Real time target topography tracking during laser processing
View Patent ↗An efficient method of and a system for performing topography measurement facilitates increasing laser machining throughput. Topography measurements at multiple points on a target specimen or continuous real time measurement and monitoring of the target specimen surface topography and target specimen thickness can be performed during a laser machining process. Measurement of the thickness of the target specimen to be laser machined would permit fine tuning of laser energy delivered and result in higher quality target material removal.
1. A system for laser machining a target specimen having a surface, comprising:
a laser source and objective lens cooperating to produce a machining laser beam that has an image column and propagates along a machining beam axis for incidence on the target specimen, the objective lens and the target specimen being separated by an axial distance;
a beam positioning system operable to change the axial distance and to move the machining laser beam and target specimen relative to each other in a direction along a machining beam path to process the target specimen at selected locations;
a tracking device positioned in non-contacting relationship with the surface of the target specimen and in operative association with the machining laser beam to lead the machining laser beam during the relative movement in the direction along the machining beam path, the tracking device operable to repeatedly measure in real time a distance between the surface of the target specimen and the objective lens during the relative movement and produce a signal corresponding to the distance measured; and
a laser controller cooperating with the beam positioning system and responding to the signal to set the axial distance separating the objective lens and the target specimen during the relative movement to control the position of the image column relative to the target specimen at the selected locations, and to deliver controlled amounts of energy of the machining laser beam for incidence on the target specimen at the selected locations in correspondence to the axial distance set.
2. The system of claim 1 , in which the tracking device comprises a laser triangulation device.
3. The system of claim 1 , in which the target specimen comprises a sequential lamination target that includes a layer of electrically conductive material and in which the tracking device comprises a capacitance probe.
4. The system of claim 1 , in which the target specimen comprises a sequential lamination target that includes a layer of electrically conductive material and in which the tracking device comprises an eddy current probe.
5. The system of claim 1 , in which the tracking device comprises a confocal measurement device.
6. The system of claim 1 , in which the target specimen comprises a sequential lamination target that includes a layer of dielectric material positioned adjacent a layer of electrically conductive material.
7. The system of claim 6 , in which the tracking device emits a tracking laser beam and the dielectric layer is at least partly transparent to the tracking laser beam and has a thickness, and further comprising a laser beam position sensor that receives a portion of the tracking laser beam propagating through the dielectric layer and reflected by the electrically conductive layer to provide an indication of the thickness of the dielectric layer.
8. The system of claim 7 , in which the machining laser beam is in the form of a stream of machining laser pulses and in which the laser controller causes delivery for incidence on the dielectric layer at each of the selected locations a number of machining laser pulses that are based on a determination of the thickness of the dielectric layer at the selected location.
9. The system of claim 1 , in which the tracking device emits a tracking laser beam and includes a laser beam position sensor, the target specimen comprises a sequential lamination target that includes an upper layer that is at least partly transparent to the tracking laser beam, and a portion of the tracking laser beam reflects off of the upper layer for incidence on the laser beam position sensor to produce the signal.
10. The system of claim 1 , in which the tracking device emits a tracking laser beam, and further comprising a laser beam position sensor, the axial distance determined by the displacement of reflection of the tracking laser beam from a projected path, as measured by the laser beam position sensor.
11. The system of claim 1 , in which the target specimen includes a layer of material that has a thickness and into which a via is to be formed, the machining laser beam is in the form of a stream of machining laser pulses, and the tracking device and the laser controller cooperate to deliver to the target specimen a number of machining laser pulses that are based on a determination of the thickness of the layer to form the via.
12. The system of claim 1 , in which the machining laser beam is in the form of a stream of machining laser pulses and in which the laser controller causes delivery to the target specimen a number of machining laser pulses that are based on the repeated measurements by the tracking device.
13. The system of claim 1 , in which the relative movement takes place in either a forward or a reverse direction along the machining beam path, and in which the tracking device constitutes a first tracking device, and further comprising a second tracking device positioned in non-contacting relationship with the surface of the target specimen, the first and second tracking devices operatively associated with the laser machining beam such that different ones of them lead the laser machining beam in the forward and reverse directions along the machining beam path.
14. The system of claim 1 , in which:
the target specimen comprises a sequential lamination target that includes a first layer of optically nontransparent material positioned adjacent a second layer of electrically conductive material, the first layer having a first surface and being separated by a first axial distance from the objective lens, and the second layer having a second surface and being separated by a second axial distance from the objective lens; and
the tracking device constitutes a first tracking device that comprises a laser triangulation device, and further comprising a second tracking device that comprises either a capacitance probe or an eddy current probe, the first and second tracking devices measuring, respectively, the first and second axial distances during the relative movement between the machining beam and the target specimen.
15. A method of accomplishing quality control of vias formed by a machining laser beam produced by a system for forming vias in a sequential lamination target having upper dielectric and electrically conductive surfaces, the system including a laser source and a laser beam positioning mechanism, the laser source emitting a laser beam propagating along a beam axis through an objective lens to produce the machining laser beam, the machining laser beam having a focused beam column, the laser beam positioning system imparting relative motion to the sequential lamination target and the machining laser beam to enable it to remove target material and thereby form vias at selected locations of the sequential lamination target, and the objective lens being positionable relative to the sequential lamination target to establish an axial distance in a direction along the beam axis to position the focused beam column of the machining laser beam on or within the sequential lamination target, comprising:
directing a tracking laser beam for incidence on the sequential lamination target to track the terrain of the upper dielectric surface, the tracking laser beam incident on the sequential lamination target separating into first and second beam portions reflecting off the dielectric surface and the electrically conductive surface, the first and second beam portions being spatially separated by a separation distance corresponding to the thickness of the dielectric surface;
positioning a beam position sensor to receive the first and second beam portions and produce a signal indicative of the separation distance;
setting the axial distance between the objective lens and the sequential lamination target in response to the signal to maintain in real time the focused beam column of the machining beam on or within the thickness of the dielectric layer; and
delivering controlled amounts of energy of the machining laser beam for incidence on the sequential lamination target at the selected locations in correspondence to the axial distance set, thereby to control variations in the vias being formed.
16. A method of laser machining a target specimen having a target surface, the system including a laser source and a laser beam positioning mechanism, the laser source emitting a laser beam propagating along a beam axis through an objective lens to produce the machining laser beam, the machining laser beam having a focused beam column, the laser beam positioning system imparting relative motion to the target specimen and the machining laser beam to enable it to remove target material at selected locations of the target specimen, and the objective lens being positionable relative to the target specimen to establish an axial distance in a direction along the beam axis to position the focused beam column of the machining laser beam on or within the target specimen, comprising:
positioning a tracking device in non-contacting relationship with the target surface of the target specimen to track the terrain of the target surface, the tracking device repeatedly measuring in real time a distance between the target surface and the objective lens during the relative motion to produce a signal corresponding to the distance measured;
setting the axial distance between the objective lens and the target specimen in response to the signal to maintain in real time the focused beam column of the machining beam on or within the target specimen; and
delivering controlled amounts of energy of the machining laser beam for incidence on the target specimen at the selected locations in correspondence to the axial distance set, thereby to control variations in the removal of target material at the selected locations.
17. The system of claim 16 , in which the tracking device comprises a laser triangulation device.
18. The system of claim 16 , in which the target specimen comprises a sequential lamination target that includes a layer of electrically conductive material and in which the tracking device comprises a capacitance probe.
19. The system of claim 16 , in which the target specimen comprises a sequential lamination target that includes a layer of electrically conductive material and in which the tracking device comprises an eddy current probe.
20. The system of claim 16 , in which the tracking device comprises a confocal measurement device.
21. The method of claim 16 , in which the tracking device emits a tracking laser beam and in which the target specimen comprises a sequential lamination target that includes a first layer of material positioned adjacent a second layer of material, the first layer having a thickness and being transparent to the tracking laser beam, and the second layer reflecting of the tracking laser beam, and further comprising:
causing the tracking laser beam to propagate through the first layer for reflection by the second layer;
providing a laser beam position sensor that receives a portion of the tracking laser beam propagating through the first layer and reflected by the second layer to provide an indication of the thickness of the first layer;
producing as the machining laser beam a stream of machining laser pulses to establish the controlled amounts of energy of the machining laser beam; and
delivering for incidence on the target specimen at each of the selected locations a number of the machining laser pulses that are based on a determination of the thickness of the first layer at the selected location.
22. The method of claim 21 , in which the first layer comprises a dielectric material.
23. The method of claim 21 , in which the second layer comprises an electrically conductive material.
24. The method of claim 16 , in which the tracking device emits a tracking laser beam and in which the target specimen comprises a sequential lamination target that includes a top layer of material that is partly transparent to and partly reflects the tracking laser beam, and further comprising:
directing the tracking laser beam for incidence on and partial reflection by the top layer; and
providing a laser beam position sensor that receives a portion of the tracking laser beam partly reflected by the top layer to produce the signal corresponding to the distance measured.
25. The method of claim 24 , in which the top layer comprises a dielectric material.