Method and apparatus for measuring test coverage
View Patent ↗A method, computer program product, and data processing system for determining test sequences' coverage of events in testing a semiconductor design are disclosed. Test patterns are randomly generated by one or more “frontend” computers. Results from applying these patterns to the design under test are transmitted to a “backend” computer in the form of an ordered dictionary of events and bitmap and/or countmap data structures. A “bitmap” data structure encodes Boolean information regarding whether or not a given event was covered by a particular test sequence. A “countmap” data structure includes frequency information indicating how many times a given event was triggered by a particular test sequence. The backend computer combines results from each test sequence in a cumulative fashion to measure the overall coverage of the set of test sequences.
1. A computer-implemented method comprising:
obtaining a first test result vector corresponding to a first test pattern applied to a design under test, wherein the first test result vector indicates coverage of one or more events triggered by the first test pattern;
obtaining a second test result vector corresponding to a second test pattern applied to the design under test, wherein the second test result vector indicates coverage of one or more events triggered by the second test pattern; and
merging coverage data from at least the first test result vector and the second test result vector to obtain a merged event coverage vector, wherein the merged event coverage vector is smaller in size than a juxtaposition of the first test result vector and the second test result vector and wherein the merged event coverage vector indicates coverage of events triggered by at least the first test pattern and the second test pattern, and wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a Boolean value representing whether a corresponding event was covered.
2. The method of claim 1 , wherein the merging comprises performing a logical-OR of corresponding entries from the first test result vector and the second test result vector to obtain the plurality of entries in the merged event coverage vector.
3. The method of claim 1 , wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a numerical value representing a number of times a corresponding event was covered.
4. The method of claim 3 , wherein the merging comprises arithmetically adding entries from the first test result vector and the second test result vector to obtain the plurality of entries in the merged event coverage vector.
5. The method of claim 1 , further comprising:
obtaining an event dictionary wherein events represented in the first test result vector and the second test result vector are correlated to the event dictionary.
6. The method of claim 5 , wherein the event dictionary is an ordered collection of event identifiers and the first test result vector and the second test result vector are correlated to the event dictionary by presenting entries corresponding to events in a same order as that of the event dictionary.
7. The method of claim 1 , wherein the first test result vector is obtained from a first computer system and the second test result vector is obtained from a second computer system.
8. The method of claim 7 , wherein the first test result vector and the second test result vector are obtained from the first computer system and the second computer system asynchronously.
9. The method of claim 7 , further comprising:
obtaining a third test result vector; and
merging the third test result vector into the merged coverage result vector.
10. A computer program product in a computer-readable medium comprising functional descriptive material that, when executed by a computer, directs the computer to perform actions of:
obtaining a first test result vector corresponding to a first test pattern applied to a design under test, wherein the first test result vector indicates coverage of one or more events triggered by the first test pattern;
obtaining a second test result vector corresponding to a second test pattern applied to the design under test, wherein the second test result vector indicates coverage of one or more events triggered by the second test pattern; and
merging coverage data from at least the first test result vector and the second test result vector to obtain a merged event coverage vector, wherein the merged event coverage vector is smaller in size than a juxtaposition of the first test result vector and the second test result vector and wherein the merged event coverage vector indicates coverage of events triggered by at least the first test pattern and the second test pattern, and wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a Boolean value representing whether a corresponding event was covered.
11. The computer program product of claim 10 , wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a numerical value representing a number of times a corresponding event was covered.
12. The computer program product of claim 10 , comprising additional functional descriptive material that, when executed by a computer, directs the computer to perform actions of:
obtaining an event dictionary wherein events represented in the first test result vector and the second test result vector are correlated to the event dictionary.
13. The computer program product of claim 12 , wherein the event dictionary is an ordered collection of event identifiers and the first test result vector and the second test result vector are correlated to the event dictionary by presenting entries corresponding to events in a same order as that of the event dictionary.
14. The computer program product of claim 10 , wherein the first test result vector is obtained from a first computer system and the second test result vector is obtained from a second computer system.
15. The computer program product of claim 14 , wherein the first test result vector and the second test result vector are obtained from the first computer system and the second computer system asynchronously.
16. A data processing system comprising:
one or more processors;
at least one data store associated with the one or more processors; and
a set of instructions contained in the at least one data store, wherein the one or more processors executes the set of instructions to perform actions of:
obtaining a first test result vector corresponding to a first test pattern applied to a design under test, wherein the first test result vector indicates coverage of one or more events triggered by the first test pattern;
obtaining a second test result vector corresponding to a second test pattern applied to the design under test, wherein the second test result vector indicates coverage of one or more events triggered by the second test pattern; and
merging coverage data from at least the first test result vector and the second test result vector to obtain a merged event coverage vector, wherein the merged event coverage vector is smaller in size than a juxtaposition of the first test result vector and the second test result vector and wherein the merged event coverage vector indicates coverage of events triggered by at least the first test pattern and the second test pattern, and wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a Boolean value representing whether a corresponding event was covered.
17. The data processing system of claim 16 , wherein the merged event coverage vector contains a plurality of entries and each of the plurality of entries is a numerical value representing a number of times a corresponding event was covered.