Apparatus and method for data pattern alignment
View Patent ↗A digital tester includes a digital data pattern aligner. The digital data pattern aligner includes an alignment pattern source, a data shifter, and a data comparator. The alignment pattern source sends an alignment pattern to the comparator in a data stream. The comparator samples the data stream and compares the samples to a copy of the alignment pattern. The shifter shifts the data in the data stream so long as the comparator detects no match between a data stream sample and the copy of the alignment pattern. When a match is detected, the pattern source and the comparator are in alignment and other data, such as test patterns, may be sent to the comparator or associated components.
1. A data aligner comprising:
a data alignment pattern source configured to produce and send an alignment pattern;
a comparator configured to compare one or more received data patterns to at least a portion of the alignment pattern; and
a shifter within a data path between the pattern source and the comparator, the shifter configured to shift the alignment pattern, said comparator also configured to initiate a shift within the shifter when one of said comparisons yields no match between a received data pattern and said at least portion of the alignment pattern wherein said shifter comprises first and second registers for receiving a sequence of data from said alignment pattern source and a multiplexor for selecting a data segment from said sequence of data in said first and second registers.
2. The data aligner of claim 1 wherein the shifter is configured to shift the alignment pattern before the alignment pattern is sent to the comparator.
3. The data aligner of claim 1 wherein the shifter is configured to shift the alignment pattern after the alignment pattern is received by the comparator.
4. The data aligner of claim 1 wherein the alignment pattern generator is configured to generate a pattern that includes an alignment word and to send a pattern that includes the alignment word.
5. The data aligner of claim 4 wherein the pattern generator is configured to repeatedly send the alignment pattern until it receives an indication from the comparator that the comparator has found a match between at least a portion of the alignment pattern and a received data pattern.
6. The data aligner of claim 4 wherein the comparator is configured to match an alignment word within the alignment pattern.
7. The data aligner according to claim 1 , wherein said multiplexor is configured to select a next data segment which is shifted by one data unit from a previous data segment after said comparator compares said previous data segment with said at least portion of the alignment pattern and yields no match between said previous data segment and said portion of the alignment pattern.
8. A method of data alignment comprising the steps of:
a data alignment pattern source producing a data alignment pattern;
the data alignment pattern source sending said alignment pattern;
a comparator receiving said alignment pattern and comparing one or more received data patterns to at least one portion of the alignment pattern; and
a shifter within a data path between the pattern source and the comparator, the shifter shifting the alignment pattern, said comparator initiating a shift within the shifter when one of said comparisons yields no match between a received data pattern and said at least one portion of the alignment pattern, wherein said shifter comprises first and second registers and a multiplexor, said shifter receiving a sequence of data from said alignment pattern source and said multiplexor selecting a data segment from said sequence of data in said first and second registers.
9. The method of claim 8 wherein the shifter shifts the alignment pattern before the alignment pattern is sent to the comparator.
10. The method of claim 8 wherein the shifter shifts the alignment pattern after the alignment pattern is received by the comparator.
11. The method of claim 8 wherein the alignment pattern generator generates a pattern that includes an alignment word and sends a pattern that includes the alignment word.
12. The method of claim 11 wherein the pattern generator repeatedly sends the alignment pattern until it receives an indication from the comparator that the comparator has found a match between at least a portion of the alignment pattern and a received data pattern.
13. The method of claim 11 wherein the comparator matches an alignment word within the alignment pattern.
14. The method of data alignment according to claim 8 , including the further steps of said multiplexor selecting a next data segment that is shifted by one data unit from a previous data segment after said comparator compares said previous data segment with said at least one portion of the alignment pattern and yields no match between said previous data segment and said portion of the alignment pattern.