Redundancy substitution method, semiconductor memory device and information processing apparatus
View Patent ↗A redundancy substitution method for memory cells within an electrically writable and erasable semiconductor memory device, includes detecting a memory cell having a tendency of a charge loss and/or a charge gain, by use of a charge loss detecting reference cell and/or a charge gain detecting reference cell. The charge loss detecting reference cell has a threshold value set between a threshold value of a read reference cell and a threshold value of a write verify reference cell that is higher than that of the read reference cell, and the charge gain detecting reference cell has a threshold value set between the threshold value of the read reference cell and a threshold value of an erase verify reference cell that is lower than that of the read reference cell. The method subjects a memory cell whose tendency of the charge loss and/or the charge gain is detected to a redundancy substitution.
1. A redundancy substitution method for memory cells within an electrically writable and erasable semiconductor memory device, comprising the steps of:
detecting a memory cell having a tendency of a charge loss and/or a charge gain, by use of a charge loss detecting reference cell and/or a charge gain detecting reference cell, said charge loss detecting reference cell having a threshold value set between a threshold value of a read reference cell and a threshold value of a write verify reference cell that is higher than that of the read reference cell, said charge gain detecting reference cell having a threshold value set between the threshold value of the read reference cell and a threshold value of an erase verify reference cell that is lower than that of the read reference cell; and
subjecting to a redundancy substitution a memory cell whose tendency of the charge loss and/or the charge gain is detected.
2. The redundancy substitution method as claimed in claim 1 , wherein the threshold value of the charge loss detecting reference cell is set to a position such that a deviation from a threshold value distribution of a normal write memory cell towards a lower threshold value side is detectable and a normal read is possible within ranges of a guaranteed temperature and a guaranteed voltage that guarantee normal operation of the semiconductor memory device.
3. The redundancy substitution method as claimed in claim 1 , wherein the threshold value of the charge gain detecting reference cell is set to a position such that a deviation from a threshold value distribution of a normal erase memory cell towards a higher threshold value side is detectable and a normal read is possible within ranges of a guaranteed temperature and a guaranteed voltage that guarantee normal operation of the semiconductor memory device.
4. The redundancy substitution method as claimed in claim 1 , wherein the charge loss and/or the charge gain are/is detected simultaneously as the reading from the memory cell.
5. The redundancy substitution method as claimed in claim 4 , further comprising the steps of:
setting a flag when the charge loss and/or the charge gain of the memory cell are/is detected, and storing address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected,
wherein said subjecting step substitutes the memory cell whose address and data are stored by the redundant memory cell in response to a redundancy substitution instruction issued from an external apparatus that checks the flag.
6. The redundancy substitution method as claimed in claim 1 , wherein said detecting step detects the charge loss and/or the charge gain of the memory cell by reading from all of the memory cells in response to an external self-diagnosis instruction from outside the semiconductor memory device.
7. The redundancy substitution method as claimed in claim 1 , wherein said detecting step detects the charge loss and/or the charge gain of the memory cell by reading from all of the memory cells when a power of the semiconductor memory device is turned ON or when the semiconductor memory device is reset.
8. The redundancy substitution method as claimed in claim 6 or 7 , further comprising the steps of:
setting a flag when the charge loss and/or the charge gain of the memory cell are/is detected, and storing address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected,
wherein said subjecting step substitutes the memory cell whose address and data are stored by the redundant memory cell when the flag is set after the reading from all of the memory cells ends.
9. An electrically writable and erasable semiconductor memory device comprising:
a plurality of memory cells;
a plurality of redundant memory cells;
a read reference cell;
a charge loss detecting reference cell having a threshold value set between a threshold value of the read reference cell and a threshold value of a write verify reference cell that is higher than that of the read reference cell;
a charge gain detecting reference cell having a threshold value set between the threshold value of the read reference cell and a threshold value of an erase verify reference cell that is lower than that of the read reference cell;
a detecting part configured to detect a memory cell having a tendency of a charge loss and/or a charge gain, based on an output of the charge loss detecting reference cell and/or an output of the charge gain detecting reference cell; and
a redundancy substitution part configured to substitute a memory cell with respect to which the charge loss and/or the charge gain are/is detected by one of the redundant memory cells.
10. The semiconductor memory device as claimed in claim 9 , wherein the threshold value of the charge loss detecting reference cell is set to a position such that a deviation from a threshold value distribution of a normal write memory cell towards a lower threshold value side is detectable and a normal read is possible within ranges of a guaranteed temperature and a guaranteed voltage that guarantee normal operation of the semiconductor memory device.
11. The semiconductor memory device as claimed in claim 9 , wherein the threshold value of the charge gain detecting reference cell is set to a position such that a deviation from a threshold value distribution of a normal erase memory cell towards a higher threshold value side is detectable and a normal read is possible within ranges of a guaranteed temperature and a guaranteed voltage that guarantee normal operation of the semiconductor memory device.
12. The semiconductor memory device as claimed in claim 1 , wherein the detecting part detects the charge loss and/or the charge gain are/is simultaneously as the reading from the memory cell.
13. The semiconductor memory device as claimed in claim 12 , wherein the redundancy substitution part sets a flag when the charge loss and/or the charge gain of the memory cell are/is detected, and the semiconductor memory device further comprises:
a register configured to store address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected.
14. The semiconductor memory device as claimed in claim 9 , wherein said detecting part detects the charge loss and/or the charge gain of the memory cell by reading from all of the memory cells in response to an external self-diagnosis instruction from outside the semiconductor memory device.
15. The semiconductor memory device as claimed in claim 9 , wherein said detecting part detects the charge loss and/or the charge gain of the memory cell by reading from all of the memory cells when a power of the semiconductor memory device is turned ON or when the semiconductor memory device is reset.
16. The semiconductor memory device as claimed in claim 14 or 15 , wherein the detecting part sets a flag when the charge loss and/or the charge gain of the memory cell are/is detected, and further comprising:
a register configured to store address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected,
wherein the redundancy substitution part substitutes the memory cell whose address and data are stored in the register by the redundant memory cell when the flag is set after the reading from all of the memory cells ends.
17. An information processing apparatus comprising:
a CPU; and
an electrically writable and erasable semiconductor memory device,
said semiconductor memory device comprising:
a plurality of memory cells;
a plurality of redundant memory cells;
a read reference cell;
a charge loss detecting reference cell having a threshold value set between a threshold value of the read reference cell and a threshold value of a write verify reference cell that is higher than that of the read reference cell;
a charge gain detecting reference cell having a threshold value set between the threshold value of the read reference cell and a threshold value of an erase verify reference cell that is lower than that of the read reference cell;
a detecting part configured to detect a memory cell having a tendency of a charge loss and/or a charge gain, based on an output of the charge loss detecting reference cell and/or an output of the charge gain detecting reference cell; and
a redundancy substitution part configured to substitute a memory cell with respect to which the charge loss and/or the charge gain are/is detected by one of the redundant memory cells.
18. The information processing apparatus as claimed in claim 17 , wherein:
the semiconductor memory device further comprises a register configured to store address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected; and
the redundancy substitution part substitutes the memory cell whose address and data are stored in the register by the redundant memory cell in response to a redundancy substitution instruction issued from an external apparatus that checks the flag.
19. The information processing apparatus as claimed in claim 17 , wherein:
the semiconductor memory device further comprises a register configured to store address and data of the memory cell with respect to which the charge loss and/or the charge gain are/is detected; and
the detecting part detects the charge loss and/or the charge gain of the memory cell by reading from all of the memory cells in response to an external self-diagnosis instruction from outside the semiconductor memory device.
20. The information processing apparatus as claimed in claim 17 , wherein the CPU and the semiconductor memory device are integrally provided.