Non-volatile semiconductor memory adapted to store a multi-valued data in a single memory cell
View Patent ↗A non-volatile semiconductor memory device includes an electrically data rewritable non-volatile semiconductor memory cell and a write circuit for writing data in the memory cell, the write circuit writing a data in the memory cells by supplying a write voltage Vpgm and a write control voltage VBL to the memory cell, continuing the writing of the data in the memory cell by changing the value of the write control voltage VBL in response to an advent of a first write state of the memory cell and inhibiting any operation of writing a data to the memory cell by further changing the value of the write control voltage VBL to Vdd in response to an advent of a second write state of the memory cell.
1. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
writing data in a memory cell selected from the plurality of non-volatile semiconductor memory cells;
performing a write verify operation which charges the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to the word line which is connected to the memory cell in which the data is written; and
keeping the second voltage applied to the first selection gate line and the second selection gate line, and sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the word line which is connected to the memory cell in which the data is written is changed from the third voltage to a fourth voltage.
2. The method according to claim 1 , wherein the value of the fourth voltage is greater than that of the third voltage.
3. The method according to claim 1 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.
4. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
writing data in a memory cell selected from the plurality of non-volatile semiconductor memory cells;
performing a write verify operation which charges the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to the word line which is connected to the memory cell in which the data is written; and
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the word line which is connected to the memory cell in which the data is written is changed from the third voltage to a fourth voltage, without recharging the bit line with the first voltage.
5. The method according to claim 4 , wherein the value of the fourth voltage is greater than that of the third voltage.
6. The method according to claim 4 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.
7. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
writing data in a memory cell selected from the plurality of non-volatile semiconductor memory cells;
performing a write verify operation which charges the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to the word line which is connected to the memory cell in which the data is written; and
keeping the second voltage applied to the first selection gate line and the second selection gate line, and sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the word line which is connected to the memory cell in which the data is written is changed from the third voltage to a fourth voltage, without recharging the bit line with the first voltage.
8. The method according to claim 7 , wherein the value of the fourth voltage is greater than that of the third voltage.
9. The method according to claim 7 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.
10. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
charging the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to a word line selected from the plurality of word lines; and
keeping the second voltage applied to the first selection gate line and the second selection gate line, and sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the selected word line is changed from the third voltage to a fourth voltage.
11. The method according to claim 10 , wherein the value of the fourth voltage is greater than that of the third voltage.
12. The method according to claim 10 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.
13. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
charging the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to a word line selected from the plurality of word lines; and
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the selected word line is changed from the third voltage to a fourth voltage, without recharging the bit line with the first voltage.
14. The method according to claim 13 , wherein the value of the fourth voltage is greater than that of the third voltage.
15. The method according to claim 13 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.
16. A method for operating a non-volatile semiconductor memory device comprising a plurality of non-volatile semiconductor memory cells which are connected in series, a plurality of word lines which are connected to the plurality of non-volatile semiconductor memory cells, a first selection gate which is connected between a bit line and one end of an array of the plurality of serially connected non-volatile semiconductor memory cells, a first selection gate line which is connected to the first selection gate, a second selection gate which is connected between a source line and another end of the array of the plurality of non-volatile semiconductor memory cells, and a second selection gate line which is connected to the second selection gate, comprising:
charging the bit line with a first voltage, applies a second voltage to the first selection gate line and the second selection gate line, and brings the first selection gate and the second selection gate into conduction;
sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a third voltage is applied to a word line selected from the plurality of word lines; and
keeping the second voltage applied to the first selection gate line and the second selection gate line, and sensing a voltage of the bit line after maintaining, for a predetermined time period, a state where a voltage of the word line is changed from the third voltage to a fourth voltage, without recharging the bit line with the first voltage.
17. The method according to claim 16 , wherein the value of the fourth voltage is greater than that of the third voltage.
18. The method according to claim 16 , wherein the non-volatile semiconductor memory cells stores an n-valued data, where n represents a positive integer not smaller than 3.