Determining mutual inductance between intentional inductors
View Patent ↗Various methods for analyzing mutual inductance in an integrated circuit layout are disclosed. In one exemplary embodiment, for example, circuit design information indicative of a first inductor and a second inductor is received. A dipole moment associated with the first inductor is determined, where the magnetic field associated with the dipole moment is representative of magnetic fields created by respective turns in the first inductor. A mutual inductance between the first inductor and the second inductor is determined by determining a magnetic flux of the magnetic field of the dipole moment through surfaces bounded by respective wire segments of the second inductor.
1. One or more computer-readable memory or storage devices storing computer-executable instructions for causing a computer system to perform a method, the method comprising:
receiving circuit design information indicative of at least a portion of a circuit layout, the circuit design information including layout information about at least a first inductor and a second inductor;
determining a value associated with the first inductor, the value being representative of a strength of a magnetic field generated by a magnetic dipole substantially at the center of the first inductor;
determining a mutual inductance between the first inductor and the second inductor as a function of the value; and
modifying a location of one of the first inductor or the second inductor in the circuit layout based at least in part on the determined mutual inductance.
2. The one or more computer-readable memory or storage devices of claim 1 , wherein the act of determining the value comprises computing a sum of areas enclosed by the respective turns of the first inductor.
3. The one or more computer-readable memory or storage devices of claim 1 , wherein the act of determining the value comprises:
representing the respective turns in the first inductor as dipole moments; and
computing a sum of the dipole moments.
4. The one or more computer-readable memory or storage devices of claim 1 , wherein the value corresponds to the magnitude of a vector located substantially in the center of the first inductor.
5. The one or more computer-readable memory or storage devices of claim 4 , wherein the act of determining a mutual inductance comprises determining the flux of a magnetic field through surfaces subtended by turns of the second inductor, wherein the magnetic field is represented as being generated at the location of the vector and having a strength proportional to the value.
6. The one or more computer-readable memory or storage devices of claim 1 , wherein the value is a first value and the mutual inductance is a first mutual inductance, the method for analyzing mutual inductance further comprising:
determining a second value associated with the second inductor, the second value being representative of a strength of a magnetic field generated by a magnetic dipole substantially at the center of the second inductor;
determining a second mutual inductance between the first inductor and the second inductor as a function of the second value; and
determining a final mutual inductance value, wherein the final mutual inductance value is based at least in part on the first mutual inductance and the second mutual inductance.
7. The one or more computer-readable memory or storage devices of claim 6 , wherein the act of determining the final mutual inductance value comprises averaging the first mutual inductance and the second mutual inductance.
8. The one or more computer-readable memory or storage devices of claim 1 , wherein the method further comprises determining a noise parameter based at least in part on the mutual inductance.
9. The one or more computer-readable memory or storage devices of claim 1 , wherein the method further comprises storing the mutual inductance in a database of parasitic inductances associated with the circuit layout.
10. One or more computer-readable memory or storage devices storing design information for a circuit having a layout modified at least in part by a method, the method comprising:
receiving circuit design information indicative of at least a portion of a circuit layout, the circuit design information including layout information about at least a first inductor and a second inductor;
determining a value associated with the first inductor, the value being representative of a strength of a magnetic field generated by a magnetic dipole substantially at the center of the first inductor;
determining a mutual inductance between the first inductor and the second inductor as a function of the value; and
modifying a location of one of the first inductor or the second inductor in the circuit layout based at least in part on the determined mutual inductance.
11. A method for analyzing mutual inductance between inductors in a circuit layout, the method comprising:
receiving circuit design information indicative of at least a portion of the circuit layout, the circuit design information including layout information about at least a first inductor and a second inductor;
determining a value associated with the first inductor, the value being representative of a strength of a magnetic field generated by a magnetic dipole substantially at the center of the first inductor;
using a computer, determining a mutual inductance between the first inductor and the second inductor as a function of the value; and
modifying a location of one of the first inductor or the second inductor in the circuit layout based at least in part on the determined mutual inductance.
12. The method of claim 11 , wherein the act of determining the value comprises computing a sum of areas enclosed by the respective turns of the first inductor.
13. The method of claim 11 , wherein the act of determining the value comprises:
representing the respective turns in the first inductor as dipole moments; and
computing a sum of the dipole moments.
14. The method of claim 11 , wherein the value corresponds to the magnitude of a vector located substantially in the center of the first inductor.
15. The method of claim 14 , wherein the act of determining a mutual inductance comprises determining the flux of a magnetic field through surfaces subtended by turns of the second inductor, wherein the magnetic field is represented as being generated at the location of the vector and having a strength proportional to the value.
16. The method of claim 11 , wherein the value is a first value and the mutual inductance is a first mutual inductance, the method for analyzing mutual inductance further comprising:
determining a second value associated with the second inductor, the second value being representative of a strength of a magnetic field generated by a magnetic dipole substantially at the center of the second inductor;
determining a second mutual inductance between the first inductor and the second inductor as a function of the second value; and
determining a final mutual inductance value, wherein the final mutual inductance value is based at least in part on the first mutual inductance and the second mutual inductance.
17. The method of claim 16 , wherein the act of determining the final mutual inductance value comprises averaging the first mutual inductance and the second mutual inductance.
18. The method of claim 11 , wherein the method for analyzing mutual inductance further comprises determining a noise parameter based at least in part on the mutual inductance.
19. The method of claim 11 , wherein the method for analyzing mutual inductance further comprises storing the mutual inductance in a database of parasitic inductances associated with the circuit layout.