Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber
View Patent ↗A device for testing electronic components such as integrated circuit ICs, under particular pressure conditions, has a pressure test chamber with contact elements which on the one hand are connected to an electronic testing device and on the other hand extend into a cavity of the pressure test chamber. Arranged inside the cavity of the pressure test chamber, there is and air-fight sealing board which extends transversely over the contact elements and is sealed peripherally from an assigned pressure chamber half. By means of the sealing board, first contact element sections are separated air-tightly from second contact element sections but are in electrically conductive connection.
1. A device for testing electronic components, in particular ICs, under particular pressure conditions, comprising:
a dividable pressure test chamber having two pressure chamber halves which can be separated from one another and brought together, and which can be brought into a contact position in which they tightly enclose a cavity,
the pressure test chamber comprising contact elements which extend into the cavity so that contacts of components to be tested, which are arranged in the cavity, can be brought in contact with assigned contact elements,
the contact elements extending through one of the pressure chamber halves and in electrical contact with an electronic testing device, wherein each contact element is subdivided into a first contact element section passing through one of the pressure chamber halves and a second contact element section, which is distanced from the first contact element section and is arranged inside the cavity,
an air-tight sealing board arranged inside the cavity and extending transversely over the contact elements and sealed peripherally from one of the pressure chamber halves, the first contact element sections being arranged on one side of the sealing board and the second contact element sections, lying opposite the first contact element sections, being arranged on the opposite side of the sealing board, and the first contact element sections being electrically connected to the opposite second contact element sections via conductive sections of the sealing board, and
a component specific DUT board arranged inside the cavity between the second contact element sections and third contact element sections, which are distanced from the second contact element sections, and with which the contacts of the components can be brought in contact.
2. The device as claimed in claim 1 , wherein at least the first contact element sections consist of contact pins which are resilient in their longitudinal direction.
3. The device as claimed in claim 1 , wherein the third contact element sections consist of contact pins which are resilient in their longitudinal direction.
4. A system for testing integrated circuit devices having contacts, comprising:
a pressure test chamber comprising mateable first and second chamber portions that can be separated from one another, said first and second chamber portions when brought together into contact with one another tightly enclosing a cavity into which a device under test can be disposed;
plural contact elements extending into the cavity and contacting the contacts of a said device under test;
each of said plural contact elements having a first contact section that passes through said first chamber portion and a second contact section distanced from the first section and disposed within the cavity;
an airtight sealing board disposed within the cavity and sealed peripherally with at least one of the first and second chamber portions, the first contact section being disposed on a first side of the sealing board, the second contact section being disposed on a second side of the sealing board opposite the first side, the first contact section being electrically connected to the second contact section via conductive elements of the sealing board;
a third contact section disposed within the cavity and distanced from the second contact section; and
a component specific device-under-test board disposed within the cavity between the second contact section and the third contact section, with which contacts of the device under test can be brought in contact.