IP Library Granted Patent US 7,581,410
Granted Patent B2
US 7,581,410 · App. 11/183,974 · Granted Sep 1, 2009

Low temperature testing device for electronic components

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Quick Facts
Patent No.
US 7,581,410
App. No.
11/183,974
Granted
Sep 1, 2009
Kind
B2
Abstract

In a cold test device for electronic components, there are a cryogenic fluid supply line ( 5 ) for supply of a liquid cryogenic fluid, an evaporator ( 9 ), a cryogenic fluid line ( 11 ) for transporting the gaseous cryogenic fluid to the electronic component ( 3 ), in the cryogenic fluid line ( 11 ) which transports the gaseous cryogenic fluid there being a volumetric flow regulator ( 13, 13′, 13 ″) which stabilizes the pressure and the volumetric flow of cryogenic fluid.

Claims (14)

1. Cold test device for electronic components, with a cryogenic fluid supply line for supply of a liquid cryogenic fluid, an evaporator for converting the liquid cryogenic fluid into a gaseous cryogenic fluid, a cryogenic fluid line for transporting the gaseous cryogenic fluid to the electronic component in order to cool the electronic component with the gaseous cryogenic fluid, and with a heating means for adjusting the temperature of the gaseous cryogenic fluid, characterized in that in the cryogenic fluid line which transports the gaseous cryogenic fluid there is a volumetric flow regulator which stabilizes the pressure and the volumetric flow of the cryogenic fluid,

wherein the volumetric flow regulator is arranged between the evaporator and the heating means.

2. Cold test device as claimed in claim 1 , wherein the volumetric flow regulator has a housing with a cryogenic fluid inlet, a cryogenic fluid outlet and a spool chamber which is located between the cryogenic fluid inlet and cryogenic fluid outlet and in which a throttle slide valve can be moved by means of the inflowing gaseous cryogenic fluid against a pretensioning force of a spring, by which the volumetric flow flowing through the volumetric flow regulator can be varied.

3. Cold test device as claimed in claim 2 , wherein the throttle slide valve comprises a slide valve sleeve which is movably located on the guide pipe which projects in the spool chamber with a radial distance to the wall of the spool chamber and which is securely connected to the housing.

4. Cold test device as claimed in claim 3 , wherein the interior of the guide pipe is fluid-connected to the cryogenic fluid outlet, in the wall of the guide pipe there being at least one through opening which is overlapped to a greater or smaller distance by the throttle slide valve depending on its position.

5. Cold test device as claimed in claim 3 , wherein the spring is located within the guide pipe and is supported with its front end on the inside of the end wall of the throttle slide valve.

6. Cold test device as claimed in claim 2 , wherein the spool chamber has a first chamber section with a larger chamber diameter which is fluid-connected to the cryogenic fluid outlet, and a second chamber section with a smaller chamber diameter which is fluid-connected to the cryogenic fluid outlet, and wherein the throttle slide valve comprises a slide valve sleeve which determines, by its relative position to the second chamber section, the volumetric flow of the cryogenic fluid from the first into the second chamber section.

7. Cold test device as claimed in claim 6 , wherein the throttle slide valve is inserted with the capacity to move into the second chamber section with narrow play and has a front valve section with a continuously peripheral outside diameter and another valve section with at least one lengthwise groove which is provided on its outside surface and which is fluid-connected to the cryogenic fluid outlet.

8. Cold test device as claimed in claim 7 , wherein the lengthwise groove deepens and/or widens to the rear so that the open groove cross section is determined by how far the throttle slide valve projects into the first chamber section.

9. Cold test device as claimed in claim 7 , wherein the throttle slide valve is open to the rear, wherein the spring is supported on the back end on the housing and projects forward into the throttle slide valve, and wherein the lengthwise groove is fluid-connected to the interior of the throttle slide valve via a passage opening in the wall of the throttle slide valve.

10. Cold test device as claimed in claim 6 , wherein the throttle slide valve between the first chamber section and the second chamber section has a conically running transition area, and wherein the throttle slide valve at least on its back end has an outside diameter which is only slightly smaller, the same size, or larger than the inside diameter of the second chamber section, and wherein the length of the throttle slide valve is shorter than the length of the first chamber section, so that the throttle slide valve can be moved between a front position, in which its back end is away from the second chamber section, and a rear position in which its back end is adjacent to the second chamber section.

11. Cold test device as claimed in claim 10 , wherein the throttle slide valve is movably guided on a guide rod which is anchored in the front part of the housing, extends through the throttle slide valve to the rear and on the back end has a stop for the spring which surrounds the guide rod.

12. Cold test device for electronic components, with a cryogenic fluid line for supply of a liquid cryogenic fluid, an evaporator for converting the liquid cryogenic fluid into a gaseous cryogenic fluid, the liquid cryogenic fluid having an associated temperature, pressure and volumetric flow, a cryogenic fluid line for transporting the gaseous cryogenic fluid to the electronic component in order to cool the electronic component with the gaseous cryogenic fluid, and with a heating means for adjusting the temperature of the gaseous cryogenic fluid, characterized in that in the cryogenic fluid line which transports the gaseous cryogenic fluid there is a volumetric flow regulator which stabilizes the pressure and the volumetric flow of the cryogenic fluid,

further including a volumetric flow regulator disposed in the cryogenic fluid line between the heating means and an end of said cryogenic fluid line.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 7261561 AND REPLACE WITH PATENT NUMBER 7231561 PREVIOUSLY RECORDED ON REEL 034660 FRAME 0188. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Feb 11, 2016
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 037824/0372 →
SECURITY AGREEMENT Recorded Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
RELEASE OF SECURITY INTEREST IN UNITED STATES PATENTS Recorded Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
CHANGE OF NAME Recorded May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
SECURITY AGREEMENT Recorded Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 19, 2005
From: BRUNNER, FRANZ
To: MULTITEST ELEKTRONISCHE SYSTEME GMBH
Reel/Frame 016780/0090 →