Memory device and control method therefor
View Patent ↗An access identification circuit ( 4 ) identifies a first access operation or a second access operation and outputs an identification signal S. During the first access operation, stored data is read out after detecting a column address CADD, a burst address, and updating a word line to newly select memory cells MC. In the second access operation, the memory cells MC connected to the common word line which has been selected are selected by sequentially switching column selector switches. Operating condition information Dx (DAx and/or DBx) used for setting a load condition in a dummy load circuit ( 5 ) and/or setting a pulse width for an equalize signal EQ in an amplification control circuit ( 6 ) is stored in each of first and second storage sections ( 1, 2 ) that are provided for the first and second access operations, respectively. The operating condition information Dx is selected by a selector circuit ( 3 ) in response to the identification signal S and fed to the dummy load circuit ( 5 ) and/or the amplification control circuit ( 6 ). A suitable operating condition is selected for each of the access operations.
1. A memory device which performs a continuous readout operation including a first access operation for performing a data readout operation including selection of at least one memory cell as a readout target and a second access operation for performing data readout operations to continuously read data from the at least one memory cell which has already been selected in the first access operation, the memory device comprising:
a first storage section storing first load information on the load to be applied to a reference data readout path during the first access operation; and
a second storage section storing second load information on the load to be applied to the reference data readout path during the second access operation.
2. The memory device in accordance with claim 1 , further comprising:
a plurality of capacitive load switch elements; and
a plurality of capacitive elements coupled to the plurality of capacitive load switch elements for connection to the reference data readout path therethrough,
wherein combinations of the capacitive load switch elements to be activated are controlled in accordance with the first and second load information.
3. The memory device in accordance with claim 1 , further comprising:
a plurality of resistive load switch elements; and
a plurality of resistive elements to be bypassed by the plurality of resistive load switch elements,
wherein combinations of the resistive load switch elements to be activated are controlled in accordance with the first and second load information.
4. The memory device in accordance with claim 1 , further comprising:
a plurality of capacitive load switch elements;
a plurality of capacitive elements coupled to the plurality of capacitive load switch elements for connection to the reference data readout path therethrough;
a plurality of resistive load switch elements; and
a plurality of resistive elements to be bypassed by the resistive load switch elements,
wherein combinations of the capacitive load switch elements to be activated and the resistive load switch elements to be activated are controlled in accordance with the first and second load information.
5. The memory device in accordance with claim 1 further comprising an access identifying section for receiving an address signal for selecting the memory cell from which data is read out and for identifying the first access operation and the second access operation in response thereto.
6. The memory device in accordance with claim 5 , wherein the access identifying section identifies the memory cell as the readout target by selection of a word line during the first access operation, and the address signal selecting the memory cell connected to the same word line is a column address signal.
7. The memory device in accordance with claim 6 , wherein the identification during the first access operation is performed in response to the column address signal.
8. The memory device in accordance with claim 6 , wherein the continuous readout operation is a burst operation comprising latency times, and
wherein the first and second storage sections store the first and second load information or the first and second precharge time information at each of the latency times.
9. A memory device which performs a continuous readout operation including a first access operation for performing a data readout operation including selection of at least one memory cell as a readout target and a second access operation for performing data readout operations to continuously read data from the at least one memory cell which has already been selected in the first access operation, the memory device comprising:
a first storage section storing first precharge time information corresponding to a precharge time for a data readout path and a reference data readout path during the first access operation; and
a second storage section storing second precharge time information corresponding to a precharge time for the data readout path and the reference data readout path during the second access operation.
10. The memory device in accordance with claim 9 further comprising:
a timer section which determines the precharge time,
the timer section comprising:
a plurality of capacitive load switch elements; and
a plurality of capacitive elements to be connected to the timer section through the capacitive load switch elements,
wherein combinations of the capacitive load switch elements are activated in accordance with the first and second precharge time information.
11. The memory device in accordance with claim 9 further comprising:
a timer section which determines the precharge time,
the timer section comprising:
a plurality of resistive load switch elements; and
a plurality of resistive elements to be connected to the timer section through the resistive load switch elements,
wherein combinations of the resistive load switch elements are activated in accordance with the first and second precharge time information.
12. The memory device in accordance with claim 9 further comprising:
a timer section which determines the precharge time, the timer section comprising:
a plurality of capacitive load switch elements;
a plurality of capacitive elements to be connected to the timer section through the capacitive load switch elements;
a plurality of resistive load switch elements; and
a plurality of resistive elements to be connected to the timer section through the resistive load switch elements,
wherein combinations of the capacitive load switch elements and the resistive load switch elements are activated in accordance with the first and second precharge time information.
13. The memory device in accordance with claim 9 further comprising an access identifying section for receiving an address signal for selecting the memory cell from which data is read out and for identifying the first access operation and the second access operation in response thereto.
14. The memory device in accordance with claim 13 , wherein the access identifying section identifies the memory cell as the readout target by selection of a word line during the first access operation, and the address signal selecting the memory cell connected to the same word line is a column address signal.
15. The memory device in accordance with claim 14 , wherein the identification during the first access operation is performed in response to the column address signal.
16. The memory device in accordance with claim 14 , wherein the continuous readout operation is a burst operation comprising latency times, and
wherein the first and second storage sections store the first and second load information or the first and second precharge time information at each of the latency times.
17. A control method for a memory device which performs a continuous readout operation including a first access operation for performing a data readout operation including selecting at least one memory cell as a readout target and a second access operation for performing data readout operations to continuously read data from the at least one memory cell which has already been selected in the first access operation, the method comprising the steps of:
in the first access operation, setting a load to be applied to a reference data readout path based on first load information stored in the memory device; and
in the second access operation, setting a load to be applied to the reference data readout path based on second load information stored in the memory device.
18. The control method for the memory device in accordance with claim 17 further comprising the step of identifying the first and second access operations in response to an address signal which selects the memory cell from which data is read out.
19. A control method for a memory device which performs a continuous readout operation including a first access operation for performing a data readout operation including selecting at least one memory cell as a readout target and a second access operation for performing data readout operation to continuously read data from the at least one memory cell which has already been selected in the first access operation, the method comprising the steps of:
in the first access operation, setting a precharge time for a data readout path and a reference data readout path based on first precharge time information stored in the memory device; and
in the second access operation, setting a precharge time for the data readout path and the reference data readout path based on second precharge information stored in the memory device.
20. The control method for the memory device in accordance with claim 19 further comprising the step of identifying the first and second access operations in response to an address signal which selects the memory cell from which data is read out.