IP Library › Granted Patent US 8,183,877
Granted Patent B2
US 8,183,877 · App. 11/237,544 · Granted May 22, 2012

Material for probe pins

Assignee: Tanaka Kikinzoku Kogyo K.K.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,183,877
App. No.
11/237,544
Granted
May 22, 2012
Kind
B2
Abstract

Probe pins related to the present invention are formed from a material which consists essentially of one or more elements selected from the group consisting of platinum, iridium, ruthenium, osmium, palladium and rhodium. A material obtained by adding one or more elements selected from the group consisting of tungsten, nickel and cobalt to this metal may also be used.

Claims (2)

1. A probe pin formed from an alloy, said alloy consisting essentially of 20 to 30% by weight of nickel, and the balance platinum; which probe pin has a Vickers hardness of not less than 300 and not more than 600.

2. A probe card comprising probe pins according to claim 1 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 28, 2005
From: TANAKA, KUNIHIRO
To: TANAKA KIKINZOKU KOGYO K.K.
Reel/Frame 017054/0972 →
Priority Claims (1)
JP P2005-059926 · Mar 4, 2005 · national
Continuity (1)
Related Publication 20060197542A1 · Sep 7, 2006