IP Library Granted Patent US 7,575,954
Granted Patent B2
US 7,575,954 · App. 11/323,269 · Granted Aug 18, 2009

Ceramic substrate and method of breaking same

Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.; Hon Hai Precision Industry Co., Ltd.
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Quick Facts
Patent No.
US 7,575,954
App. No.
11/323,269
Granted
Aug 18, 2009
Kind
B2
Abstract

A ceramic substrate ( 100 ) includes a top surface, a plurality of identification marks ( 104 ), a protective compound ( 110 ), a bottom surface, and a plurality of grooves ( 106 ). The top surface includes a first area and a second area. The first area is defined at one or more edges portions of the top surface. The second area is defined inside the first area. The identification marks are arranged on the first area. The protective compound is covered on the second area. The grooves are defined at the bottom surface, and corresponding to the identification marks. A related method for breaking a ceramic substrate includes: (a) pasting one or more tapes on the first area; (b) covering protective compound on the second area; (c) removing the tapes; (d) cutting the protective compound according to the identification marks; and (e) breaking the ceramic substrate into individual circuit unit pieces along the grooves.

Claims (33)

1. A ceramic substrate breaking method, wherein the ceramic substrate comprises a top surface and a bottom surface, the top surface defining a first area located at one or more edge portions thereof and a second area located inside the first area, a plurality of identification marks arranged on the first area, the bottom surface defining a plurality of grooves corresponding to the identification marks, the method comprising the steps of:

(a) covering a protective compound on the second area of the top surface of the ceramic substrate;

(b) cutting the protective compound according to the identification marks on the top surface of the ceramic substrate; and

(c) breaking the ceramic substrate into individual circuit unit pieces along the grooves.

2. The ceramic substrate breaking method as recited in claim 1 , wherein the second area of the ceramic substrate has a plurality of circuit units embedded thereat.

3. The ceramic substrate breaking method as recited in claim 1 , wherein step (a) comprises:

(a 1 ) pasting one or more tapes on the first area of the top surface of the ceramic substrate;

(a 2 ) covering the protective compound on the second area of the top surface of the ceramic substrate; and

(a 3 ) removing the tapes.

4. The ceramic substrate breaking method as recited in claim 1 , wherein a cutting depth in step (b) is substantially equal to or greater than a thickness of the protective compound.

5. The ceramic substrate breaking method as recited in claim 1 , wherein a depth of the grooves is approximately equal to 1 / 5 a thickness of the ceramic substrate or greater than 1 / 5 the thickness of the ceramic substrate.

6. The ceramic substrate breaking method as recited in claim 1 , wherein step (a) comprises:

(a 11 ) covering the protective compound on the top surface of the ceramic substrate;

(a 22 ) cutting the protective compound along one or more borders between the first area and the second area of the top surface of the ceramic substrate; and

(a 33 ) removing the protective compound from the first area in order to expose the identification marks.

7. The ceramic substrate breaking method as recited in claim 6 , wherein a cutting depth in step (a 22 ) is substantially equal to or greater than a thickness of the protective compound.

8. A ceramic substrate breaking method, wherein the ceramic substrate comprises a top surface and a bottom surface, the top surface defining a first area located at one or more edge portions thereof, and a second area located inside the first area, a plurality of identification marks arranged on the first area, a plurality of circuit units embedded at the second area, the bottom surface defining a plurality of grooves corresponding to the identification marks, wherein at least two of the identification marks correspond to clearances between adjacent circuit units, the method comprising the steps of:

(a) pasting one or more tapes on the first area of the top surface of the ceramic substrate;

(b) covering the protective compound on the second area of the top surface of the ceramic substrate;

(c) removing the tapes;

(d) cutting the protective compound according to the identification marks; and

(e) breaking the ceramic substrate into individual circuit unit pieces along the grooves at the bottom surface of the ceramic substrate.

9. The ceramic substrate breaking method as recited in claim 8 , wherein a cutting depth in step (d) is approximately equal to or greater than a thickness of the protective compound.

10. The ceramic substrate breaking method as recited in claim 8 , wherein a depth of the grooves is approximately equal to 1 / 5 a thickness of the ceramic substrate or greater than 1 / 5 the thickness of the ceramic substrate.

11. A method for breaking a ceramic substrate with circuit units therein comprising:

defining a first area at one surface of said ceramic substrate without circuit units located therein, and a second area at said one surface of said ceramic substrate with said circuit units spreading therein, a plurality of identification marks arranged on said first area to indicate breaking directions for separating said circuit units;

forming a plurality of V-shaped grooves corresponding to said plurality of identification marks on another surface of said ceramic substrate opposite to said one surface thereof;

after forming said plurality of V-shaped grooves, covering a protective compound on said second area of said one surface of said ceramic substrate by revealing said plurality of identification marks on said first area of said one surface;

cutting said protective compound to form cuffing grooves according to said plurality of identification marks revealed on said first area; and

breaking said ceramic substrate into pieces for separating said circuit units along said cutting grooves.

12. The method as recited in claim 11 , wherein said plurality of identification marks on said first area are revealed by pasting tapes on said first area before said protective compound covers said second area.

13. The method as recited in claim 11 , wherein said plurality of identification marks on said first area are revealed by removing said protective compound applied on said first area after said protective compound covers said second area.

14. The method as recited in claim 11 , wherein each of said plurality of identification marks corresponds to a clearance between adjacent circuit units.

Assignments (4)
CHANGE OF NAME Recorded Jul 23, 2014
From: AMBIT MICROSYSTEMS (ZHONGSHAN) LTD.
To: SHUNSIN TECHNOLOGY (ZHONG SHAN) LIMITED
Reel/Frame 033394/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2013
From: HON HAI PRECISION INDUSTRY CO., LTD.; HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.
To: AMBIT MICROSYSTEMS (ZHONGSHAN) LTD.
Reel/Frame 030416/0723 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 11, 2009
From: HON HAI PRECISION INDUSTRY CO., LTD.
To: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.; HON HAI PRECISION INDUSTRY CO., LTD.
Reel/Frame 022667/0554 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2005
From: KONG, XIAO-HUA
To: HON HAI PRECISION INDUSTRY CO., LTD.
Reel/Frame 017434/0908 →
Priority Claims (1)
CN 2005 1 0033911 · Mar 29, 2005 · national
Continuity (1)
Related Publication 20060223228A1 · Oct 5, 2006