IP Library Granted Patent US 7,548,323
Granted Patent B2
US 7,548,323 · App. 11/284,559 · Granted Jun 16, 2009

Displacement and flatness measurements by use of a laser with diffractive optic beam shaping and a multiple point sensor array using the back reflection of an illuminating laser beam

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Quick Facts
Patent No.
US 7,548,323
App. No.
11/284,559
Granted
Jun 16, 2009
Kind
B2
Abstract

A laser beam system for measuring an aspect of a surface wherein a laser beam is reshaped into a corrected shaped laser beam having a corrected energy profile and subsequently reshaped into a measurement shaped laser beam having an measurement energy profile shaped to be effected by the at least one aspect of the surface. The measurement shaped laser beam is reflected from the surface, being modified by the aspect of interest of the surface, and to a sensor array wherein the sensors measure the reflected laser beam to determine the aspect of interest of the surface.

Claims (20)

1. A laser measurement system for determining at least one aspect of a surface, comprising:

a laser generating a laser beam,

a beam shape corrector for reshaping the laser beam into a corrected shaped laser beam having a corrected energy profile,

a measurement shaping element for reshaping the corrected shaped laser beam into a measurement shaped laser beam having an measurement energy profile shaped to be effected by the at least one aspect of the surface,

a sensor array for receiving the measurement shaped laser beam after the measurement shaped laser beam has been reflected from the surface and modified by the at least one aspect of the surface, wherein the sensor array includes a plurality of sensors for receiving and measuring corresponding portions a reflected laser beam from the surface,

the measured corresponding portions of the reflected laser beam indicate the aspect of the surface,

a plurality of sensor arrays for determining a corresponding plurality of the at least one aspect of the surface,

a multi-way splitter in the path of the reflected laser beam for directing a corresponding part of the reflected laser beam to a correspond one of the plurality of sensor arrays,

the at least one aspect of the surface includes at least one of a tilt of the surface, a curvature of the surface, a warning of the surface, a distortion of the surface and a distance of the surface from the sensor array, and

the measurement enemy profile and the plurality of sensors of the sensor array are selected according to the at least one aspect of the surface to the determined.

2. A laser measurement system for determining at least one aspect of a surface, comprising:

a laser generating a laser beam,

a beam shape corrector for reshaping the laser beam into a corrected shaped laser beam having a corrected energy profile,

a measurement shaping element for reshaping the corrected shaped laser beam into a measurement shaped laser beam having an measurement energy profile shaped to be effected by the at least one aspect of the surface,

a sensor array for receiving the measurement shaped laser beam after the measurement shaped laser beam has been reflected from the surface and modified by the at least one aspect of the surface, wherein

the sensor array includes a plurality of sensors for receiving and measuring corresponding portions of reflected laser beam from the surface, and wherein

the measured corresponding portions of the reflected laser beam indicate the aspect of the surface,

the laser generates an elliptical laser beam,

the beam shape corrector reshapes the laser beam into a corrected shaped laser beam having a corrected enemy profile wherein the corrected energy profile is one of a Gaussian energy profile and a Flat Top energy profile, and

the measurement shaping element for reshaping the corrected shaped laser beam into the measurement shaped laser beam having an measurement energy profile shaped to be effected by the at least one aspect of the surface reshapes the corrected shaped laser beam into a circular ring of laser light having a specific working distance.

Assignments (3)
CHANGE OF NAME Recorded Apr 3, 2014
From: HITACHI VIA MECHANICS, LTD.
To: VIA MECHANICS, LTD.
Reel/Frame 032600/0580 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 14, 2013
From: WINTON, JEFFREY; NOWIK, JOSEPH; SRIDHARAN, SRI
To: RADIONIC INDUSTRIES, INC
Reel/Frame 031407/0171 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 5, 2005
From: LIZOTTE, TODD E.
To: HITACHI VIA MECHANICS, LTD.
Reel/Frame 016853/0112 →