IP Library Granted Patent US 7,355,244
Granted Patent B2
US 7,355,244 · App. 11/277,222 · Granted Apr 8, 2008

Electrical devices with multi-walled recesses

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Quick Facts
Patent No.
US 7,355,244
App. No.
11/277,222
Granted
Apr 8, 2008
Kind
B2
Abstract

The invention relates to a vertical transistor and an oxidation process that achieves a substantially curvilinear recess bottom. The recess serves as the gate receptacle that may facilitate a more uniform gate oxide layer. One embodiment relates to a storage cell that is disposed in the recess along with an electrode. Another embodiment relates to a system that includes the vertical transistor or the vertical storage cell.

Claims (43)

1. An electric device, comprising:

a substrate;

a recess in the substrate, the recess being defined by a vertical sidewall and a bottom surface, the bottom surface comprising a horizontal first surface and an inclined, planar second surface intermediate the first surface and the sidewall, the bottom surface including a transition layer intermediate the substrate and a gate dielectric, the transition layer including silicon-deuterium;

a dielectric layer in the recess; and

a conductive layer over the dielectric layer.

2. The electric device of claim 1 , wherein the transition layer includes silicon-hydrogen.

3. The electric device of claim 2 , wherein the dielectric layer includes at least one of a refractory metal oxide, a silicon oxynitride and a silicon nitride.

4. The electric device of claim 1 , wherein the first surface is flat, and wherein the second surface is flat.

5. The electric device of claim 4 , wherein the first surface is at a bottom of the recess.

6. The electric device of claim 1 , wherein the second surface includes a first edge adjacent the first surface and a second edge adjacent the sidewall, the second edge being above the first edge.

7. An electronic device, comprising:

a substrate including a recess defined by a plurality of non-horizontal, planar surfaces, wherein the non-horizontal surfaces are slanted from horizontal, the recess including no horizontal surfaces, the non-horizontal surfaces including a transition layer, the transition layer including at least one of deuterium and hydrogen;

a dielectric layer over the non-horizontal surfaces; and

a conductive layer over the dielectric layer.

8. The electronic device of claim 7 , wherein the substrate includes silicon.

9. The electronic device of claim 7 , wherein the substrate includes an N+ doped source adjacent the recess and an N+ doped drain adjacent the recess.

10. The electronic device of claim 7 , wherein the plurality of surfaces are all non-parallel.

11. The electronic device of claim 7 , wherein the plurality of surfaces are each non-vertical, wherein the non-vertical surfaces are slanted from vertical.

12. The electronic device of claim 7 , wherein a first surface of the plurality of surfaces adjacent a bottom of the recess has an angle relative to horizontal less than a second surface of the plurality of surfaces, the second surface being closer to a top surface of the substrate.

13. An electronic device, comprising:

a substrate including a top surface;

a recess extending downwardly from the top surface, the recess being bound by a plurality of non-horizontal, planar surfaces, wherein the non-horizontal surfaces are slanted from horizontal, the recess including no horizontal surfaces, wherein a first surface of the plurality of surfaces adjacent a bottom of the recess has an angle relative to horizontal less than a second surface of the plurality of surfaces, the second surface being closer to a top surface of the substrate;

a dielectric layer in the recess and extending onto the top surface; and

a conductive layer extending into the recess and on the dielectric layer.

14. The electronic device of claim 13 , wherein the conductive layer is a floating gate.

15. The electronic device of claim 14 , wherein an intergate dielectric is on the floating gate, and wherein a control is on the intergate dielectric.

16. The electronic device of claim 15 , wherein the substrate includes a first doped region adjacent the recess and a second doped region adjacent the recess.

17. The electronic device of claim 16 , wherein the first region and second region are P doped.

18. An electronic device, comprising:

a substrate including a recess defined by a plurality of non-horizontal, planar surfaces, wherein the non-horizontal surfaces are slanted from horizontal, wherein the non-horizontal surfaces include a transition layer including at least one of deuterium and hydrogen;

a dielectric layer over the non-horizontal surfaces; and

a conductive layer over the dielectric layer.

19. The electronic device of claim 18 , wherein the substrate includes silicon.

20. The electronic device of claim 18 , wherein the substrate includes an N+ doped source adjacent the recess and an N+ doped drain adjacent the recess.

21. The electronic device of claim 18 , wherein the plurality of surfaces are each non-vertical, wherein the non-vertical surfaces are slanted from vertical.

22. The electronic device of claim 18 , wherein a first surface of the plurality surfaces adjacent a bottom of the recess has an angle relative to horizontal less than a second surface of the plurality surfaces, the second surface being closer to a top surface of the substrate.

23. An electronic device, comprising:

a substrate including a recess defined by a plurality of non-horizontal, planar surfaces, wherein the non-horizontal surfaces are slanted from horizontal, wherein the plurality of surfaces are all non-parallel, a first surface of the plurality of surfaces adjacent a bottom of the recess having an angle relative to horizontal less than a second surface of the plurality of surfaces, the second surface being closer to a top surface of the substrate;

a dielectric layer over the non-horizontal surfaces; and

a conductive layer over the dielectric layer.

24. The electronic device of claim 23 , wherein the non-horizontal surfaces include a transition layer.

25. The electronic device of claim 23 , wherein the substrate includes an N+ doped source adjacent the recess and an N+ doped drain adjacent the recess.

26. The electronic device of claim 23 , wherein the plurality of surfaces are each non-vertical, wherein the non-vertical surfaces are slanted from vertical.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →