Sub-micron high input voltage tolerant input output (I/O) circuit
View Patent ↗A method of providing bias voltages for input output connections on low voltage integrated circuits. As integrated circuit voltages drop generally so does the external voltages that those circuits can handle. By placing input and output devices, in series, external voltages can be divided between the devices thereby reducing junction voltages seen by internal devices. By using external voltages as part of a biasing scheme for integrated circuit devices, stress created by the differential between external voltages and internal voltages can be minimized. Additionally device wells can be biased so that they are at a potential that is dependant on the external voltages seen by the low voltage integrated circuit.
1. An apparatus for generating a first bias voltage, the apparatus comprising:
a first input for accepting a pad voltage;
an second input for accepting a second bias voltage, the second input having a corresponding output, the second bias voltage having a first voltage level when the corresponding output is enabled and having a second voltage level when the corresponding output is disabled; and
a circuit for providing the first voltage level of the second bias voltage as the first bias voltage when the pad voltage is less than the second voltage level of the second bias voltage and for providing the pad voltage as the first bias voltage otherwise,
wherein the second voltage level of the second bias voltage is greater than the first voltage level of the second bias voltage.
2. The apparatus of claim 1 , wherein the second voltage level is about 3.3 Volts and the first voltage level is about 1.2 Volts.
3. The apparatus of claim 1 , wherein the second input and the corresponding output are provided via an N-channel Metal Oxide Semiconductor (NMOS) and the first input is provided via a P-channel Metal Oxide Semiconductor (PMOS).
4. The apparatus of claim 3 , wherein the first bias voltage is generated between the NMOS and the PMOS.
5. The apparatus of claim 3 , wherein the second voltage level minus an offset voltage level is at a gate of the PMOS.
6. The apparatus of claim 5 , wherein the offset voltage level is equal to a threshold voltage of a transistor.
7. The apparatus of claim 3 , wherein the second voltage level is at a gate of the NMOS.