Power supply device for a component testing installation
View Patent ↗A power supply device for an installation for testing electronic components. The power supply device includes a first, high-frequency, supply source, a second, low-frequency, supply source, and a control module. The first, high-frequency, supply source includes a high-frequency amplification stage capable of outputting a first current (i 1 ) for a first time interval. The second, low-frequency, supply source has a low-frequency amplification stage capable of outputting a second current (i 2 ) for a second time interval, the second time interval being longer than the first time interval. The control module is adapted to selectively activate either the first source and then the second source, thereby outputting a current of the order of i 1 for a time interval greater than the first time interval or only the first source, thereby outputting a current of the order of i 1 for a time interval less than or equal to the first time interval. The control module responds to the needs of an electronic component under test.
1. A power supply device for an installation for testing electronic components, the power supply sevice comprising:
a first, high-frequency, supply source having a high-frequency amplification stage capable of outputting a first current (i 1 ) for a first time interval;
a second, low-frequency, supply source having a low-frequency amplification stage capable of outputting a second current (i 2 ) for a second time interval, the second time interval being longer than the first interval; and
a control module for controlling the first and second supply sources,
wherein the control module has a first mode of operation in which it activates the first source, thereby outputting a current for a time interval less than or equal to said first time interval, and a second mode of operation in which it activates the first source and subsequently activates the second source, thereby outputting a current for a time interval greater than said first time interval.
2. The device of claim 1 , wherein the control module includes a measurement instrument capable of measuring the first current and wherein the control module is designed to activate the second source according to the value of said first current.
3. The device of claim 1 , wherein the second source has an input connected to the output of the first source.
4. The device of claim 1 , wherein the first source comprises a high-frequency linear amplifier.
5. The device of claim 1 , wherein the second source comprises a switch mode power supply.
6. The device of claim 1 , wherein in the second mode of operation the control module activates the second source before the first time interval ends.
7. The device of claim 1 , wherein the device further comprises an accumulator circuit connected to an electric component under test and wherein the first and second sources are connected to the accumulator circuit.
8. The device of claim 7 , wherein in the first and second modes of operation said accumulator circuit is adapted to supply said electronic component for at least part of said first time interval.
9. The device of claim 7 , wherein the accumulator circuit comprises at least one capacitor and the first source is connected to charge the capacitor.
10. The device of claim 7 , wherein the control module is designed:
to activate the first source for recharging the accumulator circuit and for delivering the current to the component to be tested; and
to activate the second source and deactivate the first source.
11. The device of claim 1 , wherein in the second mode of operation the control module deactivates the first source substantially after activating the second source.
12. The device of claim 1 , wherein the first source is designed to output a current having a leading edge that is steeper than the leading edge of current output by the second source.
13. The device of claim 1 , wherein the current delivered to an electronic component under test will reach about 200 amps in less than 500 nanoseconds.
14. The device of claim 1 , wherein the current delivered to an electronic component under test will reach about 200 amps in less than 200 nanoseconds.
15. The device of claim 1 , further comprising a third source adapted for outputting a third current (i 3 ) substantially less than the second current (i 2 ).
16. The device of claim 15 , wherein the third current is a measurement current.
17. The device of claim 15 , further comprising a switching element between said third source and the second source, suitable for selectively activating the second source or the third source according to the first current.
18. The device of claim 1 , wherein the device further comprises an accumulator circuit for connection to an electronic component under test and wherein the first and second sources are connected to the accumulator circuit, in the first and second modes of operation said accumulator circuit is adapted to supply said electronic component for at least part of said first time interval, and during the second mode of operation, the device will respond a requirement by said electronic component for additional current by:
initially supplying a majority of the additional current to the electronic component via the accumulator circuit,
subsequently supplying a majority of the additional current to the electronic component via the first supply source,
subsequently supplying a majority of the additional current to the electronic component via the second supply source, and
finally supplying all of the current required by the electronic component via the second supply source.
19. An installation for testing electronic components, comprising a power supply device having:
a first, high-frequency, supply source having a high-frequency amplification stage capable of outputting a first current (i 1 ) for a first time interval;
a second, low-frequency, supply source having a low-frequency amplification stage capable of outputting a first current (i 2 ) for a second time interval, the second time interval being longer than the first time interval; and
a control module for controlling the first and second supply sources,
wherein the control module has a first mode of operation and a second mode of operation in which it activates the first source and subsequently activates the second source, thereby outputting a current for a time interval greater than said first time interval.
20. The installation of claim 19 , wherein the control module's first mode of operation comprises activating the first source, thereby outputting a current for a time interval less than or equal to said first time interval.
21. The device of claim 19 , wherein the control module includes a measurement instrument capable of measuring the first current and wherein the control module is designed to activate the second source to the value if said first current.
22. The device of claim 19 , wherein the second source has an input connected to the output of the first source.
23. The device of claim 19 , wherein the first source comprises a high-frequency linear amplifier.
24. The device of claim 19 , wherein the second source comprises a switch mode power supply.
25. The device of claim 19 , wherein in the second mode of operation the control module activates the second source before the first time interval ends.
26. The device of claim 19 , wherein the device further comprises an accumulator circuit for connection to an electronic component under test and wherein the first and second sources are connected to the accumulator circuit.
27. The device of claim 26 , wherein in the first and second modes of operation said accumulator circuit is adapted to supply said electronic component for at least part of said first time interval.
28. The device of claim 26 , wherein the accumulator circuit comprises at least one capacitor and the first source is connected to charge the capacitor.
29. The device of claim 26 , wherein the control module is designed:
to activate the first source for recharging the accumulator circuit and for delivering the current to the component to be tested; and
to activate the second source and deactivate the first source.
30. The device of claim 19 , wherein in the second mode of operation the control module deactivates the first source substantially after activating the second source.
31. The device of claim 19 , wherein the first source is designed to output a current having a leading edge that is steeper than the leading edge of current output by the second source.
32. The device of claim 19 , wherein the current delivered to an electronic component under test will reach about 200 amps in less than 500 nanoseconds.
33. The device of claim 19 , wherein the current delivered to an electronic component under test will reach about 200 amps in less than 200 nanoseconds.
34. The device of claim 19 , further comprising a third source adapted for outputting a third current (i 3 ) substantially less than the second current (i 2 ).
35. The device of claim 34 , wherein the third current is a measurement current.
36. The device of claim 34 , further comprising a switching element between said third source and the second source, suitable for selectively activating the second source or the third source according to the first current.
37. The device of claim 19 , wherein the device further comprises an accumulator circuit for connection to an electronic component under test and wherein the first and second sources are connected to the accumulator circuit, in the first and second modes of operation said accumulator circuit is adapted to supply said electronic component for at least part of said first time interval, and during the second mode of operation, the device will respond a requirement by said electronic component for additional current by:
initially supplying a majority of the additional current to the electronic component via the accumulator circuit,
subsequently supplying a majority of the additional current to the electronic component via the first supply source,
subsequently supplying a majority of the additional current to the electronic component via the second supply source, and
finally supplying all of the current required by the electronic component via the second supply source.