Radiation-tolerant integrated circuit device and method for fabricating
View Patent ↗An enhanced shallow trench isolation method for fabricating radiation tolerant integrated circuit devices is disclosed. A layer of pad oxide is first deposited on a semiconductor substrate. A layer of pad nitride is then deposited on the pad oxide layer. A trench is defined within the semiconductor substrate by selectively etching the pad nitride layer, the pad oxide layer, and the semiconductor substrate. Boron ions are then implanted into both the bottom and along the sidewalls of the trench. Subsequently, a trench plug is formed within the trench by depositing an insulating material into the trench and by removing an excess portion of the insulating material. A p-well is implanted to a depth just below the depth of the bottom of the trench. This helps to keep the threshold voltage of the IC device below the trench at a high level, and thereby keep post-radiation leakage low. Then, an electrically neutral species is implanted into the wafer.
1. A method comprising:
forming, in a substrate, a trench to provide isolation between two adjacent active regions;
implanting boron ions into bottom and sidewalls of the trench to provide a high pre-radiation threshold voltage beneath and along the sidewalls of the trench;
filling the trench with dielectric material;
forming, in the substrate, a p-well proximate but not beneath the trench;
forming, in the p-well, an n-channel device in one of the two adjacent active regions such that the n-channel device extends from a surface of the substrate to a first depth; and
blanket implanting an electrically-neutral material into the surface of the substrate to a depth less than the first depth.
2. The method of claim 1 , wherein said implanting boron ions comprises implanting with a dose of boron ions in a range between approximately 10 10 atoms/cm 2 and 10 13 atoms/cm 2 .
3. The method of claim 1 , wherein said forming a p-well comprises implanting a p-type material to a depth greater than the bottom of the trench.
4. A method comprising:
forming, in a substrate, a trench to provide isolation between two adjacent active regions;
implanting boron ions into bottom and sidewalls of the trench to provide a high pre-radiation threshold voltage beneath and along the sidewalls of the trench;
filling the trench with dielectric material;
forming, in the substrate, a p-well proximate but not beneath the trench;
forming, in the p-well, an n-channel device in one of the two adjacent active regions such that the n-channel device extends from a surface of the substrate to a first depth;
forming a p-channel device in the substrate;
forming a mask over the p-channel device; and
implanting an electrically-neutral material into unmasked portions of the substrate to a depth less than the first depth.
5. The method of claim 4 , wherein said implanting boron ions comprises implanting with a dose of boron ions in a range between approximately 10 13 atoms/cm 2 and 10 13 atoms/cm 2 .
6. The method of claim 4 , wherein said forming a p-well comprises implanting a p-type material to a depth greater than the bottom of the trench.
7. The method of claim 4 , wherein said forming a p-well comprises implanting boron ions to a depth greater than the bottom of the trench.
8. The method of claim 4 , wherein said forming a p-well comprises implanting indium ions to a depth greater than the bottom of the trench.
9. The method of claim 4 , wherein said implanting boron ions comprises implanting of boron ions with an energy no greater than about 20 KeV.
10. The method of claim 4 , wherein said implanting boron ions comprises:
a first implanting of boron ions at an angle in the range of 0° to 7° from normal; and
a second implanting of boron ions at an angle in the range of 30° to 45° from normal.
11. The method of claim 4 , wherein said implanting an electrically-neutral material comprises implanting germanium into the unmasked portions of the substrate.
12. The method of claim 4 , wherein said implanting an electrically-neutral material comprises implanting germanium into the unmasked portions of the substrate with a dosage level of around 10 13 atom/cm 2 or higher.
13. The method of claim 1 , wherein said implanting boron ions comprises implanting of boron ions with an energy no greater than about 20 KeV.
14. The method of claim 1 , wherein said implanting boron ions comprises:
a first implanting of boron ions at an angle in the range of 0° to 7° from normal; and
a second implanting of boron ions at an angle in the range of 30° to 45° from normal.
15. The method of claim 1 , wherein said implanting an electrically-neutral material comprises implanting germanium into the substrate.
16. The method of claim 1 , wherein said implanting an electrically-neutral material comprises implanting germanium into the substrate with a dosage level of around 10 13 atom/cm 2 or higher.
17. An apparatus comprising:
a substrate;
a trench filled with a dielectric material to provide isolation between two adjacent active regions, wherein a bottom and sidewalls of the trench are implanted with boron ions;
a p-well formed in the substrate and proximate but not beneath the trench;
an n-channel device formed in the p-well and one of the two adjacent active regions, wherein the n-channel device extends from a surface of the substrate to a first depth; and
a radiation hardening layer of electrically-neutral material implanted in the p-well to a depth less than the first depth.
18. The apparatus of claim 17 , wherein the p-well is formed to a depth greater than the bottom of the trench.
19. The apparatus of claim 17 , wherein the boron ions have a concentration between approximately 10 13 atoms/cm 2 and 10 13 atoms/cm 2 .
20. The apparatus of claim 17 , wherein said radiation hardening layer comprises implanted germanium with a dosage level of around 10 13 atom/cm 2 or higher.
21. The apparatus of claim 17 , further comprising:
a p-channel device formed in the substrate;
wherein the p-channel device extends from a surface of the substrate to a second depth; and
wherein the depth of the radiation hardening layer is less than the second depth.