Multi-domain execution of tests on electronic devices
View Patent ↗A device under test is divided into multiple test domains, and test conditions for each of the multiple test domains are defined separately, so that each test domain has its own test pattern, timing data, and other test conditions. Each test domain can start and stop independently, and run at different speeds. Further, triggers are used to specify how the tests executed in the different test domains interact and communicate with one another. Any test domain can generate or wait for a trigger from any other test domain. A test domain can wait for a trigger from a test domain in a CPU.
1. A method of testing an electronic device using multiple test instruments and multiple test domains, said method comprising:
(a) initiating a test for a first test domain at a first instrument;
(b) generating a trigger at said first instrument in response to an event associated with said first test domain; and
(c) initiating a test for a second test domain at a second instrument in response to a receipt of said trigger at said second instrument,
wherein termination of said test for said first test domain is conditioned on an event in said second test domain.
2. A method as described in claim 1 , wherein said initiating a test for said first test domain further comprises executing a test pattern to generate test signals to be supplied to said electronic device.
3. A method as described in claim 2 , wherein said event associated with said first test domain comprises a programmed event in said test pattern.
4. A method as described in claim 2 , wherein said event associated with said first test domain comprises an event detected in outputs of said electronic device generated in response to said test signals supplied to said electronic device.
5. The method as described in claim 1 , further comprising:
(d) terminating said test initiated for said first test domain; and
(e) terminating said test initiated for said second test domain independently of said termination for said test for said first test domain.
6. The method as described in claim 5 , wherein said test initiated for said first test domain is terminated at a different time from said test initiated for said second test domain.
7. The method as described in claim 1 , wherein said test for said first test domain is carried out at a first clock speed and said test for said second test domain is carried out at a second clock speed that is different from said first clock speed.
8. The method as described in claim 1 , wherein a test pattern used in said test initiated for said first test domain is different from a test pattern used in said test initiated for said second domain.
9. The method as described in claim 1 , wherein said test and said triggers are defined as XML blocks and passed as objects.
10. A method as described in claim 1 , wherein said test for said first test domain is operable to interact with said second test domain via said trigger.
11. A method as described in claim 10 , wherein said trigger is generated during execution of said test for said first test domain.
12. A non-transitory computer-readable storage medium having computer-readable program code stored thereon for causing a computer system to execute a method for testing an electronic device using multiple test domains, said method comprising:
(a) initiating a test for a first test domain at a first instrument;
(b) generating a trigger at the first instrument in response to an event associated with the first test domain; and
(c) initiating a test for a second test domain at a second instrument in response to a receipt of the trigger at the second instrument,
wherein termination of said test for said first test domain is conditioned on an event in said second test domain.
13. The non-transitory computer readable storage medium as described in claim 12 , wherein said initiating said test for said first test domain further comprises executing a test pattern to generate test signals to be supplied to said electronic device.
14. A non-transitory computer-readable storage medium as described in claim 13 , wherein said event associated with said first test domain comprises a programmed event in said test pattern.
15. A non-transitory computer-readable storage medium as described in claim 13 , wherein said event associated with said first test domain comprises an event detected in outputs of said electronic device generated in response to said test signals supplied to said electronic device.
16. The non-transitory computer-readable storage medium as described in claim 12 , wherein said method further comprises:
(d) terminating said test initiated for said first test domain; and
(e) terminating said test initiated for said second test domain independently of said termination for said test for said first test domain.
17. The non-transitory computer-readable storage medium as described in claim 16 , wherein said test initiated for said first test domain is terminated at a different time from said test initiated for said second test domain.
18. The non-transitory computer-readable storage medium as described in claim 12 , wherein said test for said first test domain is carried out at a first clock speed and said test for said second test domain is carried out at a second clock speed that is different from said first clock speed.
19. The non-transitory computer-readable storage medium as described in claim 12 , wherein a test pattern used in said test initiated for said first test domain is different from a test pattern used in said test initiated for said second test domain.
20. The non-transitory computer readable storage medium as described in claim 12 , wherein said test and said triggers are defined as XML blocks and passed as objects.
21. A non-transitory computer-readable storage medium having stored therein program instructions to be executed in an apparatus for testing an electronic device, said method comprising:
(a) initiating a test for a first test region of said electronic device at a first test instrument of said apparatus;
(b) generating a trigger at said first test instrument in response to an event associated with said first test region of said electronic device; and
(c) initiating a test for a second test region of said electronic device at a second test instrument of said apparatus in response to a receipt of said trigger at the second test instrument,
wherein termination of said test for said first test region is conditioned on an event in said second test region.
22. The non-transitory computer-readable storage medium as described in claim 21 , wherein said program instructions define said test from said first test region separately for said test for said second test region, each such test definition specifying a test pattern and timing data to be used with said test.
23. The non-transitory computer-readable storage medium as described in claim 21 , wherein said initiating said test for said first test region further comprises executing a test pattern to generate test signals to be supplied to said first region of said electronic device.
24. The non-transitory computer-readable storage medium as described in claim 23 , wherein said event associated with said first test region comprises a programmed event in said test pattern.
25. The non-transitory computer-readable storage medium as described in claim 23 , wherein said event associated with said first test region comprises an event detected in outputs of said first test region of said electronic device generated in response to said test signals supplied to said first test region of said electronic device.
26. The non-transitory computer-readable storage medium as described in claim 21 , wherein said test for said first test region is carried out at a first clock speed and said test for said second test region is carried out at a second clock speed that is different from said first clock speed.