial/parallel shift register and the third shift register is a serial/parallel shift register.

14. The system as recited in claim 12 , wherein the high frequency clock is configured at a frequency of at least one gigaHertz.

15. The system as recited in claim 12 , wherein the high frequency clock is configured at a frequency of at least five gigaHertz.

16. The system as recited in claim 12 , further comprising a test circuit coupled to the third shift register and configured to receive the plurality of bits from the third shift register in a serial mode.

17. The system as recited in claim 12 , wherein the first shift register further comprises a parallel/serial select pin configured to receive the first mode select signal.

18. The system as recited in claim 12 , wherein the third shift register further comprises a parallel/serial select pin configured to receive the second mode select signal.

19. The system as recited in claim 12 , wherein the second shift register further comprises a serial disable pin configured to receive the serial disable signal.

20. A processor for examining high-frequency clock-masking signal patterns at a reduced frequency, the processor including a computer program, comprising:

computer program code for selecting a first mode of a first shift register;

computer program code for loading a plurality of bits on the first shift register at a first frequency;

computer program code for selecting a second mode of the first shift register;

computer program code for selecting a first mode of a second shift register;

computer program code for loading the plurality of bits on the second shift register

computer program code for selecting a second mode of the second shift register;

computer program code for selecting a first mode of a third shift register;

computer program code for loading the plurality of bits on the third shift register;

computer program code for selecting a second mode of the third shift register; and

computer program code for loading the plurality of bits from the third shift register at a second frequency, where the second frequency is lower than the first frequency, thereby providing for examining high-frequency clock-masking signal patterns at a reduced frequency.

Assignments (3)
CHANGE OF NAME Recorded Oct 5, 2017
From: GOOGLE INC.
To: GOOGLE LLC
Reel/Frame 044127/0735 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2011
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GOOGLE INC.
Reel/Frame 026664/0866 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2005
From: BOERSTIER, DAVID; ILAILU, ESKINDER; QI, JIEMING
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 016544/0378 →