Method and apparatus for source synchronous testing
View Patent ↗A method and apparatus for source synchronous testing have been disclosed. In one case a data signal is delayed and a selectively activated delay is applied to a clock. This allows the clock to be positioned before the data and also after the data.
1. An apparatus comprising:
means for receiving a clock signal;
means for selectively delaying said received clock signal;
means for receiving a data signal;
means for selectively delaying said received data signal;
means for comparing said selectively delayed received clock signal and said selectively delayed received data signal;
means for generating a comparison output; and
means for comparing said generated comparison output and an expected output.
2. The apparatus of claim 1 further comprising:
means for adjusting said means for selectively delaying said received clock signal to achieve said generated comparison output being the same as said expected output.
3. The apparatus of claim 1 further comprising:
means for adjusting said means for selectively delaying said received data signal to achieve said generated comparison output being the same as said expected output.
4. The apparatus of claim 3 wherein said means for selectively delaying is selected from the group consisting of one or more fixed delays, one or more delay locked loops, one or more phase detectors, one or more variable delay lines, and one or more phase interpolators.