Fabrication system and fabrication method

1. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter for processing semiconductor wafers comprising the steps of:

processing a plurality of the semiconductor wafers contained in a first carrier by the first processing apparatus with a first predetermined process parameter according to the managing information;

monitoring a result of processing in the first processing apparatus;

transporting said first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing the semiconductor wafers processed in the second processing apparatus according to the managing information; and

processing a plurality of the semiconductor wafers contained in the first carrier by the second processing apparatus with a second predetermined parameter according to the managing information;

wherein the second predetermined process parameter in the second processing apparatus is adjusted in view of the monitored result of processing in the first processing apparatus.

2. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter for processing semiconductor wafers and an inter-apparatus transporter comprising the steps of:

processing a plurality of the semiconductor wafers contained in a first carrier by the first processing apparatus wit a first predetermined process parameter according to the managing information;

monitoring a result of processing in the first processing apparatus;

transporting said first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing the semiconductor wafers processed in the second processing apparatus according to the managing information; and

processing a plurality of the semiconductor wafers contained in the first carrier by the second processing apparatus with a second predetermined parameter according to the managing information;

wherein the second predetermined process parameter in the second processing apparatus is adjusted in view of the monitored result of processing in the first processing apparatus.

3. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading plural semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of plural semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of plural semiconductor wafers with the inter-apparatus transporter, and at least one computer storing scheduling information of processing of a plurality of semiconductor wafers comprising the steps of;

processing the plurality of the semiconductor wafers contained in a first carrier by the first processing apparatuses by processing at least one of the semiconductor wafers contained in the first carrier with a predetermined process condition according to the scheduling information;

monitoring a result of the processing of said at least one of the plurality of the semiconductor wafers in the first processing apparatus;

transporting said first carrier containing the at least one of the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and

processing the at least one of the plurality of the semiconductor wafers contained in the first carrier by the second processing apparatuses with a second predetermined parameter according to the managing information;

wherein the second predetermined process parameter in the second processing apparatus is adjusted in view of the monitored result of processing in the first processing apparatus.

4. A fabricating method comprising the steps of:

processing semiconductor wafers by at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter, each of the first and second processing apparatuses processing at least one of a plurality of semiconductor wafers contained in a first cater with a predetermined process parameter according to the managing information;

monitoring a result of processing of the at least one of the semiconductor wafers in the first processing apparatus;

transporting said first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and

feed forwarding a monitored result of the processing in the first processing apparatus to the second processing apparatus so as to modify the predetermined process parameter in the second processing apparatus based on the monitored result of processing in the first processing apparatus.

5. A fabricating method for a fabricating system including at least first and second processing apparatuses, each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter comprising the steps of;

processing a plurality of the semiconductor wafers contained in a first carrier by the first processing apparatus with a predetermined process condition according to the managing information;

monitoring a result of processing of the one of semiconductor wafers in the first processing apparatus;

transporting said first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and;

determining a process condition of a plurality of the semiconductor wafers contained in the first carrier in the second processing apparatus based on the monitored result of processing in the first processing apparatus.

6. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a lot being constituted of a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter comprising the steps of;

processing the lot of the semiconductor wafers by said first processing apparatus with a predetermined process condition according to the managing information;

processing the tot processed in the first processing apparatus by said second processing apparatus with a predetermined process condition according to the managing information;

monitoring a result of processing of the lot of the semiconductor wafers in the first processing apparatus;

transporting a first carrier containing the lot of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and

adjusting the process condition of the plurality of the semiconductor wafers constituting the lot in the second processing apparatus based on the monitored result of processing of at least the one of the plurality of the semiconductor wafers constituting the lot in the first processing apparatus.

7. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter, comprising the steps of;

processing a plurality of the semiconductor wafers by said first processing apparatus with a predetermined process condition according to the managing information;

monitoring a result of processing of at least one of the plurality of semiconductor wafers in the first processing apparatus;

transporting a first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of the-a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and

determining a process condition of the plurality of the semiconductor wafers in the second processing apparatus based on the monitored result of processing of the at least one of the plurality of the semiconductor wafers in the first processing apparatus.

8. A fabricating method for a fabricating system including at least first and second processing apparatuses each being provided with at least a processing chamber and an interface for loading and unloading a plurality of semiconductor wafers contained in a carrier, an inter-apparatus transporter, and at least one computer storing managing information of processing of the semiconductor wafers with the at least first and second processing apparatuses and managing information of transporting of the semiconductor wafers with the inter-apparatus transporter for processing semiconductor wafers comprising the steps of:

processing a plurality of the semiconductor wafers contained in a first carrier in the first processing apparatus with a first predetermined process parameter according to the managing information;

monitoring a result of processing of at least one of the semiconductor wafers in the first processing apparatus;

transporting a first carrier containing the plurality of the semiconductor wafers having been processed in the first processing apparatus toward the second processing apparatus by the inter-apparatus transporter prior to unloading of a second carrier containing semiconductor wafers processed in the second processing apparatus according to the managing information; and

processing the plurality of the semiconductor wafers contained in the first carrier by the second processing apparatus with a second predetermined parameter according to the managing information;

wherein the second predetermined process parameter in the second processing apparatus is adjusted in view of the monitored result of processing in the first processing apparatus.