Granted Patent B2

US 9,989,583 · App. 14/209,646 · Granted Jun 5, 2018

Abstract

Claims (25)

1. A cross-bar unit for a test apparatus for circuit boards wherein the cross-bar unit has at least one cross-bar extending over and spanning a test field in which a circuit board to be tested may be placed, and is configured to hold a plurality of positioning units having a plurality of test fingers in a linearly traversable manner so that the test fingers are able to scan at least part of the test field,

wherein the cross-bar unit holds at least two linear guides extending over and spanning the test field, independent of one another, for guiding in each case at least one of the positioning units mounted directly thereon;

wherein the at least two linear guides are rails and are mounted directly on the cross-bar unit alongside the at least one cross-bar.

2. The cross-bar unit of claim 1 , wherein:

the at least two linear guides are provided at a side of each cross-bar.

3. The cross-bar unit of claim 1 , wherein:

at least one of the cross-bar has two linear guides mounted directly thereon, with the two linear guides running parallel to one another.

4. The cross-bar unit of claim 3 , wherein:

the cross-bar unit has at least two cross-bars spanning the test field, wherein each of the at least two cross-bars has at least one of the linear guides, wherein the at least two cross-bars preferably run parallel to one another.

5. The cross-bar unit of claim 4 , wherein:

of the at least two cross-bars, at least one runs on one side of a test field plane (E) of the test field and at least one runs on another side of the test field plane (E).

6. The cross-bar unit of claim 5 , wherein:

the at least two cross-bars are exactly two cross-bars, joined by connection pieces to form an annular shape of at least substantially rectangular pattern so that the cross-bar unit spans the test field in such a way that the test field is positioned between the two cross-bars.

7. The cross-bar unit of claim 1 , wherein:

the cross-bar unit is configured for fixed mounting at preset connection points of a stand of the test apparatus.

8. The cross-bar unit of claim 1 , wherein:

each positioning unit has a swivel unit and a traversing unit, wherein each test finger has a swivel arm joined to the swivel unit of an associated positioning unit and a test probe fastened to the swivel arm, wherein each traversing unit is mounted in one of the linear guides and is configured to traverse by a drive unit, and wherein the linear guides are mounted on the cross-bar unit.

9. The cross-bar unit of claim 8 , wherein:

an axial distance (a) of a swivel axis (S) of the swivel unit of the positioning units from the respective linear guide and/or a probe distance (b) of a test probe from the swivel axis (S) of the swivel unit of a particular positioning unit is changeable, wherein the axial distance (a) and/or the probe distance (b) are preferably changeable in preset steps.

10. The cross-bar unit of claim 9 , wherein:

connection surfaces of two structural elements of the positioning units are configured as an interface for changing the axial distance (a), wherein spacers of preset thickness may be fitted to change the axial distance (a) between the connection surfaces.

11. The cross-bar unit of claim 10 , wherein:

the swivel arm of different test fingers have different lengths for changing the probe distance (b), and are mounted between the swivel axis (S) and the test probe.

12. The cross-bar unit of claim 11 , wherein:

the probe distance (b) are adapted to the respective axial distance (a), wherein the spacers for fixing the axial distance (a) and swivel arms for fixing the probe distance (b) are provided with matching spacer thicknesses and swivel arm lengths respectively.

Assignments (8)