IP Library › Granted Patent US 7,505,122
Granted Patent B2
US 7,505,122 · App. 11/411,872 · Granted Mar 17, 2009

Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element

Assignee: Semiconductor Energy Laboratory Co., Ltd.
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,505,122
App. No.
11/411,872
Granted
Mar 17, 2009
Kind
B2
Abstract

The present invention provides an evaluation method for evaluating whether a light-emitting element material to be evaluated is suitable for a host material or a guest material. By carrying out a first step of measuring absorption intensity of a light-emitting element material and a second step of irradiating the light-emitting element material with light for a predetermined period of time, repeatedly; thereby a change in absorption intensity with time is evaluated so that whether the light-emitting material is suitable for a host material or a guest material can be distinguished. The light emitted to the light-emitting element material preferably has a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material.

Claims (30)

1. An evaluation method of a light-emitting element material, comprising the steps of:

measuring a first absorption intensity of the light-emitting element material;

irradiating the light-emitting element material with light including a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material;

measuring a second absorption intensity of the irradiated light-emitting element material; and

evaluating the light-emitting element material based on the first absorption intensity and the second absorption intensity.

2. An evaluation method of a light-emitting element material, comprising the steps of:

a first measuring step of measuring a first absorption intensity of the light-emitting element material;

irradiating the light-emitting element material with light including a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material;

a second measuring step of measuring a second absorption intensity of the irradiated light-emitting element material; and

evaluating the light-emitting element material based on the first absorption intensity and the second absorption intensity,

wherein the second measuring step and the irradiating step are repeatedly carried out.

3. The evaluation method of a light-emitting element material according to claim 1 , wherein the light-emitting element material is an anthracene derivative.

4. The evaluation method of a light-emitting element material according to claim 2 , wherein the light-emitting element material is an anthracene derivative.

5. The evaluation method of a light-emitting element material according to claim 1 , wherein the light is light which has a wavelength component of 320 nm or more.

6. The evaluation method of a light-emitting element material according to claim 2 , wherein the light is light which has a wavelength component of 320 nm or more.

7. A manufacturing method of a light-emitting device including a light-emitting layer containing a light-emitting element material between a first electrode and a second electrode, comprising the steps of:

measuring a first absorption intensity of the light-emitting element material;

irradiating the light-emitting element material with light including a wavelength component which is absorbed by a skeleton which contributes to excitation of the light-emitting element material;

measuring a second absorption intensity of the irradiated light-emitting element material;

evaluating the light-emitting element material based on the first absorption intensity and the second absorption intensity; and

forming the light-emitting layer containing the light-emitting element material after the evaluating step.

8. The manufacturing method of a light-emitting device according to claim 7 , wherein a decreasing ratio of absorption intensity of the light-emitting element material is 20% or less, when a sum of irradiation time of the light is 100 minutes.

9. The manufacturing method of a light-emitting device according to claim 7 , wherein the light-emitting element material is an anthracene derivative.

10. The manufacturing method of a light-emitting device according to claim 7 , wherein the light is light which has a wavelength component of 320 nm or more.

11. The manufacturing method of a light-emitting device according to claim 7 , wherein the light-emitting device is incorporated into an electric appliance selected from the group consisting of a laptop personal computer, a portable phone, a television receiver, a car navigation system, a camera, and a lighting apparatus.

12. The manufacturing method of a light-emitting device according to claim 7 , wherein the first electrode and the second electrode are formed by a material selected from the group consisting of indium tin oxide, indium tin oxide containing silicon oxide, or indium oxide containing 2 to 20% of zinc oxide, gold, platinum, nickel, tungsten, chromium, molybdenum, iron, cobalt, copper, palladium, aluminum, an alloy of magnesium and silver, an alloy of aluminum and lithium.

13. The manufacturing method of a light-emitting device according to claim 7 , wherein the light-emitting layer comprises a host material and a guest material.

14. The evaluation method of a light-emitting element material according to claim 1 , wherein the light-emitting element material is evaluated by difference between the first absorption intensity and the second absorption intensity.

15. The evaluation method of a light-emitting element material according to claim 2 , wherein the light-emitting element material is evaluated by difference between the first absorption intensity and the second absorption intensity.

16. The manufacturing method of a light-emitting device according to claim 7 , wherein the light-emitting element material is evaluated by difference between the first absorption intensity and the second absorption intensity.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 25, 2006
From: NOMURA, RYOJI; SEO, SATOSHI; KOJIMA, KUMI; OHSAWA, NOBUHARU
To: EDWARD D. MANZO, ESQ.
Reel/Frame 017819/0765 →
Priority Claims (1)
JP 2005-131565 · Apr 28, 2005 · national
Continuity (1)
Related Publication 20060246318A1 · Nov 2, 2006