Substrate processing apparatus
View Patent ↗When a first substrate transferred outwardly from an indexer cell is the last substrate prior to reticle change in an exposure apparatus, the outward transfer of a second substrate to be processed subsequently to the first substrate from the indexer cell is temporarily stopped. After a lapse of time corresponding to reticle replacement time, the outward substrate transfer is restarted, and the second substrate is transferred outwardly from the indexer cell. For the exposure apparatus, the second substrate subjected to a resist coating process is received at the instant when the reticle replacement is completed after the completion of the exposure process of the first substrate. This provides a constant time interval between the completion of the resist coating process of substrates and the execution of the exposure process thereof without the decrease in processing efficiency. As a result, a uniform processing history for the substrates is achieved to further improve the line width uniformity of a pattern.
1. A substrate processing apparatus for transporting a substrate with a resist film formed thereon by coating the substrate with a resist into an exposure apparatus and for performing a development process on an exposed substrate received from the exposure apparatus, said substrate processing apparatus comprising:
a coating processing part for performing a resist coating process on a substrate;
a development processing part for performing a development process on an exposed substrate;
an interface part for receiving a substrate with a resist film formed thereon by said resist coating process from said coating processing part to transfer said substrate to an exposure apparatus, and for receiving an exposed substrate from said exposure apparatus to transfer said exposed substrate to said development processing part;
an indexer part for transferring an unprocessed substrate received from the outside of said substrate processing apparatus outwardly therefrom to said coating processing part, and for transporting a processed substrate received from said development processing part to the outside of said substrate processing apparatus;
a transport part for transporting a substrate between said coating processing part, said development processing part, said interface part and said indexer part; and
a control part configured to control said transport part to provide a constant time interval between the completion of said resist coating process of substrates in said coating processing part and the execution of an exposure process of said substrates in said exposure apparatus.
2. The substrate processing apparatus according to claim 1 , wherein
when a reticle for use in the exposure process of a first substrate is different from a reticle for use in the exposure process of a second substrate to be processed subsequently to said first substrate, said indexer part transfers said second substrate outwardly therefrom at the instant when reticle replacement time in said exposure apparatus has elapsed since the outward transfer of said first substrate from said indexer part.
3. The substrate processing apparatus according to claim 2 , further comprising
a heating processing part for performing a heating process on an exposed substrate yet to be subjected to the development process,
wherein said control part controls said transport part to provide a constant time interval between the completion of the exposure process of substrates in said exposure apparatus and the execution of the heating process of said substrates in said heating processing part.