IP Library Granted Patent US 7,433,060
Granted Patent B2
US 7,433,060 · App. 11/454,869 · Granted Oct 7, 2008

Method for correlating a structural parameter of a plurality of gratings and method for determining a structural parameter value of an unknown grating using the same

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Quick Facts
Patent No.
US 7,433,060
App. No.
11/454,869
Granted
Oct 7, 2008
Kind
B2
Abstract

A method for correlating a structural parameter of a plurality of gratings acquires images from a plurality of gratings, which have different structural parameters. A focus metrics algorithm is then performed to find the off-focus offset of the orders of each grating from the intensity variation of these images, and the variation ratio of the off-focus offset to the order for each grating is calculated later. Consequently, the structural parameters of these gratings can be correlated based on the variation ratio of the off-focus offset to the order. The present method acquires images from an unknown grating at different off-focus offsets, and performs a focus metrics algorithm to find the off-focus offset of the orders of the unknown grating. The variation ratio is calculated and the structural parameter of the unknown grating is determined based on the variation ratio.

Claims (37)

1. A method for correlating a structural parameter of a plurality of predetermined gratings, comprising steps of:

acquiring a plurality of images from the predetermined gratings at a plurality of predetermined off-focus offsets, wherein the predetermined gratings have different structural parameter values;

performing a focus metrics algorithm to find the off-focus offsets corresponding to orders for each of the predetermined gratings;

calculating a variation ratio of the off-focus offsets to the orders for each of the predetermined gratings; and

correlating the variation ratio with the structural parameters of the predetermined gratings.

2. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the step of acquiring a plurality of images from the predetermined gratings at a plurality of predetermined off-focus offsets uses a through focus image acquisition technique.

3. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the focus metrics algorithm uses a standard variation method to calculate an intensity standard variation for each of the images.

4. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 3 , wherein the orders possess a local minimum value of the intensity standard variation.

5. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the step of correlating the variation ratio with the structural parameter of the predetermined gratings is performed using a least square method.

6. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the structural parameter is periodicity.

7. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the structural parameter is pitch.

8. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the structural parameter is thickness.

9. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the structural parameter is line-to-space ratio.

10. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 1 , wherein the structural parameter is width.

11. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 10 , wherein the width is line width.

12. The method for correlating a structural parameter of a plurality of predetermined gratings according to claim 10 , wherein the width is critical dimension.

13. A method for determining a structural parameter value of an unknown grating, comprising steps of:

generating a relation formula of a structural parameter to a variation ratio from a plurality of predetermined gratings by correlating the structural parameter with the variation ratio of off-focus offsets to orders of the predetermined gratings having different structural parameter values;

acquiring a plurality of images from the unknown grating at a plurality of predetermined off-focus offsets;

performing a focus metrics algorithm on the images to find the off-focus offsets corresponding to the orders of the unknown gratings;

calculating a target variation ratio of the off-focus offsets to the orders of the unknown grating; and

deciding the structural parameter value of the unknown grating by substituting the target variation ratio into the relation formula.

14. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the step of acquiring a plurality of images from the unknown grating at a plurality of predetermined off-focus offsets is performed uses focus image acquisition technique.

15. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the focus metrics algorithm uses a standard variation method to calculate an intensity standard variation for each of the images.

16. The method for determining a structural parameter value of an unknown grating according to claim 15 , wherein the orders possess a local minimum value of the intensity standard variation.

17. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the structural parameter is pitch.

18. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the structural parameter is periodicity.

19. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the structural parameter is thickness.

20. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the structural parameter is line-to-space ratio.

21. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the structural parameter is width.

22. The method for determining a structural parameter value of an unknown grating according to claim 21 , wherein the structural parameter is line width.

23. The method for determining a structural parameter value of an unknown grating according to claim 21 , wherein the structural parameter is critical dimension.

24. The method for determining a structural parameter value of an unknown grating according to claim 13 , wherein the step of generating a relation formula of a structural parameter to a variation ratio from a plurality of predetermined grating comprises:

acquiring a plurality of images from the predetermined gratings at a plurality of off-focus offsets;

performing a focus metrics algorithm on the images to find the off-focus offsets corresponding to the orders for each of the predetermined gratings;

calculating the variation ratio of the off-focus offsets to the orders for each of the predetermined gratings; and

correlating the structural parameter with the variation ratio to generate the relation formula.

Assignments (6)
CHANGE OF NAME Recorded Apr 30, 2020
From: NANOMETRICS INCORPORATED
To: ONTO INNOVATION INC.
Reel/Frame 052544/0224 →
DISCLAIMER OF PATENT RIGHTS Recorded May 10, 2019
From: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
To: NANOMETRICS INCORPORATED
Reel/Frame 049148/0494 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2009
From: ACCENT OPTICAL TECHNOLOGIES, INC.
To: NANOMETRICS INCORPORATED
Reel/Frame 022917/0183 →
MERGER Recorded May 7, 2009
From: ALLOY MERGER CORPORATION; ACCEPT OPTICAL TECHNOLOGIES, INC.
To: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.
Reel/Frame 022645/0791 →
MERGER Recorded May 7, 2009
From: ACCENT OPTICAL TECHNOLOGIES NANOMETRICS, INC.; AOTI OPERATING COMPANY, INC.
To: NANOMETRICS INCORPORATED
Reel/Frame 022645/0799 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2006
From: LIU, AN SHUN; KU, YI SHA
To: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE; ACCENT OPTICAL TECHNOLOGIES, INC.
Reel/Frame 017989/0088 →