X-ray detecting devices and apparatus for analyzing a sample using the same
View Patent ↗X-ray detecting devices and apparatus for analyzing a sample using the same are disclosed. A disclosed X-ray detecting device has an X-ray detector to detect X-rays emitted from a sample. The X-ray detector includes a collimator to collimate the X-rays, an electron trap to remove electrons included in the collimated X-rays, a window to transmit the X-rays and defining an interior space of the X-ray detector, a crystal to receive the X-rays which pass through the window and to generate a corresponding electric current, a field effect transistor to generate a signal in response to the electric current, and a vacuum pump to create a vacuum within the interior of the X-ray detector containing the field effect transistor and the crystal to suppress noise associated with at least one of the crystal and/or the field effect transistor.
1. An X-ray detecting device having an X-ray detector to detect X-rays emitted from a sample, the X-ray detecting device comprising:
a collimator to collimate X-rays emitted from the sample;
an electron trap to remove some of the electrons included in the collimated X-rays;
a window to transmit the X-rays and defining an interior space of the X-ray detector;
a crystal to receive the X-rays which pass through the window and to generate a corresponding electric current;
a field effect transistor to generate a signal in response to the electric current associated with the crystal; and
a vacuum pump to create a vacuum within the interior of the X-ray detector enclosing the field effect transistor and the crystal to suppress noise associated with at least one of the crystal or the field effect transistor, wherein the vacuum pump comprises a turbo molecular pump (TMP).
2. An apparatus comprising:
a chamber containing a vacuum;
a stage disposed in the chamber to hold a sample;
a scanning electron microscope to perform structural analysis, the scanning electron microscope being positioned to bombard electrons on a surface of the sample and to detect back-scattered electrons and secondary electrons; and
an X-ray detector to perform compositional analysis, the X-ray detector comprising the X-ray detector of claim 1 and being at least partially disposed in the chamber to detect X-rays created by the bombardment of the electrons.
3. An apparatus as defined in claim 2 , wherein the vacuum created within the interior of the X-ray detector is substantially the same as the vacuum within the chamber.