IP Library Granted Patent US 7,353,126
Granted Patent B1
US 7,353,126 · App. 11/018,649 · Granted Apr 1, 2008

Method of determining coherent test conditions

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,353,126
App. No.
11/018,649
Granted
Apr 1, 2008
Kind
B1
Abstract

A method of determining coherent test conditions is disclosed. The method includes receiving constraints from a user, wherein the constraints include desired test conditions, desired tolerances for the desired test conditions, and desired instrument. Further, the method includes determining the coherent test conditions using the constraints. Moreover, the method includes providing each determined coherent test condition to the user, wherein each determined coherent test condition includes a calculated sampling frequency and a calculated analog frequency.

Claims (70)

1. A method of determining coherent test conditions, said method comprising:

receiving constraints from a user, wherein said constraints include desired test conditions, desired tolerances for said desired test conditions, and desired instrument;

determining said coherent test conditions using said constraints, wherein said determining said coherent test conditions includes determining a calculated sampling frequency and a calculated analog frequency; and

providing each determined coherent test condition to said user, wherein each determined coherent test condition includes said calculated sampling frequency and said calculated analog frequency,

wherein said constraints include a first range of desired number of samples, wherein said desired conditions include a desired sampling frequency and a desired analog frequency, and wherein said determining said coherent test conditions comprises:

selecting a sample value from said first range;

determining a second range of integer number of cycles for coherency using said sample value, said desired sampling frequency, and said desired analog frequency;

selecting an integer value from said second range;

if said selected sample value and said selected integer value satisfy requirement for coherency, determining an ideal sampling frequency using said selected sample value, said selected integer value, and said desired sampling frequency;

using a clock divider value and said ideal sampling frequency to determine said calculated sampling frequency and said calculated analog frequency; and

retaining said calculated sampling frequency and said calculated analog frequency if fall within desired tolerances.

2. The method as recited in claim 1 wherein said using a clock divider value comprises:

selecting a clock divider value based on said desired instrument;

determining an ideal master clock frequency using said ideal sampling frequency and said selected clock divider;

determining a real master clock frequency using said ideal master clock frequency;

determining said calculated sampling frequency using said real master clock frequency and said selected clock divider; and

determining said calculated analog frequency using said selected sample value, said selected integer value, and said calculated sampling frequency.

3. The method as recited in claim 2 further comprising replacing said selected clock divider value with another clock divider value if available.

4. The method as recited in claim 1 further comprising replacing said selected integer value with another integer value if available.

5. The method as recited in claim 1 further comprising replacing said selected sample value with another sample value if available.

6. The method as recited in claim 1 wherein said constraints include a desired number of determined coherent test conditions, and wherein said method further comprises:

ending said step of determining said coherent test conditions when number of determined coherent test conditions equals desired number of determined coherent test conditions.

7. The method as recited in claim 1 wherein said step of determining said coherent test conditions using said constraints includes:

using undersampling in one or more coherent test conditions associated with capturing an analog signal.

8. A computer-readable medium comprising computer-executable instructions stored therein for implementing a method of determining coherent test conditions, said method comprising:

receiving constraints from a user, wherein said constraints include desired test conditions, desired tolerances for said desired test conditions, and desired instrument;

determining said coherent test conditions using said constraints, wherein said determining said coherent test conditions includes determining a calculated sampling frequency and a calculated analog frequency; and

providing each determined coherent test condition to said user, wherein each determined coherent test condition includes said calculated sampling frequency and said calculated analog frequency,

wherein said constraints include a first range of desired number of samples, wherein said desired conditions include a desired sampling frequency and a desired analog frequency, and wherein said determining said coherent test conditions comprises:

selecting a sample value from said first range;

determining a second range of integer number of cycles for coherency using said sample value, said desired sampling frequency, and said desired analog frequency;

selecting an integer value from said second range;

if said selected sample value and said selected integer value satisfy requirement for coherency, determining an ideal sampling frequency using said selected sample value, said selected integer value, and said desired sampling frequency;

using a clock divider value and said ideal sampling frequency to determine said calculated sampling frequency and said calculated analog frequency; and

retaining said calculated sampling frequency and said calculated analog frequency if fall within desired tolerances.

9. The computer-readable medium as recited in claim 8 wherein said using a clock divider value comprises:

selecting a clock divider value based on said desired instrument;

determining an ideal master clock frequency using said ideal sampling frequency and said selected clock divider;

determining a real master clock frequency using said ideal master clock frequency;

determining said calculated sampling frequency using said real master clock frequency and said selected clock divider; and

determining said calculated analog frequency using said selected sample value, said selected integer value, and said calculated sampling frequency.

10. The computer-readable medium as recited in claim 9 wherein said method further comprises replacing said selected clock divider value with another clock divider value if available.

11. The computer-readable medium as recited in claim 8 wherein said method further comprises replacing said selected integer value with another integer value if available.

12. The computer-readable medium as recited in claim 8 wherein said method further comprises replacing said selected sample value with another sample value if available.

13. The computer-readable medium as recited in claim 8 wherein said constraints include a desired number of determined coherent test conditions, and wherein said method further comprises:

ending said step of determining said coherent test conditions when number of determined coherent test conditions equals desired number of determined coherent test conditions.

14. A system comprising:

a processor; and

a memory unit comprising computer-executable instructions stored therein for implementing a method of determining coherent test conditions, said method comprising:

receiving constraints from a user, wherein said constraints include desired test conditions, desired tolerances for said desired test conditions, and desired instrument;

determining said coherent test conditions using said constraints, wherein said determining said coherent test conditions includes determining a calculated sampling frequency and a calculated analog frequency; and

providing each determined coherent test condition to said user, wherein each determined coherent test condition includes said calculated sampling frequency and said calculated analog frequency,

wherein said constraints include a first range of desired number of samples, wherein said desired conditions include a desired sampling frequency and a desired analog frequency, and wherein said determining said coherent test conditions comprises:

selecting a sample value from said first range;

determining a second range of integer number of cycles for coherency using said sample value, said desired sampling frequency, and said desired analog frequency;

selecting an integer value from said second range;

if said selected sample value and said selected integer value satisfy requirement for coherency, determining an ideal sampling frequency using said selected sample value, said selected integer value, and said desired sampling frequency;

using a clock divider value and said ideal sampling frequency to determine said calculated sampling frequency and said calculated analog frequency; and

retaining said calculated sampling frequency and said calculated analog frequency if fall within desired tolerances.

15. The system as recited in claim 14 wherein said using a clock divider value comprises:

selecting a clock divider value based on said desired instrument;

determining an ideal master clock frequency using said ideal sampling frequency and said selected clock divider;

determining a real master clock frequency using said ideal master clock frequency;

determining said calculated sampling frequency using said real master clock frequency and said selected clock divider; and

determining said calculated analog frequency using said selected sample value, said selected integer value, and said calculated sampling frequency.

16. The system as recited in claim 15 wherein said method further comprises replacing said selected clock divider value with another clock divider value if available.

17. The system as recited in claim 14 wherein said method further comprises replacing said selected integer value with another integer value if available.

18. The system as recited in claim 14 wherein said method further comprises replacing said selected sample value with another sample value if available.

19. The system as recited in claim 14 wherein said constraints include a desired number of determined coherent test conditions, and wherein said method further comprises:

ending said step of determining said coherent test conditions when number of determined coherent test conditions equals desired number of determined coherent test conditions.

Assignments (9)
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS, RECORDED AT REEL 047185, FRAME 0624 Recorded Mar 7, 2024
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS AGENT
To: XCERRA CORPORATION
Reel/Frame 066762/0811 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT STATEMENT THAT THIS DOCUMENT SERVES AS AN OATH/DECLARATION PREVIOUSLY RECORDED ON REEL 047185 FRAME 0628. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT. Recorded Nov 28, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047675/0354 →
PATENT SECURITY AGREEMENT Recorded Oct 2, 2018
From: XCERRA CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 047185/0624 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 7261561 AND REPLACE WITH PATENT NUMBER 7231561 PREVIOUSLY RECORDED ON REEL 034660 FRAME 0188. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT. Recorded Feb 11, 2016
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 037824/0372 →
SECURITY AGREEMENT Recorded Dec 18, 2014
From: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 034660/0188 →
RELEASE OF SECURITY INTEREST IN UNITED STATES PATENTS Recorded Dec 18, 2014
From: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
To: XCERRA CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
Reel/Frame 034660/0394 →
CHANGE OF NAME Recorded May 27, 2014
From: LTX-CREDENCE CORPORATION
To: XCERRA CORPORATION
Reel/Frame 033032/0768 →
SECURITY AGREEMENT Recorded Jan 17, 2014
From: LTX-CREDENCE CORPORATION; EVERETT CHARLES TECHNOLOGIES LLC
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 032086/0476 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2004
From: OBERHAUSER, CHRIS
To: CREDENCE SYSTEMS CORPORATION
Reel/Frame 016117/0165 →