IP Library Granted Patent US 7,190,182
Granted Patent B2
US 7,190,182 · App. 11/121,802 · Granted Mar 13, 2007

Test probe for finger tester and corresponding finger tester

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Quick Facts
Patent No.
US 7,190,182
App. No.
11/121,802
Granted
Mar 13, 2007
Kind
B2
Abstract

A test probe for a finger tester for the testing of non-componented circuit boards has a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms. It is distinguished by the fact that at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle. In a corresponding finger tester, the test probe is driven by a linear motor.

Claims (21)

1. Finger tester for the testing of non-componented circuit boards comprising:

a linear motor with two static magnetic flux elements arranged opposite one another, and an armature plate mounted to move along a linear path between the static magnetic flux elements and made of a non-magnetic material and having at regular intervals strip-shaped armature elements made of a magnetic material,

wherein a test probe is mounted on the armature plate and the test probe is provided with a finger tester for the testing of circuit boards, with no independent drive, and with a test needle with a probe tip which may be brought into contact with a circuit board test point, and which may be pivotably attached to a mount by means of at least two flexible sprung retaining arms,

wherein at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle.

2. Finger tester according to claim 1 , comprising two pairs of flexible sprung retaining arms, wherein each pair of retaining arms is mounted in one plane, with one end fixed to the test needle and the other end to the mount, and spanning a triangle when viewed from above.

3. Finger tester according to claim 1 , wherein at least one of the magnetic flux elements has one or more permanent magnets and, on the end sections facing the armature plate, has several pole walls on which driving coils are mounted.

4. Finger tester according to claim 1 , wherein one or more of the magnetic flux elements has at least one coil for generating a static magnetic field and, on the end sections facing the armature plate, has several pole walls on which driving coils are mounted.

5. Finger tester according to claim 1 , wherein on both magnetic flux elements there are provided air nozzles, each directed on to the armature plate to form an air cushion between the armature plate and the magnetic flux elements.

6. Finger tester according to claim 1 , wherein only one test probe is mounted on the armature plate.

7. Finger tester according to claim 1 , wherein the linear path is perpendicular to a plane of a circuit board being tested by the finger tester.

8. Finger tester according to claim 1 , wherein the linear path is perpendicular to a plane of a circuit board being tested by the finger tester, the linear motor moving the test probe along the linear path toward and away from the circuit board.

9. Finger tester forte testing of non-componented circuit boards comprising

a linear motor with two static magnetic flux elements ranged opposite one another, and an a nature plate mounted to move along a linear path between the two static magnetic flux elements, the armature plate comprising magnetic armature elements; and

a test probe mounted on the armature plate and comprising a test needle with a probe tip for contacting a circuit board test point, which is held by at least two flexible sprung retaining arms, wherein at least one of the retaining arms is made of an electrically conductive material and is electrically connected to the test needle.

10. Finger tester according to claim 9 , comprising two pairs of flexible sprung retaining arms, wherein each pair of retaining arms is mounted in one plane, with one end fixed to the test needle and the other end to a mount, and spanning a triangle when viewed from above.

11. Finger tester according to claim 9 , wherein at least one of the magnetic flux elements has one or more permanent magnets and, on end sections facing the armature plate, has several pole walls on which driving coils are mounted.

12. Finger tester according to claim 9 , wherein one or more of the magnetic flux elements has at least one coil for generating a static magnetic field and, on end sections facing the armature plate, has several pole walls on which driving coils are mounted.

13. Finger tester according to claim 9 , wherein on both magnetic flux elements there are provided air nozzles, each directed on to the armature plate to form an air cushion between the armature plate and the magnetic flux elements.

14. Finger tester according to claim 9 , wherein only one test probe is mounted on the armature plate.

15. Finger tester according to claim 9 , wherein the linear pat is perpendicular to a plane of a circuit board being tested by the finger tester.

16. Finger tester according to claim 9 , wherein the linear path is perpendicular to a plane of a circuit board being tested by the finger tester, the linear motor moving the test probe along the linear path toward and away from the circuit board.

Assignments (9)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS, RECORDED AT REEL 047185, FRAME 0624 Recorded Mar 7, 2024
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
To: XCERRA CORPORATION
Reel/Frame 066762/0811 →
RELEASE OF SECURITY INTEREST Recorded Jun 15, 2021
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES, LLC
Reel/Frame 056592/0572 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT STATEMENT THAT THIS DOCUMENT SERVES AS AN OATH/DECLARATION PREVIOUSLY RECORDED ON REEL 047185 FRAME 0628. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT. Recorded Nov 28, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047675/0354 →
PATENT SECURITY AGREEMENT Recorded Oct 2, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047185/0624 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 7261561 AND REPLACE WITH PATENT NUMBER 7231561 PREVIOUSLY RECORDED ON REEL 034660 FRAME 0188. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Feb 11, 2016
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 037824/0372 →
SECURITY AGREEMENT Recorded Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
RELEASE OF SECURITY INTEREST IN UNITED STATES PATENTS Recorded Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
CHANGE OF NAME Recorded May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
SECURITY AGREEMENT Recorded Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →