IP Library Granted Patent US 8,710,856
Granted Patent B2
US 8,710,856 · App. 12/968,023 · Granted Apr 29, 2014

Terminal for flat test probe

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Quick Facts
Patent No.
US 8,710,856
App. No.
12/968,023
Granted
Apr 29, 2014
Kind
B2
Abstract

A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.

Claims (26)

1. A compliant contact assembly comprising:

a first flat contact member having a terminal end;

said terminal end having at least one tapered cam surface adjacent a rear angle;

a second contact member partially overlapping the first flat contact member;

a compression spring positioned around the overlapping portions of the first contact member and the second contact member; and

a receptacle having at least one detent,

wherein the tapered cam surface engages the detent as the terminal end is inserted into the receptacle until the rear angle passes over the detent which retains the terminal end within the receptacle.

2. The contact assembly of claim 1 wherein the terminal end includes a second tapered cam surface spaced from the first tapered cam surface and a second rear angle adjacent the second tapered cam surface and the receptacle includes a second detent spaced from the first detent wherein the first and second tapered cam surfaces engages the first and second detents as the terminal end is inserted into the receptacle until the first and second rear angles pass over the first and second detents.

3. The contact assembly of claim 1 wherein the second contact member has a flat configuration and includes a contact tip.

4. The contact assembly claim 3 wherein the contact tip has a three dimensional contact surface.

5. The contact assembly of claim 4 wherein the contact surface is U-shaped.

6. The contact assembly of claim 4 wherein the contact surface is V-shaped.

7. The contact assembly of claim 4 wherein the contact surface is C-shaped.

8. The contact assembly of claim 4 wherein the contact surface is S-shaped.

9. A combination of a flat contact member and a receptacle wherein the flat contact member has a terminal end having at least one tapered cam surface adjacent a rear angle and the receptacle has at least one detent wherein the tapered cam surface engages the detent as the terminal end is inserted into the receptacle temporarily flexing the terminal end until the rear angle passes over the detent which retains the terminal end within the receptacle.

10. The combination of claim 9 wherein the terminal end includes a second tapered cam surface spaced from the first tapered cam surface and a second rear angle adjacent the second tapered cam surface and the receptacle includes a second detent spaced from the first detent wherein the first and second tapered cam surfaces engages the first and second detents as the terminal end is inserted into the receptacle temporarily flexing the terminal end until the first and second rear angles pass over the first and second detents.

11. The combination of claim 9 wherein the combination further includes a second contact member partially overlapping the flat contact member and a compression spring positioned around the overlapping portions of the flat contact member and the second contact member.

12. The combination of claim 11 wherein the second contact member includes a contact tip.

13. The combination of claim 12 wherein the contact tip has a three dimensional contact surface.

14. The combination of claim 13 wherein the contact surface is U-shaped.

15. The combination of claim 13 wherein the contact surface is V-shaped.

16. The combination of claim 13 wherein the contact surface is C-shaped.

17. The combination of claim 13 wherein the contact surface is S-shaped.

18. A flat test probe for insertion into a receptacle that has a protrusion, the flat test probe comprising a body portion and a tail portion, the tail portion having an angled guiding surface and a stop surface wherein the tail portion flexes when the angled guiding surface engages the protrusion and returns to a non-flexed position when the angled guiding surface has passed over the protrusion and the stop surface is adjacent the protrusion.

19. The flat test probe of claim 18 wherein the tail portion includes a second angled guiding surface and a second stop surface.

20. The flat test probe of claim 19 wherein the second angled guiding surface and the second stop surface are positioned on an opposite side of the tail portion from the angled guiding surface and the stop surface.

Assignments (10)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS, RECORDED AT REEL 047185, FRAME 0624 Recorded Mar 7, 2024
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
To: XCERRA CORPORATION
Reel/Frame 066762/0811 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT STATEMENT THAT THIS DOCUMENT SERVES AS AN OATH/DECLARATION PREVIOUSLY RECORDED ON REEL 047185 FRAME 0628. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT. Recorded Nov 28, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047675/0354 →
PATENT SECURITY AGREEMENT Recorded Oct 2, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047185/0624 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 7261561 AND REPLACE WITH PATENT NUMBER 7231561 PREVIOUSLY RECORDED ON REEL 034660 FRAME 0188. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Feb 11, 2016
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 037824/0372 →
RELEASE OF SECURITY INTEREST IN UNITED STATES PATENTS Recorded Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
SECURITY AGREEMENT Recorded Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2014
From: DELAWARE CAPITAL FORMATION, INC.
To: LTX-CREDENCE CORPORATION
Reel/Frame 033091/0639 →
CHANGE OF NAME Recorded May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
SECURITY AGREEMENT Recorded Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 26, 2011
From: SWART, MARK A.; SNYDER, KENNETH R.
To: DELAWARE CAPITAL FORMATION, INC.
Reel/Frame 025702/0808 →