IP Library Patent Application 11336898
Patent Application
App. No. 11/336,898

Metal film vapor phase deposition method and vapor phase deposition apparatus

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Quick Facts
Patent No.
US None
App. No.
11/336,898
Abstract

A copper film vapor phase deposition method includes the steps of exposing high-purity copper to a plasma of a gas containing chlorine gas to etch the high-purity copper, thereby generating active Cu x Cl y , wherein x is 1 to 3, y is 1 to 3, gas, and forming a copper film by transporting the Cu x Cl y gas onto the surface of a substrate to be processed. By using inexpensive high-purity copper and inexpensive chlorine, hydrogen chloride, or chlorine and hydrogen as source gases, a copper film containing no residual impurity such as carbon and having high film quality can be formed with high reproducibility.

Claims (23)

1 . A copper film vapor phase deposition apparatus, comprising:

a reactor vessel in which a substrate to be processed is placed;

high-purity copper set in said reactor vessel to oppose said substrate;

a gas supply pipe inserted into said reactor vessel to supply a gas containing a gas selected from the group consisting of chlorine gas and hydrogen chloride gas to the vicinity of said high-purity copper;

plasma generating means for generating a plasma of a material selected from the group consisting of chlorine and hydrogen chloride in the vicinity of said high-purity copper in said reactor vessel; and

exhausting means for exhausting a gas in said reactor vessel.

2 . An apparatus according to claim 1 , wherein said high-purity copper has the shape of a plate.

3 . An apparatus according to claim 1 , further comprising:

first temperature control means for controlling the temperature of said high-purity copper.

4 . An apparatus according to claim 1 , further comprising:

second temperature control means for controlling the temperature of said substrate.

5 . A copper film vapor phase deposition apparatus, comprising:

a reactor vessel in which a substrate to be processed is placed;

high-purity copper set in said reactor vessel to oppose said substrate;

a first gas supply pipe inserted into said reactor vessel to supply a gas containing chlorine to the vicinity of said high-purity copper;

a second gas supply pipe inserted into said reactor vessel to supply hydrogen to the vicinity of said high-purity copper;

plasma generating means for generating a plasma of chlorine and hydrogen in the vicinity of said high-purity copper in said reactor vessel; and

exhausting means for exhausting a gas in said reactor vessel.

6 . An apparatus according to claim 5 , wherein said high-purity copper has the shape of a plate.

7 . An apparatus according to claim 5 , further comprising:

first temperature control means for controlling the temperature of said high-purity copper.

8 . An apparatus according to claim 5 , further comprising:

second temperature control means for controlling the temperature of said substrate.

Assignments (3)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME FROM CANON AVELVA CORPORATION TO CANON ANELVA CORPORATION PREVIOUSLY RECORDED ON REEL 021915 FRAME 0398. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Dec 31, 2008
From: PHYZCHEMIX CORPORATION
To: CANON ANELVA CORPORATION
Reel/Frame 022059/0972 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2008
From: PHYZCHEMIX CORPORATION
To: CANON AVELVA CORPORATION
Reel/Frame 021915/0398 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 26, 2007
From: MITSUBISHI HEAVY INDUSTRIES, LTD.
To: PHYZCHEMIX CORPORATION
Reel/Frame 019218/0371 →