IP Library Granted Patent US 7,525,140
Granted Patent B2
US 7,525,140 · App. 11/304,649 · Granted Apr 28, 2009

Integrated thin film capacitors with adhesion holes for the improvement of adhesion strength

Assignee: Intel Corporation
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Quick Facts
Patent No.
US 7,525,140
App. No.
11/304,649
Granted
Apr 28, 2009
Kind
B2
Abstract

In an embodiment, a substrate includes a thin film capacitor embedded within. In an embodiment, a plurality of adhesion holes extend through the thin film capacitor. These adhesion holes may improve the adhesion of the capacitor to other portions of the substrate.

Claims (43)

1. A device comprising:

a base;

a first insulating layer on said base;

a first electrode on said first insulating layer;

a dielectric film on said first electrode;

a second electrode on said dielectric film; and

a second insulating layer on said second electrode,

wherein:

an adhesion hole set extends in a vertical direction through said first electrode, said dielectric film, and said second electrode;

a portion of said second insulating layer contacts said first insulating layer within said adhesion hole set;

said first insulating layer and said second insulating layer fill said adhesion hole set to the exclusion of any other material;

said first electrode, said dielectric film, and said second electrode form a structure having a cross-sectional area lying in a horizontal dimension that is substantially perpendicular to the vertical direction;

the cross-sectional area is bounded by a perimeter, and

said adhesion hole set is entirely contained within said perimeter.

2. The device of claim 1 , wherein said first insulating layer and said second insulating layer comprise the same material.

3. The device of claim 1 , wherein said adhesion hole set consists of one adhesion hole.

4. The device of claim 3 , wherein

a cross-sectional shape of said one adhesion hole is selected from the group consisting of circular, square, rectangular, diamond, and triangular.

5. The device of claim 1 , wherein the thickness of said first electrode is in the range from 10 to 100 microns.

6. The device of claim 1 , wherein the thickness of said dielectric film is in the range from 1 to 5 microns.

7. The device of claim 1 , wherein the thickness of said second electrode is in the range from 10 to 20 microns.

8. The device of claim 1 , wherein said adhesion hole set comprises a uniform pitch.

9. An electronic package comprising:

a device having a capacitor coupled to a substrate;

a first material above said capacitor;

a second material below said capacitor;

a microprocessor die coupled to a first side of said device; and

a motherboard coupled to a second side of said device,

wherein:

said capacitor extends in a vertical direction between said first material and said second material;

the capacitor has a cross-sectional area lying in a horizontal dimension that is substantially perpendicular to the vertical direction;

the cross-sectional area is bounded by a perimeter;

said capacitor comprises an adhesion hole set, said adhesion hole set being entirely contained within the perimeter of said cross-sectional area; and

said first material and said second material:

contact each other through said adhesion hole set; and

fill said adhesion hole set to the exclusion of any other material.

10. The electronic package of claim 9 , wherein said adhesion hole set comprises a first adhesion hole and a second adhesion hole.

11. The electronic package of claim 10 , wherein the area of said first adhesion hole is greater than the area of said second adhesion hole.

12. The electronic package of claim 10 , wherein the shape of said first adhesion hole is similar to the shape of said second adhesion hole.

13. The device of claim 9 ,wherein

the capacitor further comprises a first electrode, a second electrode over the first electrode, and a dielectric film between the first electrode and the second electrode;

the device further comprises a via; and

the via extends through the substrate, the first electrode, the dielectric film, and the second electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 27, 2006
From: MIN, YONGKI; GUZEK, JOHN
To: INTEL CORPORATION
Reel/Frame 017598/0628 →
Continuity (1)
Related Publication 20070132063A1 · Jun 14, 2007