Patent Assignment
Reel/Frame 066762/0811
Termination and Release of Security Interest in Patents, Recorded at Reel 047185, Frame 0624
Recorded: 2024-03-07
Pages: 13
Assignor
DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
Executed: 2024-02-09
Assignee
XCERRA CORPORATION
825 UNIVERSITY HIGHWAY, NORWOOD, MASSACHUSETTS, 02062
Covered Properties
(137)
Inhibitable Continuously-Terminated Differential Drive Circuit for an Integrated Circuit Tester
Patent:
5,942,922 →
Application:
09/056,543 →
Method for Generating a Shmoo Plot Contour for Integrated Circuit Tester
Patent:
6,079,038 →
Application:
09/065,754 →
Integrated Circuit Tester Having Amorphous Logic for Real-Time Data Analysis
Patent:
6,057,679 →
Application:
09/096,812 →
Differential Driver Circuit for Use in Automatic Test Equipment
Patent:
6,052,810 →
Application:
09/111,416 →
Mixed Signal Device Under Test Board Interface
Patent:
6,625,557 →
Application:
09/113,449 →
Triggered Clock Signal Generator
Patent:
6,084,930 →
Application:
09/154,329 →
System for Measuring Noise Figure of a Radio Frequency Device
Patent:
6,114,858 →
Application:
09/181,940 →
Single Platform Electronic Tester
Patent:
6,449,741 →
Application:
09/183,038 →
Test Fixture for Testing Backplanes or Populated Circuit Boards
Patent:
6,194,908 →
Application:
09/207,740 →
Loading Mechanism for Automated Verification and Repair Station
Integrated Circuit Tester with Real Time Branching
Patent:
6,154,715 →
Application:
09/232,098 →
Programmable Load Circuit for Use in Automatic Test Equipment
Patent:
6,211,723 →
Application:
09/235,056 →
System for Testing Real and Simulated Versions of an Integrated Circuit
Patent:
6,295,623 →
Application:
09/240,181 →
Self-Closing Spring Probe
Patent:
6,396,293 →
Application:
09/253,320 →
Device for Controlling Conformity of Consumption of an Electronic Component in a Testing Machine
Patent:
6,263,464 →
Application:
09/284,939 →
Inhibitable Continuously-Terminated Differential Drive Circuit for an Integrated Circuit Tester
Patent:
6,057,716 →
Application:
09/295,632 →
Method of and System for Generating a Binary Shmoo Plot in N-Dimensional Space
Patent:
6,418,387 →
Application:
09/344,861 →
Docking Mechanism for Semiconductor Tester
Patent:
6,407,541 →
Application:
09/364,685 →
Power Supply Circuit of an Electronic Component in a Test Machine
Patent:
6,181,117 →
Application:
09/367,376 →
Measuring Jitter of High-Speed Data Channels
Patent:
6,661,836 →
Application:
09/419,317 →
Arbitrary Waveform Generator Having Programmably Configurable Architecture
Patent:
6,356,224 →
Application:
09/425,276 →
Spaced Adapter Plate for Semiconductor Tester
Apparatus for testing memories with redundant storage elements
Patent:
6,256,757 →
Application:
09/491,478 →
Self-aligning docking assembly for semiconductor tester
Patent:
6,304,092 →
Application:
09/493,520 →
Calibration Method and Apparatus for Correcting Pulse Width Timing Errors in Integrated Circuit Testing
Patent:
6,496,953 →
Application:
09/526,407 →
Floating Interface for Integrated Circuit Test Head
Patent:
6,377,062 →
Application:
09/539,361 →
Self-Retained Spring Probe
Patent:
6,462,567 →
Application:
09/614,422 →
System for linearizing a programmable delay circuit
Patent:
6,330,197 →
Application:
09/628,702 →
Separating Device Response Signals from Composite Signals
Patent:
6,563,298 →
Application:
09/639,517 →
Edge Placement and Jitter Measurement for Electronic Elements
Patent:
6,622,107 →
Application:
09/648,716 →
Scan Stream Sequencing for Testing Integrated Circuits
Patent:
6,748,564 →
Application:
09/696,102 →
High Resolution Clock Signal Generator
Integrated Micromachine Relay for Automated Test Equipment Applications
Patent:
6,700,396 →
Application:
09/859,842 →
System for and Method of Performing Device-Oriented Tests
Single Platform Electronic Tester
Patent:
6,675,339 →
Application:
09/935,453 →
Comparator Circuit for Differential Swing Comparison and Common-Mode Voltage Comparison
Methods and Apparatuses for Digitally Tuning a Phased-Lock Loop Circuit
Patent:
6,728,651 →
Application:
10/097,904 →
Test System Formatters Configurable for Multiple Data Rates
Timing Signal Generator Employing Direct Digital Frequency Synthesis
Patent:
6,563,350 →
Application:
10/102,111 →
Apparatus and Method for Circuit Board Liquid Cooling
Method and Apparatus for Socket Calibration of Integrated Circuit Testers
Apparatus and Method for Data Pattern Alignment
Apparatus and Method for Data Shifting
Pin Electronics Interface Circuit
Method and Apparatus for Use of High Sampling Frequency a/D Converters for Low Frequency Sampling
Apparatus and Method for Embedded Fluid Cooling in Printed Circuit Boards
Patent:
6,665,185 →
Application:
10/267,964 →
Separating Device Response Signals from Composite Signals
Patent:
6,703,825 →
Application:
10/356,172 →
Programmable Multi-Function Module for Automatic Test Equipment Systems
Tester System Having a Multi-Purpose Memory
Power Supply Device for a Component Testing Installation
Programmable Jitter Generator
Single Platform Electronic Tester
Patent:
7,092,837 →
Application:
10/663,469 →
System and Method for Test Socket Calibration
Patent:
7,009,382 →
Application:
10/729,800 →
Method and System for Improved Ate Timing Calibration at a Device Under Test
Patent:
7,120,840 →
Application:
10/773,698 →
Controlled-Impedance Coaxial Cable Interconnect System
Diagnostic Process for Automated Test Equipment
Patent:
7,222,280 →
Application:
10/825,409 →
Calibration-Associated Systems and Methods
Patent:
7,242,257 →
Application:
10/840,850 →
Test Systems and Methods for Integrated Circuit Devices
Patent:
7,765,443 →
Application:
10/840,851 →
Test Systems and Methods with Compensation Techniques
Non-Deterministic Protocol Packet Testing
Pin Electronics Interface Circuit
Synchronization of Multiple Test Instruments
Synchronization of Multiple Test Instruments
Method of Determining Coherent Test Conditions
Patent:
7,353,126 →
Application:
11/018,649 →
Multi-Domain Execution of Tests on Electronic Devices
Distributed, Load Sharing Power Supply System for Ic Tester
Bit Synchronization for High-Speed Serial Device Testing
Test Probe for Finger Tester and Corresponding Finger Tester
System and Method for Test Socket Calibration Using Composite Waveform
Patent:
7,439,728 →
Application:
11/185,569 →
Scan Stream Sequencing for Testing Integrated Circuits
Integrated Circuit Tester
Patent:
7,034,520 →
Application:
11/223,421 →
Semiconductor Integrated Circuit Tester with Interchangeable Tester Module
Automatic Test Equipment Operating Architecture
Automatic Test Equipment Operating Architecture
D-Optimized Switching Converter
Electrical Contact Probe with Compliant Internal Interconnect
Test Probe for Finger Tester and Corresponding Finger Tester
High Speed, Out-of-Band Differential Pin Driver
Patent:
7,372,302 →
Application:
11/477,971 →
Multi-Domain Execution of Tests on Electronic Devices
Patent:
8,649,993 →
Application:
11/520,202 →
Testing a Transceiver
Patent:
7,849,374 →
Application:
11/546,806 →
System and Method for Distortion Analysis
Loadboard Enhancements for Automated Test Equipment
Patent:
7,615,990 →
Application:
11/824,333 →
System and Method for Distortion Analysis
Routed Event Test System and Method
System, Method, and Apparatus for Distortion Analysis
Method and Apparatus for Identifying and Reducing Spurious Frequency Components
Semiconductor Electromechanical Contact
Spring Contact Assembly
Test Probe for Finger Tester and Corresponding Finger Tester
Patent:
43,739 →
Application:
12/248,166 →
System and Method for Thermal Limit Control
Scrub Inducing Compliant Electrical Contact
Flat Plunger Round Barrel Test Probe
A Integrated Circuit Socket with a Two-Piece Connector with a Rocker Arm
Patent:
7,918,669 →
Application:
12/841,866 →
High Resolution Clock Signal Generator
Spring Contact Assembly
Wiring Board for Testing Loaded Printed Circuit Board
Loaded Printed Circuit Board Test Fixture and Method for Manufacturing the Same
Terminal for Flat Test Probe
Method and Apparatus for Identifying and Reducing Spurious Frequency Components
Thermal Chamber for Ic Chip Testing
Contact -Connection Unit for a Test Apparatus for Testing Printed Circuit Boards
Spring Contact Assembly
Connector / Cable Assembly
Automated Test Platform Utilizing Segmented Data Sequencers to Provide Time Controlled Test Sequences to Device Under Test
Scalable Test Platform in a Pci Express Environment with Direct Memory Access
Scalable Test Platform in a Pci Express Environment with Direct Memory Access
Scalable Test Platform
Automated Test Platform Utilizing Status Register Polling with Temporal Id
Integrated Circuit (Ic) Socket with Contoured Capture Groove
Patent:
8,758,027 →
Application:
13/769,120 →
Integrated Circuit (Ic) Test Socket with Faraday Cage
Socket Mount
Heat Dissipation System
Integrated Circuit (Ic) Test Socket Using Kelvin Bridge
Cross-Bar Unit for a Test Apparatus for Circuit Boards, and Test Apparatus Containing the Former
Integrated Circuit Chip Tester with an Anti-Rotation Link
Test Probe Assembly and Related Methods
Distortion Measurement and Correction System and Method
Wiring Board for Testing Loaded Printed Circuit Board
Automated Test Platform for Testing Short Circuits
Integrated Circuit Chip Tester with Embedded Micro Link
Patent:
9,343,830 →
Application:
14/733,314 →
Test Socket Assembly and Related Methods
Compact Testing System
Application:
15/281,966 →
Publication:
US 2018/0095110
Link Socket Sliding Mount with Preload
Testing System and Method
Testing System and Method
Positioning Device for a Parallel Tester for Testing Printed Circuit Boards and Parallel Tester for Testing Printed Circuit Boards
Application:
15/747,016 →
Publication:
US 2018/0217200
Multi-Node Testing System and Method
Application:
15/804,248 →
Publication:
US 2018/0128872
Multi-Node Testing System and Method
Application:
15/804,262 →
Publication:
US 2018/0128873
Test Socket Assembly and Related Methods
Semiconductor Integrated Circuit Test Head
Patent:
511,981 →
Application:
29/201,978 →
Integrated Circuit Socket Connector
Patent:
668,625 →
Application:
29/366,291 →
Test Socket Assembly with Spring Damper Assisted Cantilever Contacts
Application:
62/611,844 →
Test Socket Assembly with Coplanar Waveguide Transition and Related Methods
Application:
62/611,853 →
Test Socket Assembly with Antenna and Related Methods
Application:
62/611,873 →
Test Socket Assembly with Hybrid Ring Coupler and Related Methods
Application:
62/635,989 →
Test Socket Assembly and Related Methods
Application:
62/637,610 →
Hybrid Probe Head Assembly for Testing a Wafer Device Under Test
Application:
62/679,488 →
Related Assignments
(8)
Other recorded transfers of the patents in this record — the chain of ownership.
Security Agreement
Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →
Change of Name
May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
Assignment of Assignor's Interest
Jun 12, 2014
From: DELAWARE CAPITAL FORMATION, INC.
To: LTX-CREDENCE CORPORATION
Reel/Frame 033091/0639 →
Release of Security Interest in United States Patents
Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
Security Agreement
Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
Corrective Assignment to Correct the Incorrect Patent Number 7261561 and Replace with Patent Number 7231561 Previously Recorded on Reel 034660 Frame 0188. Assignor(S) Hereby Confirms the Security Agreement.
Feb 11, 2016
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 037824/0372 →
Patent Security Agreement
Oct 2, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047185/0624 →
Corrective Assignment to Correct the Incorrect Statement That This Document Serves as an Oath/Declaration Previously Recorded on Reel 047185 Frame 0628. Assignor(S) Hereby Confirms the Patent Security Agreement.
Nov 28, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047675/0354 →