Test systems and methods with compensation techniques
View Patent ↗The present invention relates to test systems for testing integrated circuit devices and to calibration associated systems and methods. One embodiment of the invention provides a method for providing formatted levels for use in a test system. The method includes: providing on a single CMOS IC, a timing generation circuit operative to provide timing information signals; and a formatter in communication with the timing generation circuit.
1. A test system for providing formatted signals, the test system comprising:
a timing generation circuit operative to provide timing information signals on a single CMOS Integrated Circuit (IC); and
a formatter in communication with said timing generation circuit, said formatter comprising:
a drive circuit, said drive circuit comprising:
a plurality of event logic interfaces, each event logic interface capable of decoding signals received from said timing generation circuit;
a plurality of delay line elements (DLEs), each DLE in communication with a corresponding event logic interface and capable of generating timing markers corresponding to signals received from an event logic interface; and
a drive logic in communication with said plurality of DLEs and operative to produce formatted levels in response to timing
markers received from said plurality of DLEs; and
wherein variation of drain to source voltage of said plurality of DLEs are compensated such that the drain to source voltage variation below a specified percentage is maintained and such that said formatter provides a specified number of transitions per second and a specified edge placement resolution and accuracy.
2. The test system of claim 1 wherein said plurality of event logic interfaces use a lookup table to decode received signals.
3. A test system for providing formatted signals, the test system comprising:
a timing generation circuit operative to provide timing information signals on a single CMOS Integrated Circuit (IC); and
a formatter in communication with said timing generation circuit, said formatter comprising:
a drive circuit, said drive circuit comprising:
a plurality of event logic interfaces, each event logic interface capable of decoding signals received from said timing generation circuit;
a plurality of delay line elements (DLEs), each DLE in communication with a corresponding event logic interface and capable of generating timing markers corresponding to signals received from an event logic interface; and
a drive logic in communication with said plurality of DLEs and operative to produce formatted levels in response to timing markers received from said plurality of DLEs; and
wherein temperature variation of said plurality of DLEs are compensated such that the temperature variation below a specified percentage is maintained and such that the formatter provides a specified number of transitions per second and a specified edge placement resolution and accuracy.
4. The test system of claim 3 wherein compensating for temperature variation uses a liquid cooling system.
5. The test system of claim 3 wherein compensating for temperature variation uses a heat spreader.
6. The test system of claim 3 wherein said plurality of event logic interfaces use a lookup table to decode received signals.
7. A test system for providing formatted signals, the test system comprising:
a timing generation circuit operative to provide timing information signals on a single CMOS Integrated Circuit (IC); and
a formatter in communication with said timing generation circuit, said formatter comprising:
a drive circuit, said drive circuit comprising:
a plurality of event logic interfaces, each event logic interface capable of decoding signals received from said timing generation circuit;
a plurality of delay line elements (DLEs), each DLE in communication with a corresponding event logic interface and capable of generating timing markers corresponding to signals received from an event logic interface; and
a drive logic in communication with said plurality of DLEs and operative to produce formatted levels in response to timing markers received from said plurality of DLEs; and
wherein voltage variation of said drive logic is compensated such that the voltage variation below a specified percentage is maintained and such that the formatter provides a specified number of transitions per second and a specified edge placement resolution and accuracy.
8. The test system of claim 7 wherein compensating for voltage variation comprises using bandgap references to compensate for voltage variation.
9. The test system of claim 7 wherein said plurality of event logic interfaces use a lookup table to decode received signals.
10. A test system for providing formatted signals, the test system comprising:
a timing generation circuit operative to provide timing information signals on a single CMOS Integrated Circuit (IC); and
a formatter in communication with said timing generation circuit, said formatter comprising:
a drive circuit, said drive circuit comprising:
a plurality of event logic interfaces, each event logic interface capable of decoding signals received from said timing generation circuit;
a plurality of delay line elements (DLEs), each DLE in communication with a corresponding event logic interface and capable of generating timing markers corresponding to signals received from an event logic interface; and
a drive logic in communication with said plurality of DLEs and operative to produce formatted levels in response to timing markers received from said plurality of DLEs; and
wherein variation of drain to source voltage of said plurality of DLEs are compensated such that the drain to source voltage variation below a specified percentage is maintained;
wherein temperature variation of said plurality of DLEs are compensated such that the temperature variation below a specified percentage is maintained; and
wherein voltage variation of said drive logic is compensated such that the voltage variation below a specified percentage is maintained, such that the formatter provides a specified number of transitions per second and a specified edge placement resolution and accuracy.
11. The test system of claim 10 wherein said plurality of event logic interfaces use a lookup table to decode received signals.
12. The test system of claim 10 wherein compensating for voltage variation comprises using bandgap references to compensate for voltage variation.
13. The test system of claim 10 wherein compensating for temperature variation uses a liquid cooling system.
14. The test system of claim 10 wherein compensating for temperature variation uses a heat spreader.