IP Library Granted Patent US 7,985,958
Granted Patent B2
US 7,985,958 · App. 11/268,603 · Granted Jul 26, 2011

Electron beam drawing apparatus, deflection amplifier, deflection control device, electron beam drawing method, method of manufacturing semiconductor device, and electron beam drawing program

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Quick Facts
Patent No.
US 7,985,958
App. No.
11/268,603
Granted
Jul 26, 2011
Kind
B2
Abstract

According to an aspect of the invention, there is provided an electron beam drawing apparatus comprising at least one stage of a deflection amplifier and a deflection unit, a first storage section which stores shot information at a drawing time, a second storage section which stores a correction table indicating a relation between the shot information and an output voltage of the deflection amplifier, and an adjusting section which adjusts an output of the deflection amplifier based on the correction table stored in the second storage section and the shot information stored in the first storage section.

Claims (19)

1. An electron beam drawing apparatus comprising:

at least one stage of a deflection amplifier;

a deflection unit configured to deflect an electron beam for performing electron beam drawing based on a voltage supplied from the deflection amplifier;

a first storage section which stores shot information at a drawing time;

a second storage section which stores a correction table indicating a relation between a temperature information of the deflection amplifier and the output voltage of the deflection amplifier; and

an adjusting section which adjusts the output voltage of the deflection amplifier based on the correction table stored in the second storage section and the shot information stored in the first storage section.

2. The electron beam drawing apparatus according to claim 1 , wherein the deflection amplifier and the deflection unit comprise a main deflection amplifier, a main deflection unit, a sub-deflection amplifier, and a sub-deflection unit,

the first storage section stores the shot information in a sub-deflection area at the drawing time,

the second storage section stores the correction table indicating a relation between the shot information in the sub-deflection area and the output voltage of the main deflection amplifier; and

the adjusting section adjusts the output voltage of the main deflection amplifier based on the correction table stored in the second storage section, and the shot information stored in the first storage section.

3. An electron beam drawing apparatus comprising:

at least one stage of a deflection amplifier;

a deflection unit configured to deflect an electron beam for performing electron beam drawing based on an output voltage supplied from the deflection amplifier;

a temperature sensor disposed in the deflection amplifier, wherein the temperature sensor measures a temperature of the deflection amplifier;

a first storage section which stores temperature information supplied from the temperature sensor;

a second storage section which stores a correction table indicating a relation between a temperature of the deflection amplifier and the output voltage of the deflection amplifier; and

an adjusting section which adjusts the output voltage of the deflection amplifier based on a correction table stored in the second storage section and the temperature information stored in the first storage section.

4. The apparatus according to claim 3 , wherein the deflection amplifier includes an analog section and a digital section, and wherein the temperature sensor is disposed in the analog section and senses a temperature of the analog section.

5. A deflection amplifier comprising: a temperature sensor disposed in a main internal component; a first storage section which stores temperature information of the temperature sensor; a second storage section which stores a correction table indicating a relation between an internal temperature and an output voltage; and an adjusting section which adjusts an output based on the correction table stored in the second storage section and the temperature information stored in the first storage section.

Assignments (5)
MERGER Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
CHANGE OF NAME AND ADDRESS Recorded Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 4, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 045433/0337 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 17, 2006
From: NAKASUGI, TETSURO; TAWARAYAMA, KAZUO; MIZUNO, HIROYUKI; OTA, TAKUMI; SASAKI, NORIAKI; HIGASHIKI, TATSUHIKO; KOSHIBA, TAKESHI; MAGOSHI, SHUNKO
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 017694/0035 →