Granted Patent B2

US 7,366,597 · App. 11/187,523 · Granted Apr 29, 2008

Abstract

Claims (52)

1. A vehicle comprising:

a system for validating a variable signal for input to a processor-performed function, said system including a processor, a memory having at least first and second storage locations, and an input module that receives the signal;

wherein said processor:

tests the first and second storage locations;

after said testing, stores the signal in the first and second storage locations to obtain first and second stored values;

compares the first and second stored values;

tests the first stored value for corruption associated with receipt of the signal by said input module;

inputs the first and second stored values to first and second paths for performing the function to obtain two function results; and

compares the results.

2. The vehicle of claim 1 wherein said input module comprises at least one of the following: an analog-to-digital converter, a pulse-width modulation (PWM) converter, a controller area network (CAN) bus, a local interconnect network (LIN) bus, a device using serial peripheral interface (SPI), a device using frequency encoding, a device using scalable coherent interface (SCI), a dual-port memory, and a device using single-edge nibble transmission (SENT).

3. The vehicle of claim 1 wherein said processor performs a March-C test to test the first and second storage locations.

4. A method of validating a variable input to a function performed using a processor and a memory, said method comprising:

testing first and second storage locations in the memory;

delivering an input signal to the tested storage locations to obtain first and second stored values;

comparing the first stored value with the second stored value;

inputting the first and second stored values to first and second paths for performing the function to obtain two function results; and

comparing the results.

5. The method of claim 4 further comprising:

receiving the input signal; and

testing the first stored value for one or more faults associated with said receiving.

6. The method of claim 5 further comprising performing a remedial action based on a result of at least one of said testing and comparing steps.

7. The method of claim 6 wherein performing a remedial action comprises delivering a default input to the function.

8. The method of claim 5 wherein testing the first stored value for one or more faults comprises testing for corruption associated with a sensor read.

9. The method of claim 4 wherein testing first and second storage locations comprises performing a March-C test on the locations.

10. The method of claim 4 wherein testing first and second storage locations comprises testing for a coupling fault.

11. The method of claim 4 , wherein said first and second stored values comprise complementary values.

12. A method of validating a variable signal input to a function performed using a processor and a memory, said method comprising:

receiving the signal;

testing first and second storage locations in the memory;

delivering the received signal to the tested storage locations to obtain first and second stored values;

testing the first stored value for any corruption associated with said receiving step;

inputting the first and second stored values to first and second paths for performing the function to obtain two function results; and

comparing the results.

13. The method of claim 12 further comprising comparing the first stored value with the second stored value.

14. The method of claim 13 further comprising performing a remedial action based on a result of at least one of said testing and comparing steps.

15. The method of claim 14 wherein performing a remedial action comprises delivering a default input to the function.

16. The method of claim 13 wherein testing the first stored value for any corruption comprises testing for one or more faults associated with a sensor read.

17. The method of claim 12 wherein testing first and second storage locations comprises performing a March-C test on the locations.

18. The method of claim 12 wherein testing first and second storage locations comprises testing for a coupling fault.

19. The method of claim 12 , wherein said first and second stored values comprise complementary values.

20. A system for validating a variable signal input to a function performed using a processor and a memory, said system comprising:

a processor;

memory;

an input module that receives the signal; and

first and second storage locations of the memory which are tested for a coupling fault and which receive the signal from the input module as first and second stored values;

wherein said system:

compares the first stored value with the second stored value;

inputs the first and second stored values to first and second paths for performing the function to obtain two function results; and

compares the results.

21. The system of claim 20 wherein said memory comprises a random access memory.

22. The system of claim 20 wherein said first and second storage locations of the memory receive the signal from the input module after being tested.

23. The system of claim 20 wherein said input module comprises at least one of the following: an analog-to-digital converter, a pulse-width modulation (PWM) converter, a controller area network (CAN) bus, a local interconnect network (LIN) bus, a device using serial peripheral interface (SPI), a device using frequency encoding, a device using scalable coherent interface (SCI), a dual-port memory, and a device using single-edge nibble transmission (SENT).

Assignments (12)