IP Library Granted Patent US 7,719,013
Granted Patent B2
US 7,719,013 · App. 11/289,292 · Granted May 18, 2010

Semiconductor light emitting device and method of manufacturing the same

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Quick Facts
Patent No.
US 7,719,013
App. No.
11/289,292
Granted
May 18, 2010
Kind
B2
Abstract

A semiconductor light emitting device and a method of manufacturing the semiconductor light emitting device are provided. The semiconductor light emitting device includes a substrate, at least two light emitting cells located on the substrate and formed by stacking semiconductor material layers, a reflection layer and a transparent insulating layer sequentially stacked between the light emitting cells, and a transparent electrode covering the upper surface of the light emitting cells.

Claims (22)

1. A light emitting device comprising:

a substrate;

at least two light emitting cells located on the substrate to be in contact with the upper surface of the substrate and having semiconductor material layers including a lower semiconductor material layer, an active layer and an upper semiconductor material layer sequentially grown on the substrate;

stacked layers including a reflection layer formed on an entire area of the substrate between the light emitting cells, and a transparent insulating layer formed on an entire upper surface of the reflection layer, wherein a first side of the stacked layers contacts one of the two light emitting cells and a second side of the stacked layers contacts another of the two light emitting cells; and

a transparent electrode covering an entire area of the upper surface of the light emitting cells.

2. The light emitting device of claim 1 the semiconductor material layers further comprising a buffer layer between the substrate and the lower semiconductor material layer.

3. The light emitting device of claim 1 , wherein the sum of the thicknesses of the transparent insulating layer and the reflection layer is greater than the thickness of the light emitting cell.

4. The light emitting device of claim 1 , wherein the transparent insulating layer is thicker than the reflection layer.

5. The light emitting device of claim 1 , wherein a ratio of a thickness to a width of the light emitting cell is greater than or equal to a tangent of a total internal reflection angle of the transparent insulating layer with respect to the light emitting cell.

6. The light emitting device of claim 1 , wherein the substrate is formed of silicon Si.

7. The light emitting device of claim 1 , wherein the transparent insulating layer has a lower refractive index than a semiconductor material layer that constitutes the light emitting cell.

8. The light emitting device of claim 1 , wherein the transparent insulating layer is formed of at least one of SiO 2 , SiN x , Al 2 O 3 , HfO, ZrO, TiO 2 , and ZnO.

9. The light emitting device of claim 1 , wherein the transparent electrode is formed of one of a metal and a transparent conductive material (TCO).

10. The light emitting device of claim 9 , wherein the metal is one of Au, Pd, Pt, Ru, and Ni.

11. The light emitting device of claim 9 , wherein the TCO is one of ZnO and indium oxide.

12. The light emitting device of claim 11 , wherein the indium oxide further comprises at least one element selected from the group consisting of Mg, Ag, Zn, Sc, Hf, Zr, Te, Se, Ta, W, Nb, Cu, Si, Ni, Go, Mo, Cr, Mn, Hg, Pr, and one component of the La group.

13. The light emitting device of claim 1 , wherein the reflection layer is formed of a metal layer.

14. The light emitting device of claim 1 , wherein the reflection layer is formed of a plurality of dielectric layers.

15. The light emitting device of claim 1 , wherein the reflection layer is formed of a plurality of stacked layers in which one or more pairs of a metal layer and a dielectric layer are repeatedly stacked.

16. The light emitting device of claim 1 the semiconductor material layers further comprising a GaN layer between the substrate and the lower semiconductor material layer.

17. The light emitting device of claim 16 the semiconductor material layers further comprising a buffer layer between the substrate and the GaN layer.

18. The light emitting device of claim 2 , wherein the buffer layer is a III-V group nitride semiconductor layer of the GaN group.

Assignments (2)
MERGER Recorded Aug 7, 2012
From: SAMSUNG LED CO., LTD.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 028744/0272 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 22, 2010
From: SAMSUNG ELECTRO-MECHANICS CO., LTD.
To: SAMSUNG LED CO., LTD.
Reel/Frame 024723/0532 →