COMPACT TESTING SYSTEM
An automated test platform includes a CPU subsystem housed in an enclosure and configured to execute an automated test process. A test head is housed in the enclosure and is configured to apply one or more test signals to a device under test. A power supply is housed in the enclosure and is configured to provide electrical power to the CPU subsystem and the test head.
1 . An automated test platform comprising:
a CPU subsystem housed in an enclosure and configured to execute an automated test process;
a test head housed in the enclosure and configured to apply one or more test signals to a device under test; and
a power supply housed in the enclosure and configured to provide electrical power to the CPU subsystem and the test head.
2 . The automated test platform of claim 1 further comprising:
an interconnection platform configured to couple the CPU subsystem and the test head.
3 . The automated test platform of claim 2 wherein the interconnection platform includes:
a PCIe bus that is configured to allow the CPU subsystem and the test head to communicate via PCIe communication standards.
4 . The automated test platform of claim 2 wherein the interconnection platform includes:
a USB bus that is configured to allow the CPU subsystem and the test head to communicate via USB communication standards.
5 . The automated test platform of claim 2 wherein the interconnection platform is configured to allow the automated test platform to interface with an external computing device.
6 . The automated test platform of claim 1 wherein the CPU subsystem includes:
one or more of a personal computer, a server computer, a series of server computers, a mini computer or a single-board computer.
7 . The automated test platform of claim 1 wherein the automated test platform is configured to be spatially manipulated by a manipulator system.
8 . The automated test platform of claim 7 wherein the manipulator system is configured to move the automated test platform in the X axis, the Y axis and/or the Z axis.
9 . The automated test platform of claim 7 wherein the manipulator system is configured to rotate the automated test platform about the X axis, the Y axis and/or the Z axis.
10 . The automated test platform of claim 1 wherein the automated test platform is configured to interface with a handler system.
11 . The automated test platform of claim 10 wherein the handler system is configured to automate the testing of the device under test.
12 . An automated test enclosure comprising:
a CPU subsystem configured to execute an automated test process;
a test head configured to apply one or more test signals to a device under test;
an interconnection platform configured to couple the CPU subsystem and the test head; and
a power supply configured to provide electrical power to the CPU subsystem, the test head and the interconnection platform.
13 . The automated test enclosure of claim 12 wherein the interconnection platform includes:
a USB bus that is configured to allow the CPU subsystem and the test head to communicate via USB communication standards.
14 . The automated test enclosure of claim 12 wherein the interconnection platform is configured to allow the automated test enclosure to interface with an external computing device.
15 . The automated test enclosure of claim 12 wherein the CPU subsystem includes:
one or more of a personal computer, a server computer, a series of server computers, a mini computer or a single-board computer.
16 . The automated test enclosure of claim 12 wherein the automated test enclosure is configured to be spatially manipulated by a manipulator system.
17 . The automated test enclosure of claim 12 wherein the automated test enclosure is configured to interface with a handler system.
18 . An automated test platform comprising:
a CPU subsystem housed in an enclosure and configured to execute an automated test process;
a test head housed in the enclosure and configured to apply one or more test signals to a device under test;
an interconnection platform housed in the enclosure and configured to couple the CPU subsystem and the test head;
a power supply housed in the enclosure and configured to provide electrical power to the CPU subsystem, the test head and the interconnection platform; and
a manipulator system configured to spatially manipulate the enclosure.
19 . The automated test platform of claim 18 wherein the manipulator system is configured to move the automated test platform in the X axis, the Y axis and/or the Z axis.
20 . The automated test platform of claim 18 wherein the manipulator system is configured to rotate the automated test platform about the X axis, the Y axis and/or the Z axis.