IP Library › Assignment 037824/0372
Patent Assignment
Reel/Frame 037824/0372

Corrective Assignment to Correct the Incorrect Patent Number 7261561 and Replace with Patent Number 7231561 Previously Recorded on Reel 034660 Frame 0188. Assignor(S) Hereby Confirms the Security Agreement.

Recorded: 2016-02-11 Pages: 131
Assignors
XCERRA CORPORATION
Executed: 2014-12-15
EVERETT CHARLES TECHNOLOGIES LLC
Executed: 2014-12-15
Assignee
SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
3003 TASMAN DRIVE, SANTA CLARA, CALIFORNIA, 95054
Covered Properties (256)
Electrical Contact Probe with Compliant Internal Interconnect
Semiconductor Electromechanical Contact
Spring Contact Assemby
Flat Plunger Round Barrel Test Probe
Scrub Inducing Compliant Electrical Contact
Wiring Board for Testing Loaded Printed Circuit Board
Loaded Printed Circuit Board Test Fixture and Method for Manufacturing the Same
Test Probe Assembly and Related Methods
A Sine Wave Generator Using a Cordic Alogorithm
Patent: 4,910,698 →
Application: 07/284,775 →
Phased Locked Loop to Provide Precise Frequency and Phase Tracking of Two Signals
Patent: 4,902,986 →
Application: 07/303,927 →
Film Resistor with Enhanced Trimming Characteristics
Patent: 5,015,989 →
Application: 07/387,085 →
Apparatus for Connecting an Ic Device to a Test System
Patent: 4,996,478 →
Application: 07/461,160 →
Dual-Sided Test Head Having Floating Contact Surfaces
Patent: 5,091,693 →
Application: 07/553,202 →
Event Sequencer for Automatic Test Equipment
Patent: 5,212,443 →
Application: 07/577,986 →
Automatic Test Equipment System Using Pin Slice Architecture
Patent: 5,225,772 →
Application: 07/577,987 →
Dut Board for a Semiconductor Device Tester Having a Reconfigurable Coaxial Interconnect Grid and Method of Using Same
Patent: 5,068,602 →
Application: 07/579,423 →
Output Driver Circuit and Method Minimize Impedance Fluctuations During Crossover
Patent: 5,075,569 →
Application: 07/607,223 →
Apparatus for Setting Pin Driver/Sensor Reference Voltage Level
Patent: 5,235,273 →
Application: 07/729,510 →
Data Stream Smoothing Using a Fifo Memory
Patent: 5,122,988 →
Application: 07/732,351 →
Test System Apparatus with Schottky Diodes with Programmable Voltages
Patent: 5,200,696 →
Application: 07/756,325 →
Phase Shift Vernier for Automatic Test Systems
Patent: 5,191,295 →
Application: 07/849,521 →
Timing Generation in an Automatic Electrical Test System
Patent: 5,311,486 →
Application: 07/943,881 →
Retriggered Oscillator for Jitter-Free Phase Locked Loop Frequency Synthesis
Patent: 5,345,186 →
Application: 08/005,651 →
Method and Circuit for Controlling Voltage Reflections on Transmission Lines
Patent: 5,287,022 →
Application: 08/037,507 →
Floating Element to Assist the Teaching of Swimming
Patent: 5,393,230 →
Application: 08/062,178 →
Event Sequencer for Automatic Test Equipment
Patent: 5,477,139 →
Application: 08/062,362 →
Driver Circuits for Ic Tester
Patent: 5,430,400 →
Application: 08/100,975 →
Compliant Electrical Connectors
Patent: 5,447,442 →
Application: 08/126,179 →
Apparatus for Maintaining Stimulation to a Device Under Test After a Test Stops
Patent: 5,481,550 →
Application: 08/134,330 →
Test Fixture with Adjustable Bearings and Optical Alignment System
Patent: 5,422,575 →
Application: 08/224,006 →
Automatic Test Equipment System Using Pin Slice Architecture
Patent: 5,461,310 →
Application: 08/267,840 →
Vacuum Test Fixture for Printed Circuit Boards
Patent: 5,557,211 →
Application: 08/462,229 →
High Speed Iddo Monitor Circuit
Patent: 5,552,744 →
Application: 08/472,070 →
Accurate Alignment of Clocks in Mixed-Signal Tester
Patent: 5,654,657 →
Application: 08/510,395 →
Accurate Alignment of Clocks in Mixed-Signal Tester
Patent: 5,710,517 →
Application: 08/510,396 →
Analog Channel for Mixed-Signal-Vlsi Tester
Patent: 5,646,521 →
Application: 08/510,397 →
Quick Stacking Translator Fixture
Patent: 5,729,146 →
Application: 08/531,720 →
Solid Spring Electrical Contacts for Electrical Connectors and Probes
Patent: 5,865,641 →
Application: 08/536,131 →
Compensated Delay Locked Loop Timing Vernier
Patent: 5,684,421 →
Application: 08/542,518 →
Telescoping Spring Probe
Patent: 5,641,315 →
Application: 08/558,687 →
One-Piece Compliant Probe
Patent: 5,667,410 →
Application: 08/561,395 →
Loading Hardware Pattern Memory in Automatic Test Equipment for Testing Circuits
Patent: 5,913,022 →
Application: 08/573,071 →
Translator Fixture with Force Applying Blind Pins
Patent: 5,898,314 →
Application: 08/606,593 →
Differential Time Interpolator
Patent: 5,694,377 →
Application: 08/633,071 →
Improved Test System Including a Local Trigger Signal Generator for Each of a Plurality of Test Instruments
Patent: 5,717,704 →
Application: 08/633,172 →
Apparatus for Performing Logic and Leakage Current Tests on a Digital Logic Circuit
Patent: 5,696,773 →
Application: 08/639,165 →
Yetention of Test Probes in Translator Fixtures
Patent: 5,883,520 →
Application: 08/662,671 →
Coherent Sampling Digitizer System
Patent: 5,708,432 →
Application: 08/684,466 →
Loaded Board Test Fixture with Integral Translator Fixture for Testing Closely Spaced Test Sites
Patent: 5,818,248 →
Application: 08/688,189 →
Driver Circuits for Ic Tester
Patent: 5,745,003 →
Application: 08/710,032 →
High Speed Iddq Monitor Circuit
Patent: 5,694,063 →
Application: 08/721,973 →
Generating Pulses in Analog Channel of Ate Tester
Patent: 5,918,198 →
Application: 08/734,994 →
Spring Probe and Method for Biasing
Patent: 5,801,544 →
Application: 08/783,467 →
Timing Delay Generator and Method Including Compensation for Environmental Variation
Patent: 6,092,030 →
Application: 08/831,853 →
Integrated Circuit Tester with Cached Vector Memories
Patent: 5,925,145 →
Application: 08/847,814 →
Virtual Channel Data Distribution System for Integrated Circuit Tester
Patent: 5,805,610 →
Application: 08/848,547 →
Integrated Circuit Tester Including at Least One Quasi-Autonomous Test Instrument
Patent: 5,930,735 →
Application: 08/850,750 →
Providing Test Vectors with Pattern Chaining Definition
Patent: 6,014,764 →
Application: 08/858,992 →
Integrated Circuit Tester with Test Head Including Regulating Capacitor
Patent: 6,087,843 →
Application: 08/892,353 →
Load Counterbalancing System with a Constant Load Displacement Force
Patent: 5,964,445 →
Application: 08/893,970 →
Method and Apparatus for Compensating for Thermal Drift in a Logic Circuit
Patent: 6,034,558 →
Application: 08/895,722 →
Integrated Circuit Tester Having Multiple Period Generators
Patent: 5,917,834 →
Application: 08/918,677 →
Programmable Formatter Circuit for Integrated Circuit Tester
Patent: 5,919,270 →
Application: 08/920,398 →
Load Circuit for Integrated Circuit Tester
Patent: 5,952,821 →
Application: 08/924,035 →
Method and Apparatus for Selectively Testing Indentical Pins of a Plurality of Electronic Components
Patent: 5,944,846 →
Application: 08/930,490 →
Multiple Output Programmable Reference Voltage Source
Patent: 5,905,403 →
Application: 08/939,572 →
Format Sensitive Timing Calibration for an Integrated Circuit Tester
Patent: 6,060,898 →
Application: 08/941,452 →
Capturing and Displaying Computer Program Execution Timing
Patent: 6,332,212 →
Application: 08/944,935 →
Parallel Processing Pattern Generation System for an Integrated Circuit Tester
Patent: 6,073,263 →
Application: 08/960,014 →
Circuit Arrangement for Measuring Leakage Current Utilizing a Differential Integrating Capacitor
Patent: 6,011,403 →
Application: 08/961,645 →
Backmatch Resistor Structure for an Integrated Circuit Tester
Patent: 5,955,890 →
Application: 08/962,050 →
Switchable Load for Testing a Semiconductor Integrated Circuit Device
Patent: 6,008,683 →
Application: 08/962,051 →
Integrated Circuit Tester Having Pattern Generator Controlled Data Bus
Patent: 5,951,705 →
Application: 08/962,419 →
Tester Having Event Generation Circuit for Acquiring Waveform by Supplying Strobe Events for Waveform Acquisition Rather Than Using Strobe Events Specified by the Test Program
Patent: 6,128,754 →
Application: 08/977,649 →
Event Phase Modulator for Integrated Circuit Tester
Patent: 5,948,115 →
Application: 09/016,532 →
Self-Calibrating Programmable Phase Shifter
Patent: 5,994,938 →
Application: 09/016,757 →
Inhibitable Continuously-Terminated Differential Drive Circuit for an Integrated Circuit Tester
Patent: 5,942,922 →
Application: 09/056,543 →
Method for Generating a Shmoo Plot Contour for Integrated Circuit Tester
Patent: 6,079,038 →
Application: 09/065,754 →
Integrated Circuit Tester Having Amorphous Logic for Real-Time Data Analysis
Patent: 6,057,679 →
Application: 09/096,812 →
Differential Driver Circuit for Use in Automatic Test Equipment
Patent: 6,052,810 →
Application: 09/111,416 →
Mixed Signal Device Under Test Board Interface
Patent: 6,625,557 →
Application: 09/113,449 →
Triggered Clock Signal Generator
Patent: 6,084,930 →
Application: 09/154,329 →
System for Measuring Noise Figure of a Radio Frequency Device
Patent: 6,114,858 →
Application: 09/181,940 →
Single Platform Electronic Tester
Patent: 6,449,741 →
Application: 09/183,038 →
Instruction Processing Pattern Generator Controlling an Integrated Circuit Tester
Patent: 6,154,865 →
Application: 09/191,777 →
Test Fixture for Testing Backplanes or Populated Circuit Boards
Patent: 6,194,908 →
Application: 09/207,740 →
Loading Mechanism for Automated Verification and Repair Station
Patent: 6,366,107 →
Application: 09/207,741 →
Publication: US 2001/0011901
Programmable Load Circuit for Use in Automatic Test Equipment
Patent: 6,211,723 →
Application: 09/235,056 →
System for Testing Real and Simulated Versions of an Integrated Circuit
Patent: 6,295,623 →
Application: 09/240,181 →
Self-Closing Spring Probe
Patent: 6,396,293 →
Application: 09/253,320 →
Device for Controlling Conformity of Consumption of an Electronic Component in a Testing Machine
Patent: 6,263,464 →
Application: 09/284,939 →
Inhibitable Continuously-Terminated Differential Drive Circuit for an Integrated Circuit Tester
Patent: 6,057,716 →
Application: 09/295,632 →
Method of and System for Generating a Binary Shmoo Plot in N-Dimensional Space
Patent: 6,418,387 →
Application: 09/344,861 →
Docking Mechanism for Semiconductor Tester
Patent: 6,407,541 →
Application: 09/364,685 →
Power Supply Circuit of an Electronic Component in a Test Machine
Patent: 6,181,117 →
Application: 09/367,376 →
Method of Characterizing a Device Under Test
Patent: 6,230,106 →
Application: 09/419,012 →
Measuring Jitter of High-Speed Data Channels
Patent: 6,661,836 →
Application: 09/419,317 →
Arbitrary Waveform Generator Having Programmably Configurable Architecture
Patent: 6,356,224 →
Application: 09/425,276 →
Spaced Adapter Plate for Semiconductor Tester
Patent: 6,331,781 →
Application: 09/428,684 →
Publication: US 2001/0030547
Apparatus for testing memories with redundant storage elements
Patent: 6,256,757 →
Application: 09/491,478 →
Self-aligning docking assembly for semiconductor tester
Patent: 6,304,092 →
Application: 09/493,520 →
Calibration Method and Apparatus for Correcting Pulse Width Timing Errors in Integrated Circuit Testing
Patent: 6,496,953 →
Application: 09/526,407 →
Floating Interface for Integrated Circuit Test Head
Patent: 6,377,062 →
Application: 09/539,361 →
Predictive Temperature Control System for an Integrated Circuit
Patent: 6,484,117 →
Application: 09/548,884 →
Self-Retained Spring Probe
Patent: 6,462,567 →
Application: 09/614,422 →
System for linearizing a programmable delay circuit
Patent: 6,330,197 →
Application: 09/628,702 →
Separating Device Response Signals from Composite Signals
Patent: 6,563,298 →
Application: 09/639,517 →
Edge Placement and Jitter Measurement for Electronic Elements
Patent: 6,622,107 →
Application: 09/648,716 →
Printed Circuit Board Tester
Patent: 6,445,173 →
Application: 09/656,088 →
Compact, High Collection Efficiency Scintillator for Secondary Electron Detection
Patent: 6,630,667 →
Application: 09/675,981 →
Scan Stream Sequencing for Testing Integrated Circuits
Patent: 6,748,564 →
Application: 09/696,102 →
S-Parameter Measurement System for Wideband Non-Linear Networks
Patent: 6,594,604 →
Application: 09/783,912 →
Publication: US 2001/0004729
High Resolution Clock Signal Generator
Patent: 7,805,628 →
Application: 09/824,898 →
Publication: US 2002/0178391
Data Recovery Through Event Based Equivalent Time Sampling
Patent: 6,590,509 →
Application: 09/841,888 →
Publication: US 2002/0177969
Integrated Micromachine Relay for Automated Test Equipment Applications
Patent: 6,700,396 →
Application: 09/859,842 →
System for and Method of Performing Device-Oriented Tests
Patent: 6,768,960 →
Application: 09/863,178 →
Publication: US 2002/0177968
Single Platform Electronic Tester
Patent: 6,675,339 →
Application: 09/935,453 →
Apparatus for Scan Testing Printed Circuit Boards
Patent: 6,788,078 →
Application: 09/991,199 →
Publication: US 2003/0094961
Comparator Circuit for Differential Swing Comparison and Common-Mode Voltage Comparison
Patent: 6,822,435 →
Application: 10/057,134 →
Publication: US 2003/0137289
Methods and Apparatuses for Digitally Tuning a Phased-Lock Loop Circuit
Patent: 6,728,651 →
Application: 10/097,904 →
Test System Formatters Configurable for Multiple Data Rates
Patent: 7,017,091 →
Application: 10/101,564 →
Publication: US 2003/0033556
Timing Signal Generator Employing Direct Digital Frequency Synthesis
Patent: 6,563,350 →
Application: 10/102,111 →
Apparatus and Method for Circuit Board Liquid Cooling
Patent: 6,942,019 →
Application: 10/105,204 →
Publication: US 2003/0178182
Method and Apparatus for Socket Calibration of Integrated Circuit Testers
Patent: 6,794,861 →
Application: 10/106,280 →
Publication: US 2002/0135357
Apparatus and Method for Data Pattern Alignment
Patent: 7,231,561 →
Application: 10/196,990 →
Publication: US 2004/0015749
Apparatus and Method for Data Shifting
Patent: 7,035,887 →
Application: 10/197,119 →
Publication: US 2004/0015526
Pin Electronics Interface Circuit
Patent: 6,940,271 →
Application: 10/216,084 →
Publication: US 2003/0057990
Method and Apparatus for Use of High Sampling Frequency a/D Converters for Low Frequency Sampling
Patent: 7,254,203 →
Application: 10/267,927 →
Publication: US 2004/0066868
Apparatus and Method for Embedded Fluid Cooling in Printed Circuit Boards
Patent: 6,665,185 →
Application: 10/267,964 →
Separating Device Response Signals from Composite Signals
Patent: 6,703,825 →
Application: 10/356,172 →
Programmable Multi-Function Module for Automatic Test Equipment Systems
Patent: 7,343,538 →
Application: 10/366,839 →
Publication: US 2004/0177293
Guiding Apparatus for Docking a Testing Head for Electronic Components
Patent: 6,836,109 →
Application: 10/413,647 →
Publication: US 2003/0217477
Tester System Having a Multi-Purpose Memory
Patent: 7,171,598 →
Application: 10/435,494 →
Publication: US 2004/0039977
Tester System Having Multiple Instruction Memories
Patent: 7,039,841 →
Application: 10/435,613 →
Publication: US 2004/0059437
Method for Producing a Captive Wired Test Fixture and Fixture Therefor
Patent: 7,059,046 →
Application: 10/454,930 →
Publication: US 2003/0234640
Power Supply Device for a Component Testing Installation
Patent: 6,979,994 →
Application: 10/466,366 →
Publication: US 2004/0085058
Self-Calibrating Strobe Signal Generator
Patent: 7,219,269 →
Application: 10/628,995 →
Publication: US 2005/0025190
Programmable Jitter Generator
Patent: 7,171,601 →
Application: 10/646,957 →
Publication: US 2005/0044463
Single Platform Electronic Tester
Patent: 7,092,837 →
Application: 10/663,469 →
System and Method for Test Socket Calibration
Patent: 7,009,382 →
Application: 10/729,800 →
System and Method for Packaging a Semiconductor Device
Patent: 7,098,529 →
Application: 10/753,945 →
Method and System for Improved Ate Timing Calibration at a Device Under Test
Patent: 7,120,840 →
Application: 10/773,698 →
Controlled-Impedance Coaxial Cable Interconnect System
Patent: 6,951,482 →
Application: 10/802,993 →
Publication: US 2005/0208828
Diagnostic Process for Automated Test Equipment
Patent: 7,222,280 →
Application: 10/825,409 →
Calibration-Associated Systems and Methods
Patent: 7,242,257 →
Application: 10/840,850 →
Test Systems and Methods for Integrated Circuit Devices
Patent: 7,765,443 →
Application: 10/840,851 →
Systems and Methods Associated with Test Equipment
Patent: 7,266,739 →
Application: 10/840,898 →
Publication: US 2005/0022080
Test Systems and Methods with Compensation Techniques
Patent: 7,203,875 →
Application: 10/841,019 →
Publication: US 2005/0022081
Arrangement for Providing Electrical Connections to Pin Electronics Cards in Test Head
Patent: 6,998,863 →
Application: 10/877,478 →
Test Head for Integrated Circuit Tester
Patent: 7,019,546 →
Application: 10/877,480 →
Test Instrument with Multiple Analog Modules
Patent: 6,870,384 →
Application: 10/884,836 →
Apparatus for Scan Testing Printed Circuit Boards
Patent: 7,071,716 →
Application: 10/897,182 →
Publication: US 2005/0001640
Non-Deterministic Protocol Packet Testing
Patent: 7,212,941 →
Application: 10/924,675 →
Publication: US 2006/0047461
Pin Electronics Interface Circuit
Patent: 6,937,006 →
Application: 10/931,311 →
Publication: US 2005/0024041
Synchronization of Multiple Test Instruments
Patent: 7,099,792 →
Application: 10/956,549 →
Publication: US 2006/0074584
Apparatus and Method for the Testing of Circuit Boards, and Test Probe for This Apparatus and This Method
Patent: 7,015,711 →
Application: 10/981,079 →
Publication: US 2005/0083038
Apparatus for Jitter Testing an Ic
Patent: 7,627,790 →
Application: 10/992,955 →
Publication: US 2005/0097420
Synchronization of Multiple Test Instruments
Patent: 7,177,777 →
Application: 11/000,791 →
Publication: US 2006/0085157
Method of Determining Coherent Test Conditions
Patent: 7,353,126 →
Application: 11/018,649 →
Multi-Domain Execution of Tests on Electronic Devices
Patent: 7,246,026 →
Application: 11/022,148 →
Publication: US 2006/0136164
Distributed, Load Sharing Power Supply System for Ic Tester
Patent: 7,053,648 →
Application: 11/024,528 →
Publication: US 2005/0174137
Serializer Clock Synthesizer
Patent: 7,471,753 →
Application: 11/049,124 →
Publication: US 2006/0171450
Bit Synchronization for High-Speed Serial Device Testing
Patent: 7,296,195 →
Application: 11/120,368 →
Publication: US 2006/0245291
Test Probe for Finger Tester and Corresponding Finger Tester
Patent: 7,190,182 →
Application: 11/121,802 →
Publication: US 2005/0206398
Low Temperature Testing Device for Electronic Components
Patent: 7,581,410 →
Application: 11/183,974 →
Publication: US 2006/0037412
System and Method for Test Socket Calibration Using Composite Waveform
Patent: 7,439,728 →
Application: 11/185,569 →
Scan Stream Sequencing for Testing Integrated Circuits
Patent: 7,454,678 →
Application: 11/210,553 →
Publication: US 2006/0005096
Integrated Circuit Tester
Patent: 7,034,520 →
Application: 11/223,421 →
Method for Testing Non-Componented Circuit Boards
Patent: 7,250,782 →
Application: 11/225,334 →
Publication: US 2006/0006891
Integrated Circuit Tester with Software-Scaleable Channels
Patent: 7,243,278 →
Application: 11/227,637 →
Publication: US 2007/0061640
Phase Locked Loop Circuit
Patent: 7,271,664 →
Application: 11/253,891 →
Publication: US 2007/0085610
Semiconductor Integrated Circuit Tester with Interchangeable Tester Module
Patent: 7,307,440 →
Application: 11/258,529 →
Publication: US 2007/0090850
Position-Correction Device for Correcting the Position of a Component Holder for Electronic Components
Patent: 7,841,071 →
Application: 11/288,078 →
Publication: US 2006/0155396
A Captive Wired Test Fixture
Patent: 7,424,775 →
Application: 11/373,595 →
Publication: US 2006/0151444
Automatic Test Equipment Operating Architecture
Patent: 7,302,358 →
Application: 11/383,972 →
Publication: US 2006/0212254
Automatic Test Equipment Operating Architecture
Patent: 7,496,467 →
Application: 11/422,114 →
Publication: US 2006/0218456
D-Optimized Switching Converter
Patent: 7,430,130 →
Application: 11/437,777 →
Publication: US 2007/0268006
Electrical Contact Probe with Compliant Internal Interconnect
Patent: 7,256,593 →
Application: 11/450,231 →
Publication: US 2006/0279301
Test Probe for Finger Tester and Corresponding Finger Tester
Patent: 7,355,424 →
Application: 11/466,663 →
Publication: US 2007/0001693
High Speed, Out-of-Band Differential Pin Driver
Patent: 7,372,302 →
Application: 11/477,971 →
Multi-Domain Execution of Tests on Electronic Devices
Patent: 8,649,993 →
Application: 11/520,202 →
Testing a Transceiver
Patent: 7,849,374 →
Application: 11/546,806 →
Test and Diagnosis of Semiconductors
Patent: 7,761,751 →
Application: 11/708,824 →
System and Method for Distortion Analysis
Patent: 7,919,968 →
Application: 11/774,774 →
Publication: US 2009/0015267
Loadboard Enhancements for Automated Test Equipment
Patent: 7,615,990 →
Application: 11/824,333 →
Guide Path for Electronic Components
Patent: 7,677,383 →
Application: 11/883,874 →
Publication: US 2008/0156706
Method and System for Correcting Timing Errors in High Data Rate Automated Test Equipment
Patent: 7,810,005 →
Application: 11/982,075 →
Handler Comprising an Acceleration Device for Testing Electronic Components
Patent: 7,683,608 →
Application: 11/990,748 →
Publication: US 2009/0241676
Test Apparatus for the Testing of Electronic Components
Patent: 7,741,861 →
Application: 12/090,419 →
Publication: US 2008/0231296
Method and Device for Testing of Non-Componented Circuit Boards
Patent: 7,821,278 →
Application: 12/097,819 →
Publication: US 2008/0272792
Finger Tester for Testing Unpopulated Printed Circuit Boards and Method for Testing Unpopulated Printed Circuit Boards Using a Finger Tester
Patent: 7,859,281 →
Application: 12/097,824 →
Publication: US 2008/0272793
System and Method for Distortion Analysis
Patent: 7,957,924 →
Application: 12/118,217 →
Publication: US 2009/0043522
System and Method for Mapping System Transfer Functions
Patent: 7,664,621 →
Application: 12/118,248 →
Publication: US 2009/0039920
Routed Event Test System and Method
Patent: 8,295,182 →
Application: 12/167,052 →
Publication: US 2009/0076761
Device for Testing Electronic Components, in Particular Ics, Having a Sealing Board Arranged Inside a Pressure Test Chamber
Patent: 7,633,304 →
Application: 12/169,899 →
Publication: US 2009/0015277
System, Method, and Apparatus for Distortion Analysis
Patent: 8,239,434 →
Application: 12/170,334 →
Publication: US 2009/0063071
Method and Apparatus for Identifying and Reducing Spurious Frequency Components
Patent: 8,269,480 →
Application: 12/170,401 →
Publication: US 2009/0033375
Automated Test System and Method
Application: 12/200,801 →
Publication: US 2010/0023294
Semiconductor Electromechanical Contact
Patent: 7,695,286 →
Application: 12/204,741 →
Publication: US 2009/0075497
Spring Contact Assembly
Patent: 7,862,391 →
Application: 12/206,659 →
Publication: US 2009/0075529
Test Probe for Finger Tester and Corresponding Finger Tester
Patent: 43,739 →
Application: 12/248,166 →
Guide path for electronic components
Patent: 7,946,405 →
Application: 12/294,302 →
Publication: US 2009/0133984
System and Method for Thermal Limit Control
Patent: 7,969,177 →
Application: 12/341,162 →
Publication: US 2010/0156492
Handler for Electronic Components, in Particular Ic's, Comprising Circulating Units, the Temperature of Which Can Be Controlled
Patent: 8,138,779 →
Application: 12/525,894 →
Publication: US 2010/0315113
Handler for Electronic Components, in Particular Ic's, Comprising a Pneumatic Cylinder Displacement Unit for Moving Plungers
Patent: 8,684,168 →
Application: 12/526,728 →
Publication: US 2010/0150686
Plunger for Holding and Moving Electronic Components in Particular Ics
Patent: 8,232,815 →
Application: 12/599,371 →
Publication: US 2010/0303589
Scrub Inducing Compliant Electrical Contact
Patent: 8,324,919 →
Application: 12/629,790 →
Publication: US 2010/0244875
Device and Method for Aligning and Holding a Plurality of Singulated Semiconductor Components in Receiving Pockets of a Terminal Carrier
Application: 12/665,531 →
Publication: US 2010/0206768
Closure Mechanism for Pressure Test Chambers for Testing Electronic Components, in Particular Ic's
Patent: 8,449,002 →
Application: 12/668,265 →
Publication: US 2010/0193520
Plunger for Holding and Moving Electrical Components
Patent: 8,303,008 →
Application: 12/671,118 →
Publication: US 2010/0196125
Full Grid Cassette for a Parallel Tester for Testing a Non-Componented Printed Circuit Board, Spring Contact Pin for Such a Full Grid Cassette and Adapter for a Parallel Tester for Testing a Non-Componented Printed Circuit Board
Patent: 8,749,259 →
Application: 12/681,295 →
Publication: US 2010/0283498
Tempering Chamber for Tempering Electronic Components in Particular Ic's
Application: 12/681,706 →
Publication: US 2010/0209864
Handler for Electronic Components, in Particular Ic's, Comprising a Plurality of Circulating Carriages That Are Guided Along a Circulating Track
Patent: 8,297,433 →
Application: 12/681,735 →
Publication: US 2010/0219044
Flat Plunger Round Barrel Test Probe
Patent: 8,105,119 →
Application: 12/683,346 →
Publication: US 2010/0197176
Contact Base
Patent: 8,282,428 →
Application: 12/742,888 →
Publication: US 2010/0311285
Plunger with a Quick Locking System
Patent: 8,476,916 →
Application: 12/743,792 →
Publication: US 2010/0254789
Method and Device for Testing and Calibrating Electronic Semiconductor Components Which Convert Sound into Electrical Signals
Patent: 8,848,931 →
Application: 12/810,716 →
Publication: US 2010/0290634
Elastic Unit for Clamping an Electronic Component and Extending Below an Electronic Component Receiving Volume of an Align Fixture
Patent: 8,964,404 →
Application: 12/858,383 →
Publication: US 2011/0043982
Fixture for Aligning an Electronic Component
Patent: 8,281,483 →
Application: 12/858,394 →
Publication: US 2011/0042264
Two Abutting Sections of an Align Fixture Together Floatingly Engaging an Electronic Component
Patent: 8,689,436 →
Application: 12/858,400 →
Publication: US 2011/0041311
Align Fixture for Alignment of an Electronic Component
Patent: 8,683,680 →
Application: 12/858,406 →
Publication: US 2011/0041312
System for Post-Processing of Electronic Components
Patent: 8,717,048 →
Application: 12/859,059 →
Publication: US 2011/0043231
Carrier for Aligning Electronic Components with Slidably Arranged Plates
Patent: 8,230,587 →
Application: 12/859,106 →
Publication: US 2011/0042265
Module for a Parallel Tester for the Testing of Circuit Boards
Patent: 7,982,481 →
Application: 12/863,739 →
Publication: US 2010/0327895
Device and Method for Aligning and Holding a Plurality of Singulated Semiconductor Components in Receiving Pockets of a Terminal Carrier
Patent: 8,678,365 →
Application: 12/887,429 →
Publication: US 2011/0006183
High Resolution Clock Signal Generator
Patent: 8,504,867 →
Application: 12/892,854 →
Publication: US 2011/0234271
Spring Contact Assembly
Patent: 8,231,416 →
Application: 12/912,683 →
Publication: US 2011/0039457
Wiring Board for Testing Loaded Printed Circuit Board
Patent: 8,907,694 →
Application: 12/959,765 →
Publication: US 2011/0148451
Loaded Printed Circuit Board Test Fixture and Method for Manufacturing the Same
Patent: 8,648,616 →
Application: 12/963,322 →
Publication: US 2011/0148448
Terminal for Flat Test Probe
Patent: 8,710,856 →
Application: 12/968,023 →
Publication: US 2011/0175636
Method and Apparatus for Identifying and Reducing Spurious Frequency Components
Patent: 8,415,941 →
Application: 13/090,560 →
Publication: US 2011/0193547
Determination of Properties of an Electrical Device
Patent: 8,704,545 →
Application: 13/124,454 →
Publication: US 2011/0199112
Method for the Testing of Circuit Boards
Application: 13/143,697 →
Publication: US 2011/0273203
Contact -Connection Unit for a Test Apparatus for Testing Printed Circuit Boards
Patent: 9,013,199 →
Application: 13/262,625 →
Publication: US 2012/0019275
Spring Contact Assembly
Patent: 8,523,579 →
Application: 13/546,980 →
Publication: US 2012/0282821
Integrated Circuit Test Socket Having Test Probe Inserts
Application: 13/618,871 →
Publication: US 2013/0069685
Connector / Cable Assembly
Patent: 9,297,830 →
Application: 13/749,155 →
Publication: US 2014/0203833
Automated Test Platform Utilizing Segmented Data Sequencers to Provide Time Controlled Test Sequences to Device Under Test
Patent: 9,459,978 →
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Publication: US 2014/0208160
Scalable Test Platform in a Pci Express Environment with Direct Memory Access
Patent: 9,430,348 →
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Publication: US 2014/0208161
Scalable Test Platform in a Pci Express Environment with Direct Memory Access
Patent: 9,430,349 →
Application: 13/749,308 →
Publication: US 2014/0208164
Scalable Test Platform
Patent: 9,336,108 →
Application: 13/749,332 →
Publication: US 2014/0207404
Automated Test Platform Utilizing Status Register Polling with Temporal Id
Patent: 9,213,616 →
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Publication: US 2014/0208082
Device and Method for Aligning and Holding a Plurality of Singulated Semiconductor Components in Receiving Pockets of a Terminal Carrier
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Publication: US 2013/0299386
Media Tagging
Patent: 9,521,175 →
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Publication: US 2014/0086458
System for Post-Processsing of Electronic Components
Patent: 9,255,965 →
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Publication: US 2014/0167798
Heat Dissipation System
Patent: 9,554,486 →
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Publication: US 2014/0238647
Cross-Bar Unit for a Test Apparatus for Circuit Boards, and Test Apparatus Containing the Former
Patent: 9,989,583 →
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Publication: US 2014/0266276
Test Probe Assembly and Related Methods
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Publication: US 2015/0070040
Distortion Measurement and Correction System and Method
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Publication: US 2015/0042402
Wiring Board for Testing Loaded Printed Circuit Board
Patent: 9,753,058 →
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Publication: US 2015/0054539
Coaxial Test Probe
Patent: 422,230 →
Application: 29/093,915 →
Semiconductor Integrated Circuit Test Head
Patent: 511,981 →
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Heat Dissipation System
Application: 61/768,009 →
Spurious Free Dynamic Range Measurement and Correction System and Method
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System and Method for Automated Testing
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Test Socket Assembly and Related Methods
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Related Assignments (13)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →
Change of Name May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
Assignment of Assignor's Interest Jun 12, 2014
From: DELAWARE CAPITAL FORMATION, INC.
To: LTX-CREDENCE CORPORATION
Reel/Frame 033091/0639 →
Assignment of Assignor's Interest Jun 20, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033206/0426 →
Assignment of Assignor's Interest Jun 20, 2014
From: DELAWARE CAPITAL FORMATION, INC.
To: LTX-CREDENCE CORPORATION
Reel/Frame 033152/0604 →
Assignment of Assignor's Interest Oct 13, 2014
From: TREIBERGS, VALTS; MAGNUSON, AARON; YAKUSHEV, SERGEY; HANSON, SCOTT
To: XCERRA CORPORATION
Reel/Frame 033939/0609 →
Security Agreement Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
Release of Security Interest in United States Patents Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
Patent Security Agreement Oct 2, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047185/0624 →
Corrective Assignment to Correct the Incorrect Statement That This Document Serves as an Oath/Declaration Previously Recorded on Reel 047185 Frame 0628. Assignor(S) Hereby Confirms the Patent Security Agreement. Nov 28, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047675/0354 →
Release of Security Interest Nov 2, 2021
From: GLAS TRUST CORPORATION LIMITED
To: H.C. STARCK INC.
Reel/Frame 058769/0242 →
Release of Security Interest Nov 2, 2021
From: GLAS TRUST CORPORATION LIMITED
To: H.C. STARCK INC.
Reel/Frame 058768/0827 →
Termination and Release of Security Interest in Patents, Recorded at Reel 047185, Frame 0624 Mar 7, 2024
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
To: XCERRA CORPORATION
Reel/Frame 066762/0811 →